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Single crystal face

Single crystal face, Total:22 items.

In the international standard classification, Single crystal face involves: Energy and heat transfer engineering in general, Installations in buildings, Testing of metals, Semiconducting materials, Piezoelectric and dielectric devices, Products of the chemical industry.

Group Standards of the People's Republic of China, Single crystal face

• T/ZZB 1372-2019 Crystalline silicon terrestrial single side double glass photovoltaic(PV) modules
• T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications
• T/CECA 69-2022 Single-crystal thin film substrates for SAW devices

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Single crystal face

• GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
• GB/T 32189-2015 Atomic Force Microscopy Examination of Surface Roughness of Gallium Nitride Single Crystal Substrate
• GB/T 30118-2013 Single crystal wafers for surface acoustic wave (SAW) device applications.Specifications and measuring methods

Professional Standard - Electron, Single crystal face

• SJ/T 11504-2015 Test method for measuring surface quality of polished monocrystalline silicon carbide
• SJ/T 11503-2015 Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers

Defense Logistics Agency, Single crystal face

• DLA MIL-S-19500/425 VALID NOTICE 2-2004 SEMICONDUCTOR DEVICE, TRANSISTOR, PN, SILICON, UNIJUNCTION JAN2N5431, AND JANTX2N5431
• DLA DSCC-DWG-94023 REV B-2007 CRYSTAL UNIT, QUARTZ, MINIATURE, SURFACE MOUNT
• DLA MIL-PRF-19500/75 B NOTICE 1-1999 SEMICONDUCTOR DEVICE, TRANSISTORS, PN, SILICON UNIJUNCTION TYPES 2N2417A THROUGH 2N2422A, AND TX2N2417A THROUGH TX2N2422A

American Society for Testing and Materials (ASTM), Single crystal face

• ASTM D3942-03(2008) Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
• ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
• ASTM D3942-03 Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
• ASTM D3942-97 Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
• ASTM D3942-03(2013) Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite

Taiwan Provincial Standard of the People's Republic of China, Single crystal face

• CNS 11364-1985 Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite

Association Francaise de Normalisation, Single crystal face

• NF EN 61747-3:2007 Dispositifs d'affichage à cristaux liquides - Partie 3 : cellules d'affichage à cristaux liquides (LCD) - Spécification intermédiaire
• NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
• NF C93-616:2006 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods.

Japanese Industrial Standards Committee (JISC), Single crystal face

• JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

British Standards Institution (BSI), Single crystal face

• 14/30277702 DC BS EN 61747-3. Liquid crystal display devices. Part 3. Liquid crystal display (LCD) cells. Sectional specification

Others:   single crystal, single crystal material, Single crystal furnace, Single crystal polycrystalline, Single crystal face, target single crystal, Single crystal energy consumption, Single crystal thin film, Single Crystal Foil, Monocrystalline silicon, Single crystal + silicon, single crystal domain, Single crystal + polycrystalline, single crystal substrate, polycrystalline single crystal, Single crystal test, crystal facet, Single Crystal Meter, Noodles, Single Crystal+.