JEDEC JESD24-12-2004
绝缘双极晶体管的热阻抗测量

Thermal Impedance Measurement for Insulated Gate Bipolar Transistors (Delta VCE(on) Method) (This is an alternative method to JEDEC Standard No. 24-6)

标准号

JEDEC JESD24-12-2004

发布日期

2004年06月01日

实施日期

废止日期

无

中国标准分类号

L41

国际标准分类号

31.080.10

发布单位

US-JEDEC

适用范围

The purpose of this test method is to measure the thermal impedance of the IGBT (Insulated Gate Bipolar Transistor) under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the collector-emitter on voltage, VCE(on), is used as the junction temperature indicator. This is an alternative method to JEDEC Standard No. 24-6.