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Single crystal test

Single crystal test, Total:22 items.

In the international standard classification, Single crystal test involves: Semiconductor devices, Semiconducting materials, Iron and steel products, Testing of metals, Optics and optical measurements, Piezoelectric and dielectric devices.

Military Standard of the People's Republic of China-General Armament Department, Single crystal test

• GJB 1927A-2021 Gallium arsenide single crystal material testing method
• GJB 1927-1994 Gallium arsenide single crystal material testing method

Professional Standard - Electron, Single crystal test

• SJ/T 10333-1993 Methods of measurement for uni-junction transistors
• SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
• SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
• SJ/T 11499-2015 Test method for measuring electrical properties of monocrystalline silicon carbide
• SJ 20844-2002 Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide
• SJ 20858-2002 Measuring methods for electrical parameters of silicon carbide single crystal material

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Single crystal test

• GB/T 30866-2014 Test method for measuring diameter of monocrystalline silicon carbide wafers
• GB/T 32278-2015 Test method for flatness of silicon carbide single wafer
• GB/T 41765-2022 Test method for dislocation density of monocrystalline silicon carbide
• GB/T 22453-2008 Non-linear optical borate crystal devices measuring method
• GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
• GB/T 15250-1994 Test method for bulk acoustic wave attenuation of piezoelectric lithium niobate crystals

Korean Agency for Technology and Standards (KATS), Single crystal test

• KS D 0070-2002(2022) Method of test for magnetic properties of amorphous metals using single sheet specimen
• KS D 0070-2002(2017) Method of test for magnetic properties of amorphous metals using single sheet specimen
• KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE

国家市场监督管理总局、中国国家标准化管理委员会, Single crystal test

• GB/T 5252-2020 Test method for dislocation density of monocrystal germanium
• GB/T 8760-2020 Test method for dislocation density of monocrystal gallium arsenide

IEC - International Electrotechnical Commission, Single crystal test

• PAS 62277-2001 Test-Fixture of Surface Mounting Quartz Crystal Units (Edition 1.0;)

Professional Standard - Non-ferrous Metal, Single crystal test

• YS/T 557-2006 Test method for acoustic wave attenuation of piezoelectric lithium niobate single crystal

German Institute for Standardization, Single crystal test

• DIN EN 60444-8:2017-11 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017 / Note: DIN EN 60444-8 (2004-03) remains valid alongside this standard until 2020-01-19.

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