JEDEC JEP118-1993
GaAs MMIC和FET寿命试验导则

Guidelines for GaAs MMIC and FET Life Testing

JEDEC JEP118-1993 发布历史

Life tests are run for various purposes. Tests run to detect the level of infant mortality involve short time durations; unless the percentage of devi& having infant mortality is extremely high, the sample size specified in this document is not nearly sufficient. Tests to determine device lifetime for a specific application may be conducted by or for a customer, here the stress and test conditions may be specific to the application. Other life tests are run by a manufacturer and are concerned with determining the lifetime of devices under typical or extreme operation.

JEDEC JEP118-1993由(美国)固态技术协会,隶属EIA US-JEDEC 发布于 1993-01-01。

JEDEC JEP118-1993 在中国标准分类中归属于: L86 通用电子测量仪器设备及系统，在国际标准分类中归属于: 31.080 半导体分立器件。

JEDEC JEP118-1993的历代版本如下：

• 1993年01月01日 JEDEC JEP118-1993 GaAs MMIC和FET寿命试验导则

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标准号

JEDEC JEP118-1993

发布日期

1993年01月01日

实施日期

废止日期

无

中国标准分类号

L86

国际标准分类号

31.080

发布单位

US-JEDEC

适用范围

Life tests are run for various purposes. Tests run to detect the level of infant mortality involve short time durations; unless the percentage of devi& having infant mortality is extremely high, the sample size specified in this document is not nearly sufficient. Tests to determine device lifetime for a specific application may be conducted by or for a customer, here the stress and test conditions may be specific to the application. Other life tests are run by a manufacturer and are concerned with determining the lifetime of devices under typical or extreme operation.