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Near Field SEM
Near Field SEM, Total:194 items.
In the international standard classification, Near Field SEM involves: Non-ferrous metals, Optical equipment, Analytical chemistry, Optics and optical measurements, Education, Linear and angular measurements, Vocabularies, Surface treatment and coating, Air quality, Electronic display devices, Protection against crime, Thermodynamics and temperature measurements, Integrated circuits. Microelectronics, Paints and varnishes, Testing of metals, Textile fibres, Optoelectronics. Laser equipment, Construction materials, Physics. Chemistry, Iron and steel products, Ceramics, Fishing and fish breeding, Medical sciences and health care facilities in general, Semiconductor devices.
Korean Agency for Technology and Standards (KATS), Near Field SEM
ESD - ESD ASSOCIATION, Near Field SEM
- SP14.5-2015 Near-Field Immunity Scanning - Component/Module/PCB Level
TIA - Telecommunications Industry Association, Near Field SEM
Japanese Industrial Standards Committee (JISC), Near Field SEM
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
International Organization for Standardization (ISO), Near Field SEM
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
- ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
British Standards Institution (BSI), Near Field SEM
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- BS PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
National Metrological Technical Specifications of the People's Republic of China, Near Field SEM
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery, Near Field SEM
- JB/T 6842-1993 Test method of scanning electron microscope
- JB/T 5384-1991 Scanning electron microscope - Technical specification
- JB/T 7503-1994 Thickness of cross section of metal coatings Scanning electron microscope measuring method
National Metrological Verification Regulations of the People's Republic of China, Near Field SEM
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Professional Standard - Commodity Inspection, Near Field SEM
- SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
- SN/T 3009-2011 Identification of seawater corrosion on metallic surface by SEM
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method
American National Standards Institute （ANSI), Near Field SEM
- ANSI/ESD SP14.5-2021 Electrostatic Discharge Sensitivity Testing Near-Field Immunity Scanning Component/Module/PCB Level
- ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
KR-KS, Near Field SEM
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
Professional Standard - Education, Near Field SEM
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Near Field SEM
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
American Society for Testing and Materials (ASTM), Near Field SEM
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
- ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Near Field SEM
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 31563-2015 Metallic coatings.Measurement of coating thickness.Scanning electron microscope method
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
- GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
- GB/T 20307-2006 General rules for nanometer-scale length measurement by SEM
- GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
- GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel.Scanning electron microscope
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 36422-2018 Man-made fiber.Test method for micro morphology and diameter.Scanning electron microscope method
- GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
- GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 14593-2008 Quantitative analysis method of cashmere,wool and their blends.Scanning electron microscope method
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
- GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
Group Standards of the People's Republic of China, Near Field SEM
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
- T/QGCML 1940-2023
- T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
- T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
- T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
- T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
Professional Standard - Petroleum, Near Field SEM
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, Near Field SEM
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
Association of German Mechanical Engineers, Near Field SEM
- VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3866 Blatt 5-2017 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
- VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
- VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
国家能源局, Near Field SEM
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
RU-GOST R, Near Field SEM
- GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
- GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
- GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
Guangdong Provincial Standard of the People's Republic of China, Near Field SEM
- DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method
Jiangsu Provincial Standard of the People's Republic of China, Near Field SEM
- DB32/T 4546-2023 Technical specifications for automated inspection of diatom images using scanning electron microscopes
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
Professional Standard - Judicatory, Near Field SEM
International Electrotechnical Commission (IEC), Near Field SEM
- IEC TR 61967-1-1:2010 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions - Near-field scan data exchange format
- IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
- IEC 61967-1-1:2010 Integrated circuits – Measurement of electromagnetic emissions –
Part 1-1: General conditions and definitions – Near-field scan data exchange
format
国家市场监督管理总局、中国国家标准化管理委员会, Near Field SEM
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 38783-2020 Method of coating thickness determination for precious metal composites by scanning electron microscope
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
Military Standard of the People's Republic of China-General Armament Department, Near Field SEM
- GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
SE-SIS, Near Field SEM
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
European Committee for Standardization (CEN), Near Field SEM
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
Association Francaise de Normalisation, Near Field SEM
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
- NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
Danish Standards Foundation, Near Field SEM
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
German Institute for Standardization, Near Field SEM
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
- DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
- DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
ES-UNE, Near Field SEM
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
工业和信息化部, Near Field SEM
- YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy
- SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy
Professional Standard - Public Safety Standards, Near Field SEM
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1418-2017 Elemental Composition Examination of Forensic Science Glass Evidence Scanning Electron Microscopy/Energy Spectroscopy
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
- GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
Fujian Provincial Standard of the People's Republic of China, Near Field SEM
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Near Field SEM
- GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy
AENOR, Near Field SEM
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
Lithuanian Standards Office , Near Field SEM
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
AT-ON, Near Field SEM
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
Professional Standard - Electron, Near Field SEM
- SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
- SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits
- SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits
- SJ/T 11087-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits
- SJ/T 10784-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification)
BE-NBN, Near Field SEM
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
Shandong Provincial Standard of the People's Republic of China, Near Field SEM
- DB37/T 420.2-2004 Diagnosis protocol for scorpion finger disease in mariculture fish part 2: Scanning electron microscopy diagnostic method
未注明发布机构, Near Field SEM
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
Professional Standard - Aviation, Near Field SEM
- HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry