This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell.
DS/EN 61967-2-2006由丹麦标准化协会 DK-DS 发布于 2006-02-27,并于 2006-02-27 实施。
DS/EN 61967-2-2006在国际标准分类中归属于: 31.200 集成电路、微电子学。
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