N34 光学计量仪器 标准查询与下载

MT 28-1994 光干涉式甲烷测定器

Optical interferometric methane detector

WJ 2255-1994 光电光泽度计检定规程

Verification Regulations for Photoelectric Gloss Meter

NF C91-868:1993 闪光计的功能和设计规范

Flickermeter. Functional and design specifications.

JB/T 2369-1993 读数显微镜

本标准规定了读数显微镜的产品分类、技术要求、试验方法、检验规则、标志、包装、运输与贮存等。 本标准适用于分格值为0.01mm、0.001mm和0.0005mm的读数显微镜。

Reading microscope

JB/T 6830-1993 投影仪

本标准规定了投影仪的产品分类、技术要求、试验方法、检验规则、标志、包装、运输与贮存等。 本标准适用于测量用的投影仪。 本标准不适用于特殊用途的投影仪。

Projector

NF C91-868-0:1993 闪烁计.第0部分:闪烁强度的评价

Flickermeter. Part 0 : evalution of flicker severity.

ASTM E685-93(2005) 液相色谱法用固定波长光度探测装置试验的标准实施规程

Although it is possible to observe and measure each of the several characteristics of a detector under different and unique conditions, it is the intent of this practice that a complete set of detector specifications should be obtained under the same operating conditions. It should also be noted that to completely specify a detectorrsquo;capability, its performance should be measured at several sets of conditions within the useful range of the detector. The terms and tests described in this practice are sufficiently general that they may be used regardless of the ultimate operating parameters. Linearity and response time of the recorder or other readout device used should be such that they do not distort or otherwise interfere with the performance of the detector. This requires adjusting the gain, damping, and calibration in accordance with the manufacturerrsquo;directions. If additional electronic filters or amplifiers are used between the detector and the final readout device, their characteristics should also first be established.1.1 This practice is intended to serve as a guide for the testing of the performance of a photometric detector (PD) used as the detection component of a liquid-chromatographic (LC) system operating at one or more fixed wavelengths in the range 210 to 800 nm. Measurements are made at 254 nm, if possible, and are optional at other wavelengths.1.2 This practice is intended to describe the performance of the detector both independently of the chromatographic system (static conditions) and with flowing solvent (dynamic conditions).1.3 For general liquid chromatographic procedures, consult Refs (1-9).1.4 For general information concerning the principles, construction, operation, and evaluation of liquid-chromatography detectors, see Refs (10 and 11) in addition to the sections devoted to detectors in Refs (1-7).1.5 The values stated in SI units are to be regarded as standard.1.6 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography

ASTM E102-93(2003)e1 高温下沥青材料的赛氏厚油粘性的标准试验方法

This test method is useful in characterizing certain bituminous materials, as one element in establishing uniformity of shipments and sources of supply. This test method is an extension of Test Method D 88.1.1 This test method covers the empirical procedures for determining the Saybolt Furol viscosities of bituminous materials at specified temperatures between 120 and 240176;C (248 and 464176;F).1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. See 8.1.

Standard Test Method for Saybolt Furol Viscosity of Bituminous Materials at High Temperatures

JB/T 6267-1992 立式测长仪

　　本标准规定了立式测长仪产品分类、技术要求、试验方法、检验规则、标志、包装、运输及贮存。 本标准适用于用直接和（或）比较的方法进行长度测量的立式测长仪。

Vertical length meter

BS 7208 Pt.2:1991 接触透镜.第2部分:接触透镜材料的分类方法

Contact lenses. Method of classifying contact lens materials

JB/T 5596-1991 测微光度计

Microphotometer

JB/T 2542-1991 光学计量仪器用光学机械测微装置 通用技术条件

本标准规定了光学机械测微装置（以下简称装置）的基本参数、技术要求和试验方法。 本标准适用于光学计量仪器用的线值和角值光学机械测微装置。不适用于自准直系统的测微装置。 在产品技术标准、订货合同或者其他文件中引用本标准则必须执行。必要时，可将所需引用部分的条款写入产品技术标准及其他文件。

General specification for optomechanical micrometer devices for optical metrology instruments

JB/T 5594-1991 荧光分光光度计

Fluorescence spectrophotometer

JB/T 5476-1991 旋光糖量计

本标准规定了旋光糖量计产品分类、技术要求、试验方法、检验规则、标志、包装、运输、贮存等。 本标准适用于测定糖溶液糖度的旋光糖量计。

Saccharometer

ASTM E973-91e1 测量光电装置与光电参考电池之间光谱不协调参数的测试方法

1.1 This test method describes the determination of a spectral mismatch parameter used in the testing of photovoltaic devices. The spectral mismatch parameter is a measure of the error, introduced in the testing of a photovoltaic device, caused by mismatch between the spectral responses of the photovoltaic device and the photovoltaic reference cell, as well as mismatch between the test light source and the reference spectral irradiance distribution, such as Standard Tables E490, E891, or E892, to which the photovoltaic reference cell was calibrated. Spectral mismatch, which is calculated using these four spectral quantities, is a quantitative measure of the error in the measured short-circuit current and can be used to correct photovoltaic performance data. 1.2 The spectral mismatch parameter is intended for use with linear photovoltaic devices. 1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Test Method for Determination of the Spectral Mismatch Parameter Between a Photovoltaic Device and a Photovoltaic Reference Cell

BS 6808-3:1989 坐标测量机.实用规程

Provides the user of coordinate measuring machines with guidance to implement tests set out in BS 6808:Part 2 and more information about further testing requirements for variable environmental conditions.

Coordinate measuring machines - Code of practice

BS 6808-1:1987 座标测量机.术语汇编

British Standard Coordinate measuring machines Foreword Committees responsible Glossary 0 Scope 1 General 2 Types of coordinate measuring machine 3 Mechanical artefacts for calibration 4 Calibration procedures 5 Measurement 6 Geometry 7 Components Figures 1 Cantilever coordinate measuring machine 2 Column coordinate measuring machine 3 Moving horizontal arm coordinate measuring machine 4 Fixed horizontal arm coordinate measuring machine 5 Gantry coordinate measuring machine 6 L-shaped bridge coordinate measuring machine 7 Fixed bridge coordinate measuring machine 8 Moving bridge (portal) coordinate measuring machine Index

Coordinate measuring machines - Glossary of terms

ASTM E1172-87(2003) 波长扩散X射线分光仪的描述和规定

This practice describes the essential components of a wavelength-dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.1.1 This practice covers the components of a wavelength-dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. The document does, however, attempt to identify which of these are critical and thus which should be specified.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7. 1.3 There are several books and publications from the National Institute of Standards Technology and the U.S. Government Printing Office which deal with the subject of X-ray safety. Refer also to Practice E416.

Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer

ASTM E1172-87(1996) 波长色散X射线分光仪的描述和规定的标准规程

1.1 This practice describes the components of a wavelength-dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. The document does, however, attempt to identify which of these are critical and thus which should be specified.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.1.2, and in Section 7. 1.2 There are several books and publications from the National Institute of Standards and Technology and the U.S. Government Printing Office, which deal with the subject of X-ray safety. Refer also to Practice E416.

Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer

ASTM E1162-87(2001) 二次离子质谱法(SIMS)中报告溅射深度截面数据

1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data reduction procedures. SIMS sputter depth profiles can be obtained using a wide variety of primary beam excitation conditions, mass analysis, data acquisition, and processing techniques (1-4).1.2 Limitations8212;This practice is limited to conventional sputter depth profiles in which information is averaged over the analyzed area in the plane of the specimen. Ion microprobe or microscope techniques permitting lateral spatial resolution of secondary ions within the analyzed area, for example, image depth profiling, are excluded.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)