N34 光学计量仪器 标准查询与下载

ASTM E1162-87(1996) 二次离子质谱法(SIMS)中报告溅射深度截面数据

1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data reduction procedures. SIMS sputter depth profiles can be obtained using a wide variety of primary beam excitation conditions, mass analysis, data acquisition, and processing techniques (1-4).1.2 Limitations8212;This practice is limited to conventional sputter depth profiles in which information is averaged over the analyzed area in the plane of the specimen. Ion microprobe or microscope techniques permitting lateral spatial resolution of secondary ions within the analyzed area, for example, image depth profiling, are excluded.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

ASTM E1172-87(2001) 波长扩散X射线分光仪的描述用标准规程

1.1 This practice describes the components of a wavelength-dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. The document does, however, attempt to identify which of these are critical and thus which should be specified.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.1.2, and in Section 7. 1.2 There are several books and publications from the National Institute of Standards and Technology and the U.S. Government Printing Office, which deal with the subject of X-ray safety. Refer also to Practice E416.

Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer

GOST 4.452-1986 产品质量指标系统.测光仪.目录术语

Настоящий стандарт устанавливает номенклатуру основных показателей фотометрических приборов, включаемых в ТЗ на НИР по определению перс

Product-quality index system. Phetometric instruments. Nomenclature of indices

JIS B 7432:1985 角度标准用光学多面棱镜

この規格は，角度の標準として用いる多面鏡(以下，多面鏡という。)について規定する。

Optical polygons for angle standards

GOST 8.046-1985 国家测量统一性保证体系.光学分度头.验证方法

Настоящий стандарт распространяется на оптические делительные головки по ГОСТ 9016-77, а также на отечественные и импортные оптические дели

State system for ensuring the uniformity of measurements. Optical dividing heads. Verification methods

ISO 1878:1983 测量和评定表面光洁度几何参数仪器和设备的分类

Classification of instruments and devices for measurement and evaluation of the geometrical parameters of surface finish

DIN 67530:1982 涂漆表面及塑料表面光泽评定用的反射计

Reflectometer as a means for gloss assessment of plane surfaces of paint coatings and plasticsZusammenhang mit der von der International Organization for Standardization (ISO) herausgegebenen Norm ISO 2813 - 1978, siehe Erl?uterungen.

Reflectometer as a means for gloss assessment of plane surfaces of paint coatings and plastics

ARMY MIL-T-49124-1977 TS-3620()型激光测距机的测试设置

This specification covers the Test Set, Laser Rangefinder,TS-3620( )/GVS-5.(See 6.4.)

TEST SET, LASER RANGEFINDER, TS-3620( )

NF F76-024:1976 铁路固定设备.轨道设施和维护工具.声检测锤

Fixed railway installations. Track service and maintenance tools. Sounding hammer.

NF S12-003:1975 光学仪器.正向焦距计.规范和取样

OPTICAL EQUIPMENT. FOCIMETERS. SPECIFICATIONS AND CALIBRATION.

ANSI N545-1975 热致发光剂量计测定法:环境应用、性能和试验

Thermoluminescence Dosimetry: Environmental Applications, Performance, Testing

ASTM E388-72(1998) 荧光分光计光谱带宽和波长精度的标准测定方法

1.1 This test method covers the testing of the spectral bandwidth and wavelength accuracy of fluorescence spectrometers.

Standard Test Method for Spectral Bandwidth and Wavelength Accuracy of Fluorescence Spectrometers

GOST 8.014-1972 ГСИ.光电式照度计的检定方法与工具

Настоящий стандарт устанавливает методы и средство первичной и периодической поверки рабочих фотоэлектрических люксметров общего назна

State system for ensuring the uniformity of measurements. Methods and means for verification of photoelectric illumination photometers

JJF(机械) 005-2008 光栅测长仪校准规范

Calibration specification for grating length measuring instrument

JJF(机械) 006-2008 分离式光栅线位移测量系统校准规范

Calibration specification for separate grating line displacement measurement system

JJF(机械) 007-2008 长度至1000mm玻璃光栅线位移标准尺校准规范

Calibration specification for glass grating line displacement standard scale up to 1000mm in length