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near-field scanning probe
near-field scanning probe, Total:19 items.
In the international standard classification, near-field scanning probe involves: Analytical chemistry, Education, Non-ferrous metals, Optics and optical measurements, Optical equipment, Vocabularies.
International Organization for Standardization (ISO), near-field scanning probe
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
British Standards Institution (BSI), near-field scanning probe
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
RU-GOST R, near-field scanning probe
- GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
National Metrological Technical Specifications of the People's Republic of China, near-field scanning probe
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Education, near-field scanning probe
- JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, near-field scanning probe
- GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
ESD - ESD ASSOCIATION, near-field scanning probe
- SP14.5-2015 Near-Field Immunity Scanning - Component/Module/PCB Level
TIA - Telecommunications Industry Association, near-field scanning probe
Korean Agency for Technology and Standards (KATS), near-field scanning probe
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
- KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, near-field scanning probe
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy