ZH

RU

ES

Electron Probe Parameters

Electron Probe Parameters, Total:26 items.

In the international standard classification, Electron Probe Parameters involves: Analytical chemistry, Optics and optical measurements, Thermodynamics and temperature measurements.


General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Probe Parameters

  • GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
  • GB/T 15075-1994 Method for testing EPMA instrument
  • GB/T 15074-2008 General guide of quantitative analysis by EPMA
  • GB/T 15074-1994 General guide for EPMA quantitative analysis
  • GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis

CZ-CSN, Electron Probe Parameters

PL-PKN, Electron Probe Parameters

  • PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements

Professional Standard - Military and Civilian Products, Electron Probe Parameters

National Metrological Verification Regulations of the People's Republic of China, Electron Probe Parameters

International Organization for Standardization (ISO), Electron Probe Parameters

  • ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

Korean Agency for Technology and Standards (KATS), Electron Probe Parameters

  • KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)

KR-KS, Electron Probe Parameters

  • KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)

Association Francaise de Normalisation, Electron Probe Parameters

  • NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.

British Standards Institution (BSI), Electron Probe Parameters

  • 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)

American Society for Testing and Materials (ASTM), Electron Probe Parameters

  • ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
  • ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits

Japanese Industrial Standards Committee (JISC), Electron Probe Parameters

  • JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy




Copyright ©2007-2023 ANTPEDIA, All Rights Reserved