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Electron Probe Parameters
Electron Probe Parameters, Total:26 items.
In the international standard classification, Electron Probe Parameters involves: Analytical chemistry, Optics and optical measurements, Thermodynamics and temperature measurements.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Probe Parameters
- GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
CZ-CSN, Electron Probe Parameters
PL-PKN, Electron Probe Parameters
- PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements
Professional Standard - Military and Civilian Products, Electron Probe Parameters
National Metrological Verification Regulations of the People's Republic of China, Electron Probe Parameters
International Organization for Standardization (ISO), Electron Probe Parameters
- ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Korean Agency for Technology and Standards (KATS), Electron Probe Parameters
- KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KR-KS, Electron Probe Parameters
- KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
Association Francaise de Normalisation, Electron Probe Parameters
- NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
British Standards Institution (BSI), Electron Probe Parameters
- 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
American Society for Testing and Materials (ASTM), Electron Probe Parameters
- ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
- ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
- ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
- ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
Japanese Industrial Standards Committee (JISC), Electron Probe Parameters
- JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy