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near-field scanning chip
near-field scanning chip, Total:25 items.
In the international standard classification, near-field scanning chip involves: Languages used in information technology, Non-ferrous metals, Medical equipment, Plastics, Optoelectronics. Laser equipment, Thermodynamics and temperature measurements, Analytical chemistry, Integrated circuits. Microelectronics.
Institute of Electrical and Electronics Engineers (IEEE), near-field scanning chip
American National Standards Institute （ANSI), near-field scanning chip
ESD - ESD ASSOCIATION, near-field scanning chip
- SP14.5-2015 Near-Field Immunity Scanning - Component/Module/PCB Level
TIA - Telecommunications Industry Association, near-field scanning chip
Korean Agency for Technology and Standards (KATS), near-field scanning chip
- KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, near-field scanning chip
- GB/T 33805-2017 Technical requirement of laser confocal biochip scanner
- GB/T 33806-2017 Technical requirement of area fluorescent imaging microarray scanner
International Organization for Standardization (ISO), near-field scanning chip
- ISO 23976:2021 Plastics - Fast differential scanning calorimetry (FSC) - Chip calorimetry
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
British Standards Institution (BSI), near-field scanning chip
- BS ISO 23976:2021 Plastics. Fast differential scanning calorimetry (FSC). Chip calorimetry
- 20/30396016 DC BS ISO 23976. Plastics. Fast differential scanning calorimetry. Chip calorimetry
- PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
SE-SIS, near-field scanning chip
German Institute for Standardization, near-field scanning chip
- DIN 58002:2001 Integrated optics - Near-field-measurement for single-mode optical chip components
- DIN 51007-2:2021 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry
- DIN 51007-2:2021-10 Thermal analysis - Differential thermal analysis (DTA) and Differential scanning calorimetry (DSC) - Part 2: Fast differential scanning calorimetry (f-DSC); Chip calorimetry
PT-IPQ, near-field scanning chip
International Electrotechnical Commission (IEC), near-field scanning chip
- IEC TR 61967-1-1:2010 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions - Near-field scan data exchange format
- IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
- IEC 61967-1-1:2010 Integrated circuits – Measurement of electromagnetic emissions –
Part 1-1: General conditions and definitions – Near-field scan data exchange
format
未注明发布机构, near-field scanning chip
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice