DIN 50440-1998 半导体工艺材料的试验.硅单晶中载流子寿命的测量.用光电导法在微小喷射时测量复合载流子寿命
Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
The method according to the document covers the determination of the recombination carrier lifetime at low injection by the photo conductive decay method.
