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Electron Probe Sheet
Electron Probe Sheet, Total:175 items.
In the international standard classification, Electron Probe Sheet involves: Medical equipment, Insulating fluids, Semiconducting materials, Optics and optical measurements, Analytical chemistry, Radiation measurements, Vocabularies, Protection against fire, Optical equipment, Electricity. Magnetism. Electrical and magnetic measurements, Electrical accessories, Non-ferrous metals, Testing of metals, Test conditions and procedures in general, Audio, video and audiovisual engineering, Textile machinery, Water quality, Horology, Thermodynamics and temperature measurements, Materials for the reinforcement of composites, Linear and angular measurements, Soil quality. Pedology, Semiconductor devices, Electronic components in general.
CZ-CSN, Electron Probe Sheet
Professional Standard - Military and Civilian Products, Electron Probe Sheet
Professional Standard - Medicine, Electron Probe Sheet
National Metrological Verification Regulations of the People's Republic of China, Electron Probe Sheet
- JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
- JJG 901-1995 Verification Regulation of Electron Probe Microanalyzer
- JJG 508-2004 Resistivity Measuring Instruments with Four - Probe Array Method
- JJG 508-1987 Verification Regulation of Resistivity Measuring Instruments with Four-Prope Array Method
German Institute for Standardization, Electron Probe Sheet
- DIN 6800-4:2000-12 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
- DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
- DIN 6800-1:2016 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
- DIN 6801-1:2019-09 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
- DIN 6800-1:1980 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
- DIN 6800-2:2020-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
- DIN 6800-1:2016-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
- DIN 50435:1988 Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
- DIN 6800-5:2005 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 5: Thermoluminescence dosimetry
- DIN EN ISO 5814:2013-02 Water quality - Determination of dissolved oxygen - Electrochemical probe method (ISO 5814:2012); German version EN ISO 5814:2012
- DIN 41092-3:1976 Hands for electric clocks; bar-shaped hands
- DIN 41071-2:1976 Hands for electric clocks; hole-shaped hands
- DIN 41071-1:1976 Hands for electric clocks; wedged hands
- DIN 50431:1988 Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
- DIN EN 60512-16-1:2009-03 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008 / Note: DIN IEC 60512-8 (1994-05) remains valid al...
- DIN EN 2591-6415:2003 Aerospace series - Elements of electrical and optical connection; Test methods - Part 6415: Optical elements; Test probe damage; German and English version EN 2591-6415:2001
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Probe Sheet
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
- GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
- GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
- GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
- GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
- GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
- GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
- GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
- GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
- GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
- GB/T 17506-1998 The method of electron probe micro analysis as corrosive layer on ferrous metals of ship
- GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
- GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
- GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
- GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
- GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
- GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis
- GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
- GB/T 1551-1995 Test method for resistivity of silicon and germanium bars using a two-point probe
- GB/T 26074-2010 Germanium monocrystal.Measurement of resistivity-DC linear four-point probe
- GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
HU-MSZT, Electron Probe Sheet
Japanese Industrial Standards Committee (JISC), Electron Probe Sheet
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
- JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
- JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
Korean Agency for Technology and Standards (KATS), Electron Probe Sheet
- KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
- KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
- KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS C 1802-1986 Photic stimulators for electroencephalographs
- KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
- KS C 0256-2002 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS I ISO 5814:2017 Water quality－Determination of dissolved oxygen－Electrochemical probe method
- KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS I ISO 10573-2005(2020) Soil quality－Determination of water content in the unsaturated zone(Neutron depth probe method)
- KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method
- KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
Professional Standard - Petroleum, Electron Probe Sheet
- SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis
- SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
国家能源局, Electron Probe Sheet
- SY/T 6027-2019 Electron probe quantitative analysis method of rock minerals
KR-KS, Electron Probe Sheet
- KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
- KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
- KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
- KS I ISO 5814-2017 Water quality－Determination of dissolved oxygen－Electrochemical probe method
- KS I ISO 5814-2023 Water quality — Determination of dissolved oxygen — Electrochemical probe method
- KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Yunnan Provincial Standard of the People's Republic of China, Electron Probe Sheet
- DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method
国家市场监督管理总局、中国国家标准化管理委员会, Electron Probe Sheet
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
- GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
- GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
- GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
Professional Standard - Machinery, Electron Probe Sheet
- JB/T 12074-2014 Quantitative analysis of composition metal.Electron probe microanalysis
International Organization for Standardization (ISO), Electron Probe Sheet
- ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
- ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
- ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
- ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
- ISO 5814:1984 Water quality — Determination of dissolved oxygen — Electrochemical probe method
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
- ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
- ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
- ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
Association Francaise de Normalisation, Electron Probe Sheet
- NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
- NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
- XP P94-123:1999 Sols : reconnaissance et essais - Diagraphie dans les sondages - Méthode de la sonde à neutrons
- NF T90-106*NF EN ISO 5814:2012 Water quality - Determination of dissolved oxygen - Electrotechnical probe method
- NF T90-106:1993 Water quality - Determination of dissolved oxygen - Electrochemical probe method.
- NF EN ISO 5814:2012 Qualité de l'eau - Dosage de l'oxygène dissous - Méthode électrochimique à la sonde
- NF ISO 10573:1996 Qualité du sol - Détermination de la teneur en eau de la zone non saturée - Méthode à la sonde à neutrons de profondeur.
- NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
- NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
British Standards Institution (BSI), Electron Probe Sheet
- BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
- 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
- BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
- BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
- 22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
- BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
- BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
- 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts
and terminations — Test 16a: Probe
damage
National Metrological Technical Specifications of the People's Republic of China, Electron Probe Sheet
- JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe
Professional Standard - Aviation, Electron Probe Sheet
- HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys
Group Standards of the People's Republic of China, Electron Probe Sheet
- T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method
- T/BEA 43002-2023 Calibration Specification for Single Langmuir Probe Plasma Instrument
- T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
Taiwan Provincial Standard of the People's Republic of China, Electron Probe Sheet
- CNS 5430-1989 Standards for Stylus Tips Used for Disc Phonograph Record Reproducing
American Society for Testing and Materials (ASTM), Electron Probe Sheet
- ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
- ASTM F390-98 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
- ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
- ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
- ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
- ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
Fujian Provincial Standard of the People's Republic of China, Electron Probe Sheet
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Professional Standard - Textile, Electron Probe Sheet
- FZ/T 97038-2017 Computerized flat knitting machine electronic needle selector
American National Standards Institute （ANSI), Electron Probe Sheet
PL-PKN, Electron Probe Sheet
- PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements
- PN T06422-1967 Electronic tubes Sep?ar 7-pin base Oimensions
Society of Automotive Engineers (SAE), Electron Probe Sheet
AT-ON, Electron Probe Sheet
- ONORM M 6266-1984 Water quality; determination of dissolved oxygen; electro- chemical probe method
Danish Standards Foundation, Electron Probe Sheet
- DS/EN ISO 5814:2013 Water quality - Determination of dissolved oxygen - Electrochemical probe method
VN-TCVN, Electron Probe Sheet
- TCVN 7325-2016 Water quality - Determination of dissolved oxygen - Electrochemical probe method
ECIA - Electronic Components Industry Association, Electron Probe Sheet
- RS-364-25A-1983 TP-25A Probe Damage Test Procedure for Electrical Connectors
Professional Standard - Non-ferrous Metal, Electron Probe Sheet
- YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
- YS/T 602-2017 Two-probe method for measuring resistivity of zone-melted germanium ingots
RU-GOST R, Electron Probe Sheet
- GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method
Hebei Provincial Standard of the People's Republic of China, Electron Probe Sheet
- DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method
- DB13/T 5026.3-2019 Method for Determination of Physical Properties of Graphene Conductive Paste Part 3: Four-probe Method for Determination of Electrode Resistivity of Paste
Jiangsu Provincial Standard of the People's Republic of China, Electron Probe Sheet
- DB32/T 4027-2021 Dynamic four-probe method for the determination of electrical conductivity of graphene powder
US-FCR, Electron Probe Sheet
- FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)
Professional Standard - Electron, Electron Probe Sheet
- SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
- SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electron Probe Sheet
- JEDEC JEP128-1996 Guide for Standard Probe Pad Sizes and Layouts for Wafer-Level Electrical Testing
Lithuanian Standards Office , Electron Probe Sheet
- LST EN ISO 5814:2012 Water quality - Determination of dissolved oxygen - Electrochemical probe method (ISO 5814:2012)
AENOR, Electron Probe Sheet
- UNE-EN ISO 5814:2013 Water quality - Determination of dissolved oxygen - Electrochemical probe method (ISO 5814:2012)
Defense Logistics Agency, Electron Probe Sheet
ES-UNE, Electron Probe Sheet
- UNE-EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (Endorsed by AENOR in November of 2008.)
U.S. Military Regulations and Norms, Electron Probe Sheet