Micro Control Company is the test with burn-in expert. Devices that successfully complete a burn-in cycle in a Micro Control burn-in with test system are proving significantly more reliable for long-term use.

Micro Control Company’s burn-in systems increase device reliability by applying electronic stimulation to the devices under test during the burn-in cycle. Stressing the devices during burn-in causes devices that are going to fail, to fail early. By monitoring the devices as they are being stressed, the failing devices are detected and eliminated from the lot. The failure rate of devices is referred to as the infant mortality rate.

Higher power semiconductor devices create even more complicated challenges for the burn-in process. Micro Control Company has met these challenges and applied its burn-in experience through a process referred to as active thermal control.

The active thermal control method developed and patented by Micro Control Company is the way the temperature of each high-power device is individually controlled during the burn-in cycle. Individual temperature control ensures that the high-power devices that would become too hot during the process will not be allowed to become so hot that they are damaged. And, devices that are not heating up enough to be adequately burned in will be stimulated to achieve the optimum temperature for stressing.