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spectrometer at half height

spectrometer at half height, Total:497 items.

In the international standard classification, spectrometer at half height involves: Optics and optical measurements, Geology. Meteorology. Hydrology, Analytical chemistry, Medical equipment, Fibre optic communications, Special measuring equipment for use in telecommunications, Nuclear energy engineering, Vocabularies, Ceramics, Space systems and operations, Water quality, Laboratory medicine, Metalliferous minerals, Radiation measurements, Metrology and measurement in general, Optoelectronics. Laser equipment, Non-destructive testing, Radiation protection, Meat, meat products and other animal produce, Road engineering, Testing of metals, Optical equipment, Non-metalliferous minerals, Electronic components in general, Products of the chemical industry, Linear and angular measurements, Applications of information technology, Semiconductor devices, Non-ferrous metals, Telecommunications in general, Test conditions and procedures in general, Quality, Dentistry, Inorganic chemicals, Tea. Coffee. Cocoa, Ferrous metals, Aids for disabled or handicapped persons, Fertilizers, Semiconducting materials, Paint ingredients, Animal feeding stuffs, Environmental testing, Organic chemicals, Astronomy. Geodesy. Geography, Aircraft and space vehicles in general, Power stations in general, Electricity. Magnetism. Electrical and magnetic measurements, Information technology (IT) in general, Farming and forestry, Particle size analysis. Sieving, Physics. Chemistry, Air quality, Surface treatment and coating, Petroleum products in general, Fuels, Products of the textile industry, Tobacco, tobacco products and related equipment, Lubricants, industrial oils and related products, Leather technology.

Military Standard of the People's Republic of China-General Armament Department, spectrometer at half height

GJB 9726-2020 Specifications for spaceborne hyperspectral imagers
GJB 8472-2015 Verification regulation for field spectrometer
GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
GJB 8662-2015 Calibration procedures for Fourier transform infrared spectrometers
GJB 5147-2002 General specifications for anti-aircraft gun fire control laser range finders
GJB 9079-2017 Hyperspectral reconnaissance data satellite-to-ground transmission requirements
GJB 595.2-1988 Environmental test methods for artillery optical instruments High temperature test

Group Standards of the People's Republic of China, spectrometer at half height

T/SHDSGY 031-2023 Technical specification for high-resolution spectrometer
T/ZZB 0673-2018 Emission spectrometer
T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
T/CASME 698-2023 Semiconductor laser therapy apparatus
T/STIC 110066-2021 High speed automatic polarimeter
T/CAIA YQ004-2018 Performance testing method for liquid chromatograph coupled with atomic fluorescence spectrometer
T/CSTM 00445-2021 Calibration specification for glow discharge mass spectrometry
T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
T/CSTM 00159-2020 Calibration methods of portable Raman spectroscopy
T/QGCML 2041-2023
T/QGCML 936-2023 Portable High Precision Laser Marking Instrument
T/CAIA YQ003-2016 Testing Methods for Optical/Electrical Characteristics of Linear Charge Coupled Imaging Device for Spectrometer
T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
T/CAQI 108-2020 Specification for verification and evaluation of portable Raman spectrometer
T/CIS 17006-2022 General technical specification of Fourier transform near-infrared spectrometer
T/CSTM 00962-2022 Evaluation method for spectrometer performance of spark discharge atomic emission
T/SDIOT 029-2022 Technical specification for hyperspectral intelligent monitoring water quality system
T/CARSA 1.6-2022 Authenticity test of high-resolution satellite remote sensing products based on low-altitude drones Part 6: Multispectral, hyperspectral remote sensing image data and lidar data preprocessing
T/ZFB 0050-2023 Textiles—Quantitative analysis of Polyester-cotton blended fabric—Hyperspectral method
T/CARSA 2-2022 Micro-nano-satellite hyperspectral image data basic product specification

Professional Standard - Meteorology, spectrometer at half height

QX/T 159-2012 Specification for atmospheric spectrum measurement by ground-based high spectral resolution Fourier transform spectroscopy
QX/T 172-2012 Observation method of total column ozone with Brewer spectrophotometer
QX/T 206-2013 Calculation Method of Performance Index of Satellite Low Spectral Resolution Infrared Instrument

IN-BIS, spectrometer at half height

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, spectrometer at half height

GB/T 21191-2007 Atomic fluorescence spectrometer
GB/T 26792-2011 High performance liquid chromatography
GB/T 26792-2019 High performance liquid chromatography
GB/T 30151-2013 Characterization of the spectrum background in HPGe gamma-ray spectrometry
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 42027-2022 Gas-phase molecular absorption spectrometer
GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 21186-2007 Fourier transform infrared spectrometer
GB/T 31010-2014 Spectral calibration in laboratory for dispersive hyperspectral sensor
GB/T 29299-2012 General specification of semiconductor laser rangefinder
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 29856-2013 Characterization of semiconducting single-walled carbon nanotubes using near infrared photoluminescence spectroscopy
GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 33252-2016 Nanotechnology—Performance testing for laser confocal microscope Raman spectrometers
GB/Z 42358-2023 Determination of Accuracy of Wavelength Dispersive X-ray Fluorescence Spectrometer for Iron Ore
GB/T 36204-2018 Determination of gibberellic acid in fertilizer.High performance liquid chromatography-mass spectrometry method
GB/T 21548-2008 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
GB/T 12085.2-1989 Optics and optical instruments--Environmental test methods--Cold, heat, humidity
GB/T 12085.8-1989 Optics and optical instruments--Environmental test methods--High pressure, low pressure, immersion
GB/T 42647-2023 On-orbit site calibration method for spaceborne laser altimeter
GB/T 42650-2023 Lossless and near-lossless compression of multispectral and hyperspectral images in spatial data and information transmission systems
GB/T 12085.2-2010 Optics and optical instruments.Enviromental test methods.Part 2:Cold,heat,humidity
GB/T 12085.8-2010 Optics and optical instruments.Environmental test methods.Part 8:High pressure,low pressure,immersion
GB/T 12085.10-1989 Optics and optical instruments--Environmental test methods--Combined sinusoidal vibration,dry heat,cold
GB/T 36164-2018 High alloy steel.Determination of multi-element contents.X-ray fluorescence spectrometry (routine method)

Jilin Provincial Standard of the People's Republic of China, spectrometer at half height

DB22/T 2414-2015 Micro fiber optic spectrometer

National Metrological Verification Regulations of the People's Republic of China, spectrometer at half height

JJG 768-2005 Emission Spectrometer
JJG 1035-2022 Communication Spectrum Analyzer
JJG(教委) 02-1992 Laser Raman Spectrometer Verification Regulations
JJG 867-1994 Verification Regulation of Spectrocolorimeter
JJG 768-1994 Verification Regulation of Emission Spectrometer
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
JJG 1151-2018 Liquid Chromatograph-Atomic Fluorescence Spectrometers
JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
JJG 810-1993 Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers
JJG(地质) 1011-1990 Verification regulations for one-meter planar grating spectrograph
JJG(地质) 1012-1990 Verification rules for two-meter planar grating spectrograph
JJG(教委) 01-1992 Verification Regulations for Fourier Transform Infrared Spectrometer
JJG(电子) 07005-1988 QF4021 High Frequency Spectrum Analyzer Trial Verification Regulations
JJG(地质) 1015-1990 Verification regulations for inductively coupled plasma direct reading spectrometer

Taiwan Provincial Standard of the People's Republic of China, spectrometer at half height

CNS 14341-1999 Optical spectrum analyzer
CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers

Professional Standard - Machinery, spectrometer at half height

JB/T 9322-1999 Spectrum projector
JB/T 5590-1991 Optical filter of optical spectrum instrument
JB/T 11145-2011 X-ray fluorescence spectrometer
JB/T 9320-1999 Plane-gratings spectrographs
JB/T 9331-1999 Slits for optical spectrum instruments
JB/T 5478-1991 Manual scanning photoelectric direct-reading spectrometer
JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs
JB/T 6176-1992 Basic parameter of photographic plate cassette and cassette frame for spectrograph

U.S. Air Force, spectrometer at half height

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

GB-REG, spectrometer at half height

REG NASA-LLIS-0903-2000 Lessons Learned ?High Energy Spectroscopic Imager Test Mishap

中国气象局, spectrometer at half height

QX/T 523-2019 Laser ceilometer
QX/T 532-2019 Brewer spectrometer calibration specifications
QX/T 565-2020 Laser drop spectrum precipitation phenomenon meter

European Committee for Standardization (CEN), spectrometer at half height

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers
EN ISO 8599:1996 Optics and Optical Instruments - Contact Lenses - Determination of the Spectral and Luminous Transmittance ISO 8599 : 1994
EN ISO 15253:2021 Ophthalmic optics and instruments - Optical and electro-optical devices for enhancing low vision (ISO 15253:2021)
EN ISO 15254:2002 Ophthalmic optics and instruments - Electro-optical devices for enhancing low vision ISO 15254: 2002
EN ISO 15254:2009 Ophthalmic optics and instruments - Electro-optical devices for enhancing low vision (ISO 15254:2009)
EN ISO 15253:2000 Ophthalmic Optics and Instruments - Optical Devices for Enhancing Low Vision ISO 15253: 2000

Association Francaise de Normalisation, spectrometer at half height

NF C93-845:2006 Calibration of optical spectrum analyzers.
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF S11-687:1997 Optics and optical instruments. Contact lenses. Determination of the spectral and luminous transmittance.
NF EN 15111:2007 Produits alimentaires - Dosage des éléments traces - Dosage de l'iode par spectrométrie d'émission avec plasma induit par haute fréquence et spectromètre de masse (ICP-SM)
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
NF S12-210:2009 Ophthalmic optics and instruments - Electro-optical devices for enhancing low vision.
NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
NF S12-200*NF EN ISO 15253:2021 Ophthalmic optics and instruments - Optical and electro-optical devices for enhancing low vision
NF EN 61207-7:2014 Expression des performances des analyseurs de gaz - Partie 7 : analyseurs de gaz laser à semiconducteurs accordables
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
NF M60-827:2014 Water quality - Uranium isotopes - Test method using alpha-spectrometry
NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
NF EN 61290-5-1:2006 Amplificateurs optiques - Méthodes d'essais - Partie 5-1 : paramètres de réflectance - Méthode d'analyseur de spectre optique
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
NF EN 61290-3-1:2004 Amplificateurs optiques - Méthodes d'essai - Partie 3-1 : paramètres du facteur de bruit - Méthode d'analyseur du spectre optique
NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
NF EN IEC 61290-1-1:2020 Amplificateurs optiques - Méthodes d'essai - Partie 1-1 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre optique

British Standards Institution (BSI), spectrometer at half height

BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 19618:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
18/30352698 DC BS IEC 63085. Radiation protection instrumentation. System of spectral identification of liquids in transparent and semitransparent containers
BS IEC 63085:2021 Radiation protection instrumentation. System of spectral identification of liquids in transparent and semitransparent containers (Raman systems)
BS ISO 14135-2:2003 Optics and optical instruments - Specification for telescopic sights - High-performance instruments
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS ISO 14135-2:2014 Optics and photonics. Specifications for telescopic sights. High-performance instruments
BS ISO 14135-2:2017 Optics and photonics. Specifications for telescopic sights. High-performance instruments
BS EN ISO 15254:2009 Ophthalmic optics and instruments - Electro-optical devices for enhancing low vision
BS ISO 14135-2:2021 Optics and photonics. Specifications for telescopic sights. High-performance instruments
BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 18381:2013 Space data and information transfer systems. Lossless multispectral and hyperspectral image compression
BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
20/30391483 DC BS ISO 24121. Space data and information transfer systems. Spectral preprocessing transform for multispectral and hyperspectral image compression
BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
BS EN 16215:2012 Animal feeding stuffs. Determination of dioxins and dioxin-like PCBs by GC/HRMS and of indicator PCBs by GC/HRMS
BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
BS IEC 60747-5-15:2022 Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
BS ISO 13166:2014 Water quality. Uranium isotopes. Test method using alpha-spectrometry
BS EN 62533:2016 Radiation protection instrumentation. Highly sensitive hand-held instruments for photon detection of radioactive material
18/30382086 DC BS EN 61452. Nuclear instrumentation. Measurement of gamma-ray emission rates of radionuclides. Calibration and use of germanium spectrometers
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS IEC 62533:2010 Radiation protection instrumentation - Highly sensitive hand-held instruments for photon detection of radioactive material
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS EN ISO 20884:2011 Petroleum products. Determination of sulfur content of automotive fuels. Wavelength-dispersive X-ray fluorescence spectrometry
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS IEC 60747-5-16:2023 Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
20/30412413 DC BS EN IEC 61452. Nuclear instrumentation. Measurement of gamma-ray emission rates of radionuclides. Calibration and use of germanium spectrometers
BS ISO 14133-2:2006 Optics and optical instruments - Specifications for binoculars, monoculars and spotting scopes - High performance instruments
BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., spectrometer at half height

IEEE 1131-1987 STANDARD CRYOSTAT END-CAP DIMENSIONS FOR GERMANIUM SEMICONDUCTOR GAMMA-RAY SPECTROMETERS

International Electrotechnical Commission (IEC), spectrometer at half height

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
IEC 61976:2000 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe nuclear gamma-ray spectrometry
IEC 63085:2021 Radiation protection instrumentation - System of spectral identification of liquids in transparent and semitransparent containers (Raman systems)
IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
IEC 60937:1988 Cryostat end-cap dimensions for germanium semiconductor detectors for gamma-ray spectrometers
IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC 61239:1993 Nuclear instrumentation; portable gamma radiation meters and spectrometers used for prospecting; definitions, requirements and calibration
IEC 61207-7:2013/COR1:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers; Corrigendum 1
IEC TR3 61276:1994 Nuclear instrumentation - Guidelines for selection of metrologically supported nuclear radiation spectrometry systems
IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method

Danish Standards Foundation, spectrometer at half height

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
DS/EN 15483:2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method

Japanese Industrial Standards Committee (JISC), spectrometer at half height

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS H 1632-3:2014 Titanium.ICP atomic emission spectrometry.Part 3: Determination of boron
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

RU-GOST R, spectrometer at half height

GOST 27176-1986 Spectroscopic optical instruments. Terms and definitions
GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices
GOST 14828-1969 Instruments for physical-chemical quantities measurement. Radiospectrometers. Terms
GOST 25567-1982 Concentrated kaolin. Spectrum analysis method
GOST 3178-1975 Optical bench instruments. Height of arrangement of optical axis and exit pupil
GOST 19834.3-1976 Semiconductor emitters. Methods for measuring of relative spectral energy distribution and spectral bandwidth
GOST 27981.1-1988 Copper of high purity. Methods of atomic-spectral analysis
GOST 27981.1-2015 High purity copper. Method of atomic-spectral analysis
GOST 23116.2-1978 Cadmium high purity. Method of spectrographic determination of mercury
GOST 23116.4-1978 Cadmium high purity. Method of spectrographic determination of zinc
GOST 22518.4-1977 Lead of high purity. Spectral method for the determination of mercury
GOST 23116.5-1978 Cadmium high purity. Chemical-spectral method of determination of thallium
GOST 24977.2-1981 Tellurium high purity. Spectral method for the determination of impurities
GOST 27981.3-1988 Copper of high purity. Method of emission-spectral analysis with photoelectric registration of spectrum / Note: To be replaced by GOST 31382 (2009).
GOST 20766-1975 Ionizing radiation semiconductor spectrometer detectors. Types and basic parameters
GOST 21195-1984 Spectral high-intensity gas-discharge sources of optical radiation. General specifications
GOST 24977.1-1981 Tellurium high purity. Method of chemical and spectral for the ditermination of impurities
GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
GOST 22518.1-1977 Lead of high purity. Chemical spectral method for the determination of additions
GOST 23116.0-1983 Cadmium of high purity. General requirements for methods of spectral analysis
GOST 23116.3-1978 Cadmium high purity. Method of spectrographic determination of iron, copper, nickel, tin and lead
GOST 24977.3-1981 Tellurium high purity. Spectral method for the determination of arsenic, autimonic, mercury and cadmium
GOST 8.197-2013 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance, spectral radiant power, spectral irradiance, spectral radiant intensity, power and radiant intensity in spectral range
GOST 17173-1981 Spectral slits and attachments to them. Types, basic parameters and dimensions. Technical requirements
GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement
GOST 18230-1972 Power supplies spectrometric semiconductor radiation detectors. Types and basic parameters

SE-SIS, spectrometer at half height

SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

Professional Standard - Medicine, spectrometer at half height

YY 1289-2016 Laser Therapy Equipment Ophthalmic Diode Laser Photocoagulation Instrument
YY/T 1174-2010 Semi-automatic chemiluminescence immunoassay analyzer
YY 91060-1999 Vocabulary of biochemical instruments.UV-VIS spectrophotometry
YY/T 1807-2022 Rapid non-destructive testing of main components in metal materials for dental restorations Hand-held X-ray fluorescence spectrometer method (semi-quantitative method)
YY/T 1304.1-2015 Detection system of time-resolved fluoroimmunoassay.Part 1:Semi-auto time-resolved fluoroimmunoassay analyser

International Organization for Standardization (ISO), spectrometer at half height

ISO 19618:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
ISO 8599:1994 Optics and optical instruments - Contact lenses - Determination of the spectral and luminous transmittance
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 6286:1982 Molecular absorption spectrometry; Vocabulary; General; Apparatus
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
ISO 14135-2:2003 Optics and optical instruments - Specifications for telescopic sights - Part 2: High-performance instruments
ISO 15253:2000 Ophthalmic optics and instruments - Optical devices for enhancing low vision
ISO 15253:2021 Ophthalmic optics and instruments - Optical and electro-optical devices for enhancing low vision
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 18381:2013 Space data and information transfer systems - Lossless multispectral and hyperspectral image compression
ISO 15254:2009 Ophthalmic optics and instruments - Electro-optical devices for enhancing low vision
ISO 15254:2002 Ophthalmic optics and instruments - Electro-optical devices for enhancing low vision
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 14135-2:2014 Optics and photonics - Specifications for telescopic sights - Part 2: High-performance instruments
ISO 13166:2014 Water quality - Uranium isotopes - Test method using alpha-spectrometry
ISO 14135-2:2017 Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments
ISO 14135-2:2021 Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments
ISO 14605:2013 Fine ceramics (advanced ceramics, advanced technical ceramics).Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
ISO 21501-1:2009 Determination of particle size distribution - Single particle light interaction methods - Part 1: Light scattering aerosol spectrometer
ISO/TS 10867:2010 Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 9022-8:1994 Optics and optical instruments - Environmental test methods - Part 8: High pressure, low pressure, immersion
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)

Consultative Committee for Space Data Systems (CCSDS), spectrometer at half height

CCSDS 123.0-B-1-2012 Lossles multispectral and hyperspectral image compression
CCSDS 123.0-B-2 Technical Corrigendum 3-2021 Low-Complexity Lossless and Near-Lossless Multispectral and Hyperspectral Image Compression; Technical Corrigendum 3

HU-MSZT, spectrometer at half height

MSZ 2446-1958

Professional Standard - Military and Civilian Products, spectrometer at half height

WJ 1010-1994 Optical Instrument Parts Half Ear Handwheel
WJ 1003-1994 Optical instrument parts 12 semicircular teeth handwheel
WJ 2300-1995 Verification Regulations for Plane Grating Spectrograph
WJ 974-1977 Optical Instrument Investment Casting Mold Components Optical Instrument Investment Casting Mold Half Round Head Handle
WJ 1249-1980 Universal tool for optical instrument assembly half round head rivet punch
WJ 747-1994 High temperature test method for adhesives used in optical instruments
WJ 749-1994 Water immersion, low temperature, high temperature and high humidity test methods for glue used in optical instruments
WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

CZ-CSN, spectrometer at half height

CSN 75 7554-1998 Water quality - Determination of selected polynuclear aromatic hydrocarbons (PAH) - HPLC (FLD) and GC (MSD) methods
CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
CSN 42 0600 Cast.5-1975 Antimony of high purity. Methods of chemical and spectral analysis. Dctermination of silver, bismuth. copper, iron. nickel, lead. and tin by spectral method
CSN 42 0600 Cast.3-1975 Antimony of high parity. Methods of chemical and spectral analysis. Delermmation of arsenic by photomotric metod

RO-ASRO, spectrometer at half height

STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry
STAS 10837/2-1977 SELENIUM Semiquantitative spectral determination of iron, silicon, silver, copper, magnesium, lead, tin, stibium and arsenic impurities
STAS 11564-1982 RAPID STEELS FOR TOOLS Spectrographic analysis in emission
STAS 11607-1981 LOW AND MEDIUM ALLOYED CARBON STEELS Spectrographic analysis

Professional Standard - Ocean, spectrometer at half height

HY/T 175-2014 Optical suspended sediment particle size analyzer
HY/T 125-2009 Test method of ocean color spectrograph

National Metrological Technical Specifications of the People's Republic of China, spectrometer at half height

JJF 1544-2015 Calibration Specification for Raman Spectrometers
JJF 1329-2011 Calibration Specification for Instantaneous Spectral Instruments
JJF 1601-2016 Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement
JJF 2024-2023
JJF 1603-2016 Calibration Specification for (0.1~2.5) THz Terahertz Spectrometers
JJF 1818-2020 Calibration Specification for Calibration Device of Raman Spectrometers
JJF 1319-2011 Calibration Specification for Fourier Transform Infrared Spectrometers
JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF 1929-2021 Calibration Specification for Rotating Disc Electrode Atomic Emission Spectrometers
JJF 1930-2021 Calibration Specification for Organic High Resolution Magnetic Sector Mass Spectrometers
JJF 1953-2021 Calibration Specification for Gas Chromatographs with Sulfur Chemiluminescence Detector

Korean Agency for Technology and Standards (KATS), spectrometer at half height

KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS I 2000-2014 Functional evaluation of high performance liquid chromatograph
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS B ISO 8599:2004 Optics and optical instruments-Contact lenses-Determination of the spectral and luminous transmittance
KS B ISO 8599:2014 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
KS B ISO 8599-2014(2019) Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
KS M ISO 6286:2010 Molecular absorption spectrometry-Vocabulary-General-Apparatus
KS M ISO 6286-2010(2020) Molecular absorption spectrometry－Vocabulary－General－Apparatus
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS B ISO 14135-2:2006 Optics and optical instruments-Specifications for telescopic sights-Part 2:High-performance instruments
KS B ISO 14135-2-2016(2021) Optics and optical instruments－Specifications for telescopic sights－Part 2：High-performance instruments
KS B ISO 14135-2:2016 Optics and optical instruments－Specifications for telescopic sights－Part 2：High-performance instruments
KS D ISO 10701:2002 Steel and iron－Determination of sulfur content－Methylene blue spectrophotometric method
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS I 2000-2010 Functional evaluation of high performance liquid chromatograph
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D 2717-2008 Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS－NIR absorption spectroscopy
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS C IEC 61452-2017(2022) Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
KS C IEC 61290-3-1-2005(2020) Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS E ISO 15247:2012 Zinc sulfide concentrates-Determination of silver content-Acid dissolution and flame atomic absorption spectrometric method
KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
KS D ISO 17054:2018 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
KS B ISO 9022-8-2017(2022) Optics and optical instruments－Environmental test methods－Part 8：High pressure, low pressure, immersion
KS B ISO 9022-8:2017 Optics and optical instruments－Environmental test methods－Part 8：High pressure, low pressure, immersion
KS C IEC 61290-3-1:2005 Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS C IEC 61290-10-1-2005(2020) Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS B ISO 9022-8:2002 Optics and optical instruments－Environmental test methods－Part 8：High pressure, low pressure, immersion
KS P ISO 9913-1-2014(2019) Optics and optical instruments — Contact lenses — Part 1: Determination of oxygen permeability and transmissibility with the polarographic method

国家市场监督管理总局、中国国家标准化管理委员会, spectrometer at half height

GB/T 40219-2021 General specification for Raman spectrometers
GB/T 21548-2021 Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems
GB/T 41211-2021 General specifications for moon and planetary in-situ spectral detection instrument
GB/T 36301-2018 Pre-processing product levels for spaceborne hyperspectral imaging data

American Society for Testing and Materials (ASTM), spectrometer at half height

ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
ASTM E1507-98 Standard Guide for Describing and Specifying the Spectrometer of an Optical Emission Direct-Reading Instrument
ASTM E388-04(2015) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
ASTM E3029-15(2023) Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E356-78(1996) Practices for Describing and Specifying the Spectrograph
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E3029-15 Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
ASTM E1866-97(2007) Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1866-97(2002) Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1866-97 Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E958-13 Standard Practice for Estimation of the Spectral Bandwidth of Ultraviolet-Visible Spectrophotometers
ASTM E2529-06(2022) Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E2529-06e1 Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM F2405-04(2011) Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F2405-04 Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer
ASTM E1770-95 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E1770-95(2006) Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E2911-23 Standard Guide for Relative Intensity Correction of Raman Spectrometers
ASTM E2911-13 Standard Guide for Relative Intensity Correction of Raman Spectrometers
ASTM D5381-93(2014) Standard Guide for X-Ray Fluorescence 40;XRF41; Spectroscopy of Pigments and Extenders
ASTM E2529-06 Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E2529-06(2014) Standard Guide for Testing the Resolution of a Raman Spectrometer
ASTM E1840-96(2022) Standard Guide for Raman Shift Standards for Spectrometer Calibration
ASTM F1710-97 Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F1710-97(2002) Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1016-07(2020) Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
ASTM E932-89(2002) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(1997) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E1840-96(2002) Standard Guide for Raman Shift Standards for Spectrometer Calibration
ASTM E932-89(2021) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(2013) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E1770-14 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
ASTM E307-72(1996)e1 Standard Test Method for Normal Spectral Emittance at Elevated Temperatures
ASTM E307-72(2002) Standard Test Method for Normal Spectral Emittance at Elevated Temperatures
ASTM G177-03(2020) Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37° Tilted Surface
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1812-96 Standard Practice for Optimization of Flame Atomic Absorption Spectrometric Equipment
ASTM E307-72(2019) Standard Test Method for Normal Spectral Emittance at Elevated Temperatures
ASTM F1593-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
ASTM F1710-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM G177-03(2012) Standard Tables for Reference Solar Ultraviolet Spectral Distributions: Hemispherical on 37deg; Tilted Surface
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM G138-96 Standard Test Method for Calibration of a Spectroradiometer Using a Standard Source of Irradiance

ZA-SANS, spectrometer at half height

SANS 62129:2008 Calibration of optical spectrum analyzers
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

GM Daewoo, spectrometer at half height

GMKOREA EDS-T-7826-2006 FTIR ? ??? ????,???? ???? ????

Institute of Electrical and Electronics Engineers (IEEE), spectrometer at half height

ANSI/IEEE Std 1131-1987 IEEE Standard Cryostat End-Cap Dimensions for Germanium Semiconductor Gamma-Ray Spectometers
ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Professional Standard - Agriculture, spectrometer at half height

JJG(教委) 024-1996 Verification Regulations for High Performance Liquid Chromatography
JJG(教委) 023-1996 Verification Regulations for Atomic Absorption Spectrometer
JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
JJG(教委) 022-1996 Verification Regulations for Ultraviolet and Visible Absorption Spectrometers
JJG(教委) 001-1996 Verification Regulations for Fourier Transform Infrared Spectrometer
JJG(教委) 015-1996 Verification Regulations for Inductively Coupled Plasma Atomic Emission Spectrometer

Lithuanian Standards Office , spectrometer at half height

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 15483-2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
LST EN ISO 10703:2021 Water quality - Gamma-ray emitting radionuclides - Test method using high resolution gamma-ray spectrometry (ISO 10703:2021)

German Institute for Standardization, spectrometer at half height

DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN 10785:2013 Analysis of coffee and coffee products - Determination of acrylamide - Methods using HPLC-MS/MS and GC-MS after derivatization
DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
DIN ISO 14135-2:2005 Optics and optical instruments - Specifications for telescopic sights - Part 2: High-performance instruments (ISO 14135-2:2003)
DIN EN ISO 15253:2001 Ophthalmic optics and instruments - Optical devices for enhancing low-vision (ISO 15253:2000); German version EN ISO 15253:2000
DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).
DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN 58161-3:1969 Testing of optical components; determination of radii with spherometer
DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN IEC 62484:2014 Radiation protection instrumentation - Spectroscopy-based portal monitors used for the detection and identification of illicit trafficking of radioactive material (IEC 62484:2010)
DIN EN 16215:2012 Animal feeding stuffs - Determination of dioxins and dioxin-like PCBs by GC/HRMS and of indicator PCBs by GC/HRMS; German version EN 16215:2012
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
DIN 51008-2:2001-12 Optical Emission Spectrometry (OES) - Part 2: Terms for flame and plasma systems
DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN ISO 9022-8:2000 Optics and optical instruments - Environmental test methods - Part 8: High pressure, low pressure, immersion (ISO 9022-8:1994)
DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006

European Committee for Electrotechnical Standardization（CENELEC）, spectrometer at half height

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)
EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method

ES-UNE, spectrometer at half height

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)

工业和信息化部/国家能源局, spectrometer at half height

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques

Professional Standard - Electron, spectrometer at half height

SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices
SJ/T 11401-2009 Series program for semiconductor light emitting diodes
SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
SJ 50033/35-1994 Detail specification for type GH30 semiconductor high speed optocoupler
SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

IEC - International Electrotechnical Commission, spectrometer at half height

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

农业农村部, spectrometer at half height

NY/T 3947-2021 Determination of selenocystine, methylnitrocysteine and selenomethionine in livestock and poultry meat by high performance liquid chromatography-atomic fluorescence spectrometry

国家药监局, spectrometer at half height

YY/T 1751-2020 Laser treatment equipment semiconductor laser intranasal irradiation therapy instrument
YY/T 1740.2-2021 Medical Mass Spectrometry Part 2: Matrix-Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometry

Professional Standard - Traffic, spectrometer at half height

JT/T 1170-2017 Testing system of laser high speed deflectometer

Standard Association of Australia （SAA）, spectrometer at half height

AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, spectrometer at half height

JEDEC JEP78-1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors

未注明发布机构, spectrometer at half height

BS EN ISO 8599:1997 Optics and optical instruments — Contact lenses — Determination ofthe spectral and luminous transmittance
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers
BS IEC 61428:1998(1999) Nuclear instrumentation — Sample containers for gamma - ray spectrometry with Ge - detectors
BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method

Heilongjiang Provincial Standard of the People's Republic of China, spectrometer at half height

DB23/T 1530-2013 Spectrum calibrator for food safety rapid testing equipment

International Telecommunication Union (ITU), spectrometer at half height

ITU-R SM.856-1997 New spectrally efficient techniques and systems

Indonesia Standards, spectrometer at half height

SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers
SNI 12-7181-2006 Test methods of total chromium content in leather by atomic absorption spectrophotometers (AAS)

工业和信息化部, spectrometer at half height

WJ/T 747-2014 High temperature test method for glue used in optical instruments
WJ/T 749-2014 Test methods for water immersion, low temperature, high temperature and high humidity for glue used in optical instruments

KR-KS, spectrometer at half height

KS D ISO 14707-2003(2023)
KS B ISO 14135-2-2016 Optics and optical instruments－Specifications for telescopic sights－Part 2：High-performance instruments
KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
KS D ISO 17054-2018 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
KS B ISO 9022-8-2017 Optics and optical instruments－Environmental test methods－Part 8：High pressure, low pressure, immersion
KS B ISO 14135-2-2023 Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments
KS C IEC 61452-2017 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
KS L ISO 14605-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

Shanxi Provincial Standard of the People's Republic of China, spectrometer at half height

DB14/T 1435-2017 Data preprocessing of ground laser raindrop spectrometer detection
DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy

Fujian Provincial Standard of the People's Republic of China, spectrometer at half height

JJF（闽）1085-2018 Calibration Specification for Portable Raman spectrum fast detection instruments
DB35/T 1564-2016 Technical Requirements for Portable Rapid Raman Spectroscopy Detector

BELST, spectrometer at half height

STB 8066-2016 System for ensuring uniformity of measurements of the Republic of Belarus. Alpha spectrometers with semiconductor detectors. Methods of verification

American National Standards Institute （ANSI), spectrometer at half height

ANSI/ASTM D6645:2001 Test Methods for Methyl (Comonomer) Content in Polyethylene by Infrared Spectrophotometry

Professional Standard - Non-ferrous Metal, spectrometer at half height

YS/T 230.2-1994 High pure indium--Determination of iron content--Spectrochemical method
YS/T 365-2006 Determination of trace impurities in high purity palladium by atomic emission spectrometric
YS/T 365-1994 Emission Spectrum Analysis of Impurity Elements in High Purity Platinum

中华人民共和国国家卫生和计划生育委员会, spectrometer at half height

GB/T 11713-1989 Standard methods of analyzing low specific gamma radioactivity samples by semiconductor gamma spectrometers

Professional Standard - Electricity, spectrometer at half height

DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

International Commission on Illumination (CIE), spectrometer at half height

CIE 214-2014 Effect of Instrumental Bandpass Function and Measurement Interval on Spectral Quantities

Professional Standard - Commodity Inspection, spectrometer at half height

SN/T 3377-2012 Determination of lead in paints.Semiquantitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2724-2010 Determination of sulphur in high pure graphite powder for import and export by X-ray fluorescence spectrometric method

Professional Standard - Environmental Protection, spectrometer at half height

HJ 1129-2020 Technical specifications for measuring gamma nuclides in soil by in-situ high-purity germanium spectrometer

IT-UNI, spectrometer at half height

UNI EN ISO 10703:2021 Water quality - Gamma-ray emitting radionuclides - Test method using high resolution gamma-ray spectrometry.

Professional Standard - Post and Telecommunication, spectrometer at half height

YD/T 1687.1-2007 Technical Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 1:2.5Gbit/s Cooled Direct Modulation Semiconductor Laser Assembiy
YD/T 1687.2-2007 Technidal Requirements of High Speed Semiconductor Laser Assembly for Optical Fiber Communication Part 2:2.5Gbit/s Uncooled Direct Modulation Semiconductor Laser Assembly

ESDU - Engineering Sciences Data Unit, spectrometer at half height

SPA-M2-2-2007 Advanced characterisation of asphaltenes using vibrational spectroscopy.

Chongqing Provincial Standard of the People's Republic of China, spectrometer at half height

DB50/T 1449-2023 Technical regulations for hyperspectral detection of organic matter in tea garden soil

United States Navy, spectrometer at half height

NAVY MIL-STD-1322-719-1969 PALLETIZING DOMESTIC UNIT LOAD GRENADE, H.I., MK 1 MOD 0 (IN FLARE CONTAINER MK 4 MOD 0)

Professional Standard - Aviation, spectrometer at half height

HB 5220.46-1995 Determination of bismuth content by semi-xylenol orange absorptiophotometry method for chemical analysis of superalloys

CENELEC - European Committee for Electrotechnical Standardization, spectrometer at half height

EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser

AENOR, spectrometer at half height

UNE-EN 15483:2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy

CH-SNV, spectrometer at half height

SN EN ISO 10703:2021 Water quality - Gamma-ray emitting radionuclides - Test method using high resolution gamma-ray spectrometry (ISO 10703:2021)

Hubei Provincial Standard of the People's Republic of China, spectrometer at half height

DB42/T 1337-2018 Laser-type high-speed deflection meter measuring pavement deflection test procedures

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, spectrometer at half height

GB/T 34142-2017 Radiation protection instrumentation—Highly sensitive hand-held instruments for photon detection of radioactive material

国家烟草专卖局, spectrometer at half height

YC/T 561-2018 Determination of the ratio of optical isomers of nicotine, a characteristic component of tobacco, by high-performance liquid chromatography and ultra-high performance convergence chromatography-tandem mass spectrometry.

BE-NBN, spectrometer at half height

NBN EN 1138-1995 Fruit and vegetable juices - Enzymatic determination of L-malic acid (L-malate) content - NADH spectrometric method