DIN 50442-1-1981 半导体无机材料的检验.圆形单晶体半导体薄片表面结构的测定.第1部分:切割和研磨的薄片
Testing of semi-conductive inorganic materials; determination of the surface structure of circular monocrystalline semi-conductive slices; as-cut and lapped slices
Testing of semi-conductive inorganic materials; determination of the surface structure of circular monocrystalline semi-conductive slices; as-cut and lapped slicesEssai des matériaux semi-conducteurs minéraux; détermination de la structure de la surface