JEDEC JEP118-1993
GaAs MMIC和FET寿命试验导则

Guidelines for GaAs MMIC and FET Life Testing


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标准号
JEDEC JEP118-1993
发布日期
1993年01月01日
实施日期
废止日期
中国标准分类号
L86
国际标准分类号
31.080
发布单位
US-JEDEC
适用范围
Life tests are run for various purposes. Tests run to detect the level of infant mortality involve short time durations; unless the percentage of devi& having infant mortality is extremely high, the sample size specified in this document is not nearly sufficient. Tests to determine device lifetime for a specific application may be conducted by or for a customer, here the stress and test conditions may be specific to the application. Other life tests are run by a manufacturer and are concerned with determining the lifetime of devices under typical or extreme operation.




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