This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.
Test procedures for the associated amplifiers and preamplifiers are described in IEC Publication 340: Test Procedures for Amplifiers and Preamplifiers for Semiconductor Detectors for Ionizing Radiation.