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Microscopic inspection

Microscopic inspection, Total:13 items.

In the international standard classification, Microscopic inspection involves: Non-destructive testing, Optical equipment, Testing of metals, Semiconductor devices, Vocabularies, Linear and angular measurements, Analytical chemistry.


中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Microscopic inspection

  • GB/T 34018-2017 Non-destructive testing—Test method for scanning ultrasonic microscopy
  • GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy

HU-MSZT, Microscopic inspection

Korean Agency for Technology and Standards (KATS), Microscopic inspection

IT-UNI, Microscopic inspection

  • UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
  • UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

European Committee for Electrotechnical Standardization(CENELEC), Microscopic inspection

  • EN 60749-35:2006 Semiconductor devices Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components

German Institute for Standardization, Microscopic inspection

  • DIN EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
  • DIN V 32938:1998 Surface profiling by means of optical microscopic methods - Concepts and measurement procedures

International Electrotechnical Commission (IEC), Microscopic inspection

  • IEC 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components




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