DIN 50435-1988
半导体材料试验:采用四探针/直流法测量硅片和锗片电阻率的径向变化
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
哪些标准引用了DIN 50435-1988
找不到引用DIN 50435-1988 半导体材料试验:采用四探针/直流法测量硅片和锗片电阻率的径向变化 的标准
