扫描探针/原子力显微镜SPM/AFM 标准查询与下载

KS D 2714-2016(2021 扫描探针显微镜－侧向力显微镜法

Scanning probe microscope－Method for lateral force microscope

KS D 2714-2016 横向力显微镜扫描探针显微镜方法

Scanning probe microscope－Method for lateral force microscope

KS D 2714-2021 扫描探针显微镜 侧向力显微镜方法

Scanning probe microscope－Method for lateral force microscope

JJF 1351-2012 扫描探针显微镜校准规范

本规范适用于以几何表面形貌为测量对象的扫描探针显微镜的校准。 扫描探针显微镜根据其设计原理不同，校准时需要根据实际情况选择相关的计量特性。对有特殊要求的测量任务，如对溯源要求较高的测量，不在本校准规范的适用范围

Calibration Specification for Scanning Probe Microscopes

ISO 11952:2014 表面化学分析. 扫描探针显微镜. 使用SPM测定几何量:测量系统校准

This International Standard specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric

Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems

ISO 11952:2019 表面化学分析.扫描探针显微镜.用SPM测定几何量:测量系统的校准

This document specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes (SPMs) for measuring geometric

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

GB/T 29190-2012 扫描探针显微镜漂移速率测量方法

本标准规定了SPM漂移速率的术语和定义、缩略语、测量步骤、性能参数规格，及基于SPM扫描图像的漂移速率测量基波方法。 本标准适用于0.01nm/s到10nm/s的漂移速率测量。本标准中的漂移测量不适用于图像校正

Measurement methods of drift rate of scanning probe microscope

DIN SPEC 52407:2015-03 纳米技术 使用原子力显微镜(AFM)和透射扫描电子显微镜(TSEM)进行粒子测量的准备和评估方法

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

JY/T 0582-2020 扫描探针显微镜分析方法通则

General Rules for Scanning Probe Microscopy Analytical Methods

BS ISO 11952:2019 表面化学分析 扫描探针显微镜 使用 SPM 确定几何量：测量系统的校准

What is ISO 11952 - Scanning-probe microscopy about?   ISO 11952 is applicable for s canning-probe microscopy.   ISO

Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems

KS D 2714-2006 扫描探针显微镜.横向剪切力的测量方法

이 규격은 주사 탐침 현미경의 횡방향 수평력 현미경 기능을 이용한 미세 횡방향 수평력 측정

Scanning probe microscope-Method for lateral force microscope

GOST 8.593-2009 国家测量统一性保证体系.原子力扫描探针显微镜.鉴定方法

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

GOST R 8.635-2007 国家测量统一性保证体系.原子力扫描探针显微镜.校准方法

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration

GSO ISO 11952:2015 表面化学分析 扫描探针显微镜 使用 SPM 测定几何量：测量系统的校准

  Scope is not provided for this standard

Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems

BH GSO ISO 11952:2017 表面化学分析 扫描探针显微镜 使用 SPM 测定几何量：测量系统的校准

Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems