GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method

Scope: This standard specifies the requirements for grades and classifications of the horizontal-method front arsenide (hereinafter referred to as the arsenide front) and cutting pieces. Test methods, inspection rules, signs, packaging, transportation, storage, quality certificates and order sheets (or contract) content. This standard is applicable to zinc arsenide single crystals and cutting chips used in optoelectronic devices and sensing elements.

GB/T 14264 Semiconductor materials-Terms and definitions
GB/T 14844 Designations of semiconductor materials
GB/T 2828 Batch-by-batch inspection counting sampling procedure and sampling table (applicable to continuous batch inspection)
GB/T 4326 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
GB/T 8760 Test method for dislocation density of monocrystal gallium arsenide

2020 GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
2007 GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer
1989 GB/T 11094-1989 Boat-grown gallium arsenide single crystals and As-cut slices

GB/T 11094-2020Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method