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Electron probe instrument

Electron probe instrument, Total:204 items.

In the international standard classification, Electron probe instrument involves: Optics and optical measurements, Non-destructive testing, Radiation measurements, Electricity. Magnetism. Electrical and magnetic measurements, Nuclear energy engineering, Analytical chemistry, Medical equipment, Textile machinery, Vocabularies, Electrical accessories, Protection against fire, Optical equipment, Insulating fluids, Semiconducting materials, Radiation protection, Test conditions and procedures in general, Mechanical testing, Diagnostic, maintenance and test equipment, Equipment for petroleum and natural gas industries, Optoelectronics. Laser equipment, Testing of metals, Resistors, Conducting materials, Aerospace electric equipment and systems, Electrical and electronic testing, Materials for aerospace construction, Linear and angular measurements, Electromechanical components for electronic and telecommunications equipment, Environmental testing, Standardization. General rules, Road vehicle systems.

National Metrological Verification Regulations of the People's Republic of China, Electron probe instrument

JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
JJG 901-1995 Verification Regulation of Electron Probe Microanalyzer
JJG 508-2004 Resistivity Measuring Instruments with Four - Probe Array Method
JJG 508-1987 Verification Regulation of Resistivity Measuring Instruments with Four-Prope Array Method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron probe instrument

GB/T 15075-1994 Method for testing EPMA instrument
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 2900.82-2008 Electrotechnical terminology.Nuclear instrumentation.Instruments, systems,equipment and detectors
GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
GB/T 17506-1998 The method of electron probe micro analysis as corrosive layer on ferrous metals of ship
GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
GB/T 11464-1989 Terminology for electronic measuring instruments
GB/T 11464-2013 Terminology for electronic measuring instruments
GB/T 2900.79-2008 Electrotechnical terminology.Electical and electronic measurements and measuring instruments.Part 3:Types of electrical measuring instruments
GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 9393-1988 STZ3 type connector for electronic measurement instrument
GB 9393-1988 STZ3 type connector for electronic measurement instrument
GB/T 5201-1994 Test procedures for semiconductor charged particle detectors
GB/T 5201-2012 Test procedures for semiconductor charged particle detectors
GB 4793-1984 Safety requirements for electronic measuring apparatus
GB/T 11465-1989 Temperature profile for electronic measuring instruments
GB/T 6587-2012 General specification for electronic measuring instruments
GB 11465-1989 Thermal Profiles for Electronic Measuring Instruments
GB/T 6587.4-1986 Vibration tests for electronic measuring instruments
GB/T 6587.5-1986 Shock tests for electronic measuring instruments
GB/T 6587.6-1986 Transportation tests for electronic measuring instruments
GB/T 6587.2-1986 Temperature tests for electronic measuring instruments
GB/T 6587.3-1986 Humidity tests for electronic measuring instruments
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method

CZ-CSN, Electron probe instrument

CSN ON 81 3790-1966 Electric feeler
CSN ON 81 3791-1966 Holder of electric íeeler
CSN 36 7001-1967 Reliability tests of eleotronic instrumenta
CSN 35 6506-1983 Electronic measuring instruments Documentation supplied with electronic measuring
CSN 35 6533-1986 Electronic measuring instruments. DC stabilized power supply.

Korean Agency for Technology and Standards (KATS), Electron probe instrument

KS C 1802-1986 Photic stimulators for electroencephalographs
KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS C IEC 61468-2006(2021) Nuclear power plants－In-core instrumentation－Characteristics and test methods of self-powered neutron detectors
KS C IEC 62534-2012(2017) Radiation protection instrumentation－Highly sensitive hand-held instruments for neutron detection of radioactive material
KS B 0537-2005 Methods for assessing the electrical characteristics ofultrasonic testing instrument using pulse echo technique
KS C IEC 61468-2006(2016) Nuclear power plants－In-core instrumentation－Characteristics and test methods of self-powered neutron detectors
KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method
KS C IEC 61468:2006 Nuclear power plants－In-core instrumentation－Characteristics and test methods of self-powered neutron detectors
KS C 1100-1978 Glossary of terms used in electronic measuring apparatus
KS C 5116-2003 Fixed carbon composition resistors for use in electronic equipment
KS C 1100-1978(2021) Glossary of terms used in electronic measuring apparatus
KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS C IEC 62397-2012(2022) Nuclear power plants－Instrumentation and control important to safety－Resistance temperature detectors
KS W 7016-1987 Electronic Equipment , Aerospace, General Specification for
KS C IEC 62397-2012(2017) Nuclear power plants－Instrumentation and control important to safety－Resistance temperature detectors

German Institute for Standardization, Electron probe instrument

DIN 58854:2023-03 Medical instruments - Myrtle leaf probes
DIN 6800-1:2016 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6801-1:2019-09 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
DIN 6800-1:1980 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
DIN 6800-1:2016-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6800-4:2000-12 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-2:2020-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-5:2005 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 5: Thermoluminescence dosimetry
DIN IEC 62088:2002-09 Nuclear instrumentation - Photodiodes for scintillation detectors - Test procedures (IEC 62088:2001)
DIN 43802-4:1991 Line scales and pointers for indicating electrical measuring instruments; scale graduation and numbering
DIN EN 60512-16-1:2009-03 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008 / Note: DIN IEC 60512-8 (1994-05) remains valid al...

HU-MSZT, Electron probe instrument

British Standards Institution (BSI), Electron probe instrument

19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
18/30382072 DC BS IEC 61468. Nuclear power plants. Instrumentation systems important to safety. In-core instrumentation. Characteristics and test methods of self-powered neutron detectors
19/30400212 DC BS IEC 61468. Nuclear power plants. Instrumentation systems important to safety. In-core instrumentation. Characteristics and test methods of self-powered neutron detectors
BS IEC 62533:2010 Radiation protection instrumentation - Highly sensitive hand-held instruments for photon detection of radioactive material
BS EN 62534:2015 Radiation protection instrumentation. Highly sensitive hand-held instruments for neutron detection of radioactive material
BS EN 62533:2016 Radiation protection instrumentation. Highly sensitive hand-held instruments for photon detection of radioactive material
BS IEC 62534:2010 Radiation protection instrumentation - Highly sensitive hand-held instruments for neutron detection of radioactive material
BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations — Test 16a: Probe damage
BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS IEC 61468:2021 Nuclear power plants. Instrumentation systems important to safety. In-core instrumentation: Characteristics and test methods of self-powered neutron detectors

Professional Standard - Military and Civilian Products, Electron probe instrument

WJ 2297-1995 Electronic Probe Verification Regulations

American Society for Testing and Materials (ASTM), Electron probe instrument

ASTM E499-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode
ASTM E499/E499M-11 Standard Practice for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode
ASTM E498-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector or Residual Gas Analyzer in the Tracer Probe Mode

Group Standards of the People's Republic of China, Electron probe instrument

T/BEA 43002-2023 Calibration Specification for Single Langmuir Probe Plasma Instrument
T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method
T/CIS 17003-2019 Electronic instrument transformer testing equipments

International Electrotechnical Commission (IEC), Electron probe instrument

IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
IEC 60482:1975 Dimensions of electronic instrument modules (for nuclear electronic instruments)
IEC 61468:2000/AMD1:2003 Nuclear power plants - In-core instrumentation - Characteristics and test methods of self-powered neutron detectors; Amendment 1
IEC 61468:2021 Nuclear power plants - Instrumentation systems important to safety - In-core instrumentation: Characteristics and test methods of self-powered neutron detectors
IEC 61468:2000 Nuclear power plants - In-core instrumentation - Characteristics and test methods of self-powered neutron detectors
IEC 61151:1992 Nuclear instrumentation; amplifiers and preamplifiers used with detectors of ionizing radiation; test procedures
IEC 60050-300-313:2001 Electrotechnical terminology-Electrical and electronic measurements and measuring instruments-Part 3:Types of electrical measuring instruments

Military Standards (MIL-STD), Electron probe instrument

DOD A-A-51223-1985 PLIERS, OPTICIANS', FINGER PIECE, 5 INCH

Aerospace Industries Association/ANSI Aerospace Standards, Electron probe instrument

AIA/NAS NASM5501/31-2001 Cap, Circular, ESD, Protective, Electrical Connector

Military Standard of the People's Republic of China-General Armament Department, Electron probe instrument

GJB 6294-2008 General specification for military electronic-sensor radiosondes
GJB 5107A-2019 Specifications for space high-energy electron detectors
GJB 5107-2004 Specifications for space high-energy electron detectors
GJB 6073-2007 General specification for atmospheric electrostatic fleld on the ground measuring instruments
GJB 9133-2017 Military electronic test instrument terminology

Professional Standard - Textile, Electron probe instrument

FZ/T 97038-2017 Computerized flat knitting machine electronic needle selector

Professional Standard - Petroleum, Electron probe instrument

SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis
SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals

国家能源局, Electron probe instrument

SY/T 6027-2019 Electron probe quantitative analysis method of rock minerals

Professional Standard - Electron, Electron probe instrument

SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe

American National Standards Institute （ANSI), Electron probe instrument

ANSI/EIA 364-25C:1998 Electric Connectors – Probe Damage Test Procedure
ANSI/EIA 364-25D:2010 Probe Damage Test Procedure for Electrical Connectors
ANSI/IEEE 1309:2005 Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9 kHz to 40 GHz

International Organization for Standardization (ISO), Electron probe instrument

ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)

KR-KS, Electron probe instrument

KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)

Yunnan Provincial Standard of the People's Republic of China, Electron probe instrument

DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

国家市场监督管理总局、中国国家标准化管理委员会, Electron probe instrument

GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
GB/T 39722-2020 Superconducting electronic devices—Generic specification for sensors and detectors

Society of Automotive Engineers (SAE), Electron probe instrument

SAE TS351-1-1985 TS351 Test for Electrical Connectors Test Probe Damage
SAE J211-1-2003 Instrumentation for Impact Test Part 1 Electronic Instrumentation
SAE J211/1-1995 Instrumentation for Impact Test-Part 1-Electronic Instrumentation
SAE J211/1-2014 Instrumentation for Impact Test - Part 1 - Electronic Instrumentation
SAE J211/1-2007 Instrumentation for Impact Test - Part 1 - Electronic Instrumentation
SAE J211/1-2003 Instrumentation for Impact Test-Part 1-Electronic Instrumentation
SAE J211/1-2022 Instrumentation for Impact Test Part 1 - Electronic Instrumentation
SAE J211-1-2014 Instrumentation for Impact Test - Part 1 - Electronic Instrumentation
SAE J1627-2011 Performance Criteria for Electronic Refrigerant Leak detectors

Professional Standard - Machinery, Electron probe instrument

JB/T 12074-2014 Quantitative analysis of composition metal.Electron probe microanalysis
JB/T 7411-2012 Non-destructive testing instruments.Specification of electricity magnetic yoke magnetic particle flaw detector
JB/T 6841-1993 Terminology of electronic optical instrument
JB/T 9298-1999 Generic specification of electronic power supply Transformers for use in instrument
JB/T 5463-1991 Inspection rules for electronic magnetometer

Association Francaise de Normalisation, Electron probe instrument

NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
NF E11-064:1990 Electronic comparators. Electronic conditioners. Technical data sheet.
NF E05-031-601*NF EN ISO 25178-601:2010 Geometrical product specifications (GPS) - Surface texture : areal - Part 601 : nominal characteristics of contact (stylus) instruments

ECIA - Electronic Components Industry Association, Electron probe instrument

RS-364-25A-1983 TP-25A Probe Damage Test Procedure for Electrical Connectors

National Metrological Technical Specifications of the People's Republic of China, Electron probe instrument

JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe
JJF 1549-2015 Calibration specification for photodetector bandwidth tester

Professional Standard - Aviation, Electron probe instrument

HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys

工业和信息化部, Electron probe instrument

JB/T 14223-2021 Non-destructive testing instrument Rechargeable AC yoke flaw detector

AENOR, Electron probe instrument

UNE-IEC 60050-394:2009 International Electrotechnical Vocabulary - Part 394: Nuclear instrumentation - Instruments, systems, equipment and detectors.

American Society of Mechanical Engineers (ASME), Electron probe instrument

ASME B107.28M-1997 Electronic Torque Instruments

ES-UNE, Electron probe instrument

UNE-IEC 60050-394:2009 ERRATUM:2010 International Electrotechnical Vocabulary - Part 394: Nuclear instrumentation - Instruments, systems, equipment and detectors.
UNE-EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (Endorsed by AENOR in November of 2008.)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron probe instrument

GB/T 34142-2017 Radiation protection instrumentation—Highly sensitive hand-held instruments for photon detection of radioactive material
GB/T 34140-2017 Radiation protection instrumentation—Highly sensitive hand-held instruments for neutron detection of radioactive material
GB/T 2900.97-2016 Electrotechnical terminology—Nuclear instrumentation: physical phenomena, basic concepts, instruments, systems, equipment and detectors

未注明发布机构, Electron probe instrument

SAE J211/1-201403 Instrumentation for Impact Test-Part 1-Electronic Instrumentation

SAE - SAE International, Electron probe instrument

SAE J211-1-2007 Instrumentation for Impact Test Part 1 Electronic Instrumentation
SAE J211-1-1995 Instrumentation for Impact Test Part 1 Electronic Instrumentation

RU-GOST R, Electron probe instrument

GOST 14213-1989 Logging cable tips, sonde heads and logging tools heads. Types, main parameters, dimensions and technical requirements
GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices
GOST 26114-1984 Non-destructive testing. Flow detection equipment on the basic of particle accelerators. Main parameters and general technical requirements

SE-SIS, Electron probe instrument

SIS SS IEC 482:1983 Nuclear instrumentation - Dimensions of electronic instrument modules (for nuclear electronic instruments)

Fujian Provincial Standard of the People's Republic of China, Electron probe instrument

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

United States Navy, Electron probe instrument

NAVY MIL-H-21155 D-1990 HARDWARE: FOR BELT, MILITARY POLICE

Taiwan Provincial Standard of the People's Republic of China, Electron probe instrument

CNS 7664-1987 Method of Test for Low Frequency (Below 3 MHz)Electrical Connectors (TP - 25 Probe Damage Test)

PL-PKN, Electron probe instrument

PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements

Electronic Components, Assemblies and Materials Association, Electron probe instrument

ECA 190-A-1964 Pin Straighteners and Wiring Jigs for Electron Tubes

Standard Association of Australia （SAA）, Electron probe instrument

AS 4625:2008
AS 1852.303:1988 International electrotechnical vocabulary - Electronic measuring instruments

YU-JUS, Electron probe instrument

JUS L.G7.003-1981 Saffety reguirements for electronic measuring apparatus

RO-ASRO, Electron probe instrument

STAS 10327-1976 ELECTRONIC MEASURING APARATUS Safety requirements
STAS 10327/2-1987 ELECTRONIC MEASURING APPARATUS Electro-safety requirements

European Committee for Electrotechnical Standardization（CENELEC）, Electron probe instrument

HD 312-1977 Documentation to Be Supplied with Electronic Measuring Apparatus

Professional Standard - Aerospace, Electron probe instrument

QJ 2245-1992 Anti-static requirements for electronic instruments and equipment

PT-IPQ, Electron probe instrument

NP 3124-1985

CO-ICONTEC, Electron probe instrument

ICONTEC 2166-1986

Tianjin Provincial Standard of the People's Republic of China, Electron probe instrument

DB12/T 371-2018 Compilation of product standards for electronic information instruments and meters