DIN 50450-2-1991 半导体工艺材料的检验.载运气体和混合气体中杂质的测定.第2部分:用原电池测定氮(下标2)、氩、氦、氖、氢(下标2)中的氧杂质
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N2, Ar, He, Ne and H2 by using a galvanic cell