This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. Th...
IEEE Std 300-1988由美国电气电子工程师学会 US-IEEE 发布于 1988-12-29,并于 1988-12-29 实施。
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