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Quantitative Analysis Electronics x

Quantitative Analysis Electronics x, Total:496 items.

In the international standard classification, Quantitative Analysis Electronics x involves: Optical equipment, Analytical chemistry, Optics and optical measurements, Refractories, Non-destructive testing, Testing of metals, Test conditions and procedures in general, Non-ferrous metals, Natural gas, Vocabularies, Medical sciences and health care facilities in general, Inorganic chemicals, Linear and angular measurements, Education, Semiconducting materials, Environmental protection, Air quality, Environmental testing, Electrical engineering in general, Metalliferous minerals, Paper and board, Electronic components in general, Medical equipment, Petroleum products in general, Non-metalliferous minerals, Surface treatment and coating, Fuels, Protection against fire, Products of the chemical industry, Ferroalloys, Physics. Chemistry, Ferrous metals, Plastics, Nuclear energy engineering, Corrosion of metals, Fertilizers, Edible oils and fats. Oilseeds, Electricity. Magnetism. Electrical and magnetic measurements, Rotating machinery, ENVIRONMENT. HEALTH PROTECTION. SAFETY, Particle size analysis. Sieving.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Quantitative Analysis Electronics x

GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
GB/T 27896-2011 Test method for water vapor content of natural gas using.Electronic moisture analyzers
GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 29858-2013 Standard guidelines for molecular spectroscopy multivariate calibration quantitative analysis
GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
GB/T 17416.2-1998 Method for chemical analysis of Zirconium ores.Determination of Zirconium and Hafnium contents.X-ray fluorescence spectrometric method
GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
GB/T 8220.6-1998 Methods for chemical analysis of bismuth--Determination of lead content--Electrothermal atomic absorption spectrometric method
GB/T 8220.12-1998 Methods for chemical analysis of bismuth--Determination of nickel content--Electrothermal atomic absorption spectrometric method
GB/T 6730.28-1986 Methods for chemical analysis of iron ores--The ion-selective electrode method for the determination of fluorine content
GB/T 8151.9-1987 Methods for chemical analysis of zinc concentrates--The ion selective electrode method for the determination of fluorine content
GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
GB/T 8220.13-1998 Methods for chemical analysis of bismuth--Determination of silver and cadmium content--Electrothermal atomic absorption spectrometric method
GB/T 1819.15-2006 Methods for chemical analysis of tin concentrates. Determination of fluorine content. The ion-selective electrode method
GB/T 8647.2-2006 The methods for chemical analysis of nickel. Determination of aluminium content. Electrothermal atomic absorption spectrometric method
GB/T 8156.10-1987 Aluminium fluoride for industrial use--Determination of sulphur content--X-ray fluorescence spectrometric method
GB/T 23273.6-2009 Methods for chemical analysis of cobalt oxalate.Part 6:Determination of chlorine ion content.Ion selective electrode method
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
GB/T 6987.27-2001 Aluminium and aluminium alloys--Determination of boron content--Ion selective electrode method
GB/T 14506.12-1993 Sillicate rocks. Determination of fluorine content. Ion selective electrode method
GB/T 11067.4-2006 Methods for chemical analysis of silver. Determination of antimony content. The inductively coupled plasma atomic emission spectrometric method
GB/T 4324.13-2008 Methods of chemical analysis of tungsten Determination of calcium content Inductively coupled plasma atomic emission spectrometry
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis
GB/T 23513.4-2009 Chemical analysis methods for germanium concentrate.Part 4:Determination of fluoride content.ISE
GB/T 3884.5-2012 Methods for chemical analysis of copper concentrates.Part 5:Determination of fluoride content.Ion selective electrode method
GB/T 8151.9-2012 Methods for chemical analysis of zinc concentrates.Part 9:Determination of fluorine content.The ion selective electrode method
GB/T 3260.7-2013 Methods for chemical analysis of tin.Part7:Determination of aluminium content.Electrothermal atomic absorption spectrometric method
GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
GB/T 4324.7-2012 Methods for chemical analysis of tungsten.Part 7:Determination of cobalt content.Inductively coupled plasma atomic emission spectrometry
GB/T 4324.11-2012 Methods for chemical analysis of tungsten.Part 11:Determination of aluminum content.Inductively coupled plasma atomic emission spectrometry
GB/T 4324.21-2012 Methods for chemical analysis of tungsten.Part 21:Determination of chromium content.Inductively coupled plasma atomic emission spectrometry
GB/T 4324.22-2012 Methods for chemical analysis of tungsten.Part 22:Determination of manganese content.Inductively coupled plasma atomic emission spectrometry
GB/T 4325.12-2013 Methods for chemical analysis of molybdenum.Part 12:Determination of silicon content.Inductively coupled plasma atomic emission spectrometry
GB/T 4325.24-2013 Method for chemical analysis of molybdenum.Part 24:Determination of tungsten content.Inductively coupled plasma atomic emission spectrometry
GB/T 4324.20-2012 Methods for chemical analysis of tungsten.Part 20:Determination of vanadium content.Inductively coupled plasma atomic emission spectrometry
GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 17417.2-1998 Method for chemical analysis of rare earth ores--Determination of scandium content--ICP-AES method
GB/T 11067.3-2006 Methods for chemical analysis of silver. Determination of selenium and tellurium content. Inductively coupled plasma atomic emission spectrometric method
GB/T 20166.2-2006 Chemical analysis methods of rare earth polishing powder - Determination fluorine content - Ion selective electrode analysis
GB/T 12689.13-1990 Zinc and zinc alloys--Determination of aluminium content--Electrothermal atomic absorption spectrometric method
GB/T 13748.21-2009 Chemical analysis methods of magnesium and magnesium alloys.Part 21:Determination of elements by photoelectric direct reading atomic emission spectrometry
GB/T 15076.6-2020 Methods for chemical analysis of tantalum and niobium—Part 6:Determination of silicon content—Inductively coupled plasma atomic emission spectrometry
GB/T 29732-2013 Surface chemical analysis.Medium resolution Auger electron spectrometers.Calibration of energy scales for elemental analysis
GB/T 23273.2-2009 Mehods for chemical analysisi of cobalt oxalate.Part 2:Determination of lead content.Electrothermal atomic absorption spectrometry
GB/T 14849.5-2010 Chemical analysis of slion metal.Part 5: Determination of elements content.Analysis using an X-ray fluorescence method
GB/T 4375.10-1984 Methods for chemical analysis of gallium--The atomic absorption spectrophotometric method for the determination of zinc content
GB/T 4324.16-1984 Methods for chemical analysis of tungsten--The atomic absorption spectrophotometric method for the determination of magnesium content
GB/T 4324.17-1984 Methods for chemical analysis of tungsten--The atomic absorption spectrophotometric method for the determination of sodium content
GB/T 4324.18-1984 Methods for chemical analysis of tungsten--The atomic absorption spectrophotometric method for the determination of potassium content
GB/T 4324.14-1984 Methods for chemical analysis of tungsten--The atomic absorption spectrophotometric method for the determination of calcium content
GB/T 4325.17-1984 Methods for chemical analysis of molybdenum--The atomic absorption spectrophotometric method for the determination of sodium content
GB/T 4325.14-1984 Methods for chemical analysis of molybdenum--The atomic absorption spectrophotometric method for the determination of calcium content
GB/T 4325.18-1984 Methods for chemical analysis of molybdenum--The atomic absorption spectrophotometric method for the determination of potassium content
GB/T 4325.16-1984 Methods for chemical analysis of molybdenum--The atomic absorption spectrophotometric method for the determination of magnesium content
GB/T 8647.7-2006 The methods for chemical analysis of nickel. Determination of arsenic, antimony, bismuth, tin and lead contents. Electrothermal atomic absorption spectrometric method

Association Francaise de Normalisation, Quantitative Analysis Electronics x

NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
NF X21-001:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs).
NF M07-095*NF EN ISO 14597:1999 Petroleum products. Determination of vanadium and nickel content. Wavelength-dispersive X-ray fluorescence spectrometry.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF A09-230-3:1999 Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3 : spectrometric method.
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF ISO 17560:2006 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage du bore dans le silicium par profilage d'épaisseur
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF M60-404:1998 Determination of plutonium content in plutonium dioxide (PuO2) of nuclear grade quality. Gravimetric method.
NF A09-230-1:1999 Non-destructive testing. Measurement and evaluation of the X-ray tube voltage. Part 1 : voltage divider method.
NF EN 62220-1-2:2007 Appareils électromédicaux - Caractéristiques des dispositifs d'imagerie numérique à rayonnement X - Partie 1-2 : détermination de l'efficacité quantique de détection - Détecteurs utilisés en mammographie
NF B40-670-3*NF EN ISO 21587-3:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 3 : inductively coupled plasma and atomic absorption spectrometry methods
NF U44-145:1984 FERTILIZERS AND SOILS CONDITIONERS. DETERMINATION OF MAGNESIUM BY ATOMIC ABSORPTION SPECTROMETRIC METHOD.
NF X21-004*NF ISO 22309:2012 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above.
NF V03-918-2:1997 Rapeseed. Determination of glucosinolates content. Part 2 : method using X-ray fluorescence spectrometry.
NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF C42-695:1985 Electronic measuring instruments. Expression of the properties of logic analyzers.
NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
NF C74-225*NF EN 61262-5:1994 Medical electrical equipment. Characteristics of electro-optical X-ray image intensifiers. Part 5 : determination of the detective quantum efficiency.
NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
NF EN 61676/A1:2009 Appareils électromédicaux - Instruments de dosimétrie pour la mesure non invasive de la tension du tube radiogène dans la radiologie de diagnostic
NF A09-230-2:2000 Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2 : constancy check by the thick filter method.
NF EN IEC 61676:2023 Appareils électromédicaux - Appareils de dosimétrie pour le mesurage non invasif de la tension du tube radiogène dans la radiologie de diagnostic
NF C74-220-1:2005 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1 : determination of the detective quantum efficiency.
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.

International Organization for Standardization (ISO), Quantitative Analysis Electronics x

ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
ISO 14595:2003 Analyse par microfaisceaux - Microanalyse par sonde à électrons - Lignes directrices pour les spécifications des matériaux de référence certifiés (CRM) (Première édition)
ISO 14595:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 14595:2003/Cor 1:2005 Analyse par microfaisceaux - Microanalyse par sonde à électrons - Lignes directrices pour les spécifications des matériaux de référence certifiés (CRM) RECTIFICATIF TECHNIQUE 1 (Première édition)
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14594:2003 Analyse par microfaisceaux - Analyse par microsonde électronique (Microsonde de Castaing) - Lignes directrices pour la détermination des paramètres expérimentaux pour la spectrométrie à dispersion de longueur d'onde
ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 10469:1994 Copper sulfide concentrates - Determination of copper content - Electrogravimetric method
ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO/DIS 19430 Determination of particle size distribution and number concentration by particle tracking analysis (PTA)

Korean Agency for Technology and Standards (KATS), Quantitative Analysis Electronics x

KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15472-2003(2018)
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 14595:2012 Microbeam analysis-Electron probe microanalysis-Guidelines for the specification of certified reference materials(CRMs)
KS M 1068-2005 Qualitative/quantitative screening by XRF spectrometry
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS C IEC 61262-5-2003(2018)
KS M ISO 14597:2003 Petroleum products－Determination of vanadium and nickel content－Wavelength-dispersive X-ray fluorescence spectrometry
KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 13898-3:2010 Steel and iron-Determination of nickel, copper and cobalt contents-Inductively coupled plasma atomic emission spectrometric method-Part 3:Determination of copper content
KS D ISO 13898-4:2010 Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 4：Determination of cobalt content
KS D ISO 13898-2:2010 Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 2：Determination of nickel content
KS D ISO 13898-2-2010(2020) Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 2：Determination of nickel content
KS D ISO 13898-4-2010(2020) Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 4：Determination of cobalt content
KS D ISO 13898-3-2010(2020) Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 3：Determination of copper content
KS D ISO 11435-2006(2016) Nickel alloys－Determination of molybdenum－Inductively coupled plasma atomic emission spectrometric method
KS D ISO 22033-2006(2016) Nickel alloys－Determination of niobium－Inductively coupled plasma atomic emission spectrometric method
KS C IEC/TR 62725-2017(2022) Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
KS C IEC 62220-1:2005 Medical electrical equipment－Characteristics of digital X-Ray imaging device－Part 1：Determination of the detective quantum efficiency
KS C IEC 61262-5:2003 Medical electrical equipment－Characteristics of electro-optical X-ray image intensifiers－Part 5：Determination of the detective quantum efficiency
KS C IEC 62220-1-2005(2016) Medical electrical equipment－Characteristics of digital X-Ray imaging device－Part 1：Determination of the detective quantum efficiency
KS D 1702-2005 Platium-Determination of trace-element content by inductively coupled plasma spectrometric analysis-Matrix matching method

KR-KS, Quantitative Analysis Electronics x

KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15472-2003(2023)
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)

British Standards Institution (BSI), Quantitative Analysis Electronics x

BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS 3727-14:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of tungsten (gravimetric method)
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS 3727-3:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of carbon
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS 3727-12:1970 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of sulphur (combustion method)
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS 3727-1:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of aluminium (photometric method)
BS 3727-2:1968 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of boron (photometric method)
BS 3727-4:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of chromium (photometric method)
BS 3727-5:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of cobalt (photometric method)
BS 3727-6:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of copper (photometric method)
BS 3727-7:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of iron (photometric method)
BS 3727-8:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of manganese (photometric method)
BS 3727-9:1967 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of magnesium (photometric method)
BS 3727-13:1965 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of titanium (photometric method)
BS 3727-15:1968 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of zinc (photometric method)
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS 3727-21:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of magnesium (atomic absorption method)
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS 3727-22:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of zinc (atomic absorption method)
BS 3727-10:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of silicon 0.020-0.25 per cent (photometric method)
BS 3727-11:1965 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of silicon 0.001-0.020 per cent (photometric method)
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS 3727-16:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of combined and free magnesium
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS 7020-19:1989 Analysis of iron ores. Method for the determination of fluorine content. Ion-selective electrode method
BS 7020-19:1988 Analysis of iron ores. Method for the determination of fluorine content. Ion-selective electrode method
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
PD IEC TS 63109:2022 Photovoltaic (PV) modules and cells. Measurement of diode ideality factor by quantitative analysis of electroluminescence images
BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS 3762-3.24:1988 Analysis of formulated detergents - Quantitative test methods - Method for determination of low molecular mass alcohols content
BS ISO 14595:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
BS ISO 14595:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 19318:2021 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
BS EN 62220-1:2004 Medical electrical equipment. Characteristics of digital X-ray imaging devices. Determination of the detective quantum efficiency

Japanese Industrial Standards Committee (JISC), Quantitative Analysis Electronics x

JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS T 0306:2002 Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy

Professional Standard - Ferrous Metallurgy, Quantitative Analysis Electronics x

YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
YB/T 190.10-2001 Methods for chemical analysis of continuous casting mold powder The ion-selective electrode method for the determination of fluorine content

工业和信息化部, Quantitative Analysis Electronics x

YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method
YS/T 1033-2015 Determination of element content of dry anti-seepage materials by X-ray fluorescence spectrometry
YS/T 1569.5-2022 Methods for chemical analysis of lithium nickel manganate Part 5: Determination of chloride ion content Ion selective electrode method
YB/T 4799-2018 Determination of the precipitated phase amount of aluminum nitride in steel by electrolytic separation-inductively coupled plasma atomic emission spectrometry
YS/T 1179.1-2017 Methods for chemical analysis of aluminum slag Part 1: Determination of fluorine content Ion-selective electrode method
YS/T 1057.2-2020 Methods for chemical analysis of cobalt tetroxide Part 2: Determination of chloride ion content Ion selective electrode method
YS/T 1531-2022 Chemical analysis methods for rhodium carbon - Determination of rhodium content - Inductively coupled plasma atomic emission spectrometry
YS/T 581.15-2012 Methods for chemical analysis and determination of physical properties of aluminum fluoride Part 15: Determination of elemental content by X-ray fluorescence spectrometry (tablet pressing) method
YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
YS/T 1171.4-2017 Methods for chemical analysis of recycled zinc raw materials Part 4: Determination of fluorine content Ion-selective electrode method
YS/T 1476-2021 Chemical Analysis Methods for Zircon Sand Determination of Barium Content Inductively Coupled Plasma Atomic Emission Spectrometry
YB/T 4700-2018 Determination of the amount of precipitated phase of manganese sulfide in iron and steel by electrolytic separation-flame atomic absorption spectrometry

American Society for Testing and Materials (ASTM), Quantitative Analysis Electronics x

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E2108-10 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E3063-17 Test Method for Antimony Content Using Neutron Activation Analysis (NAA)
ASTM E3063-16 Test Method for Antimony Content Using Neutron Activation Analysis (NAA)
ASTM UOP481-10 Water in Liquid Hydrocarbons by Coulometry
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM D4940-10 Standard Test Method for Conductimetric Analysis of Water Soluble Ionic Contamination of Blasting Abrasives
ASTM E1097-97 Standard Guide for Direct Current Plasma Emission Spectrometry Analysis
ASTM E10-08 Standard Test Method for Brinell Hardness of Metallic Materials
ASTM E10-15 Standard Test Method for Brinell Hardness of Metallic Materials

Standard Association of Australia （SAA）, Quantitative Analysis Electronics x

AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
AS 1696.2:1997 Copper - Determination of copper content - Electrogravimetric method
AS/NZS 4356.5:1996 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Determination of the detective quantum efficiency

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Quantitative Analysis Electronics x

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 34500.1-2017 Chemical analysis methods for rare earth residue and waste water—Part 1：Determination of fluorine content—Ion selective electrode analysis
GB/T 1819.15-2017 Methods for chemical analysis of tin concentrates—Part 15：Determination of fluorine content—The ion-selective electrode method
GB/T 15076.5-2017 Methods for chemical analysis of tantalum and niobium—Part5:Determination of molybdenum and tungsten contents—Inductively coupled plasma atomic emission spectrometry
GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

未注明发布机构, Quantitative Analysis Electronics x

BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
YY 0457.5-2003 Medical electrical equipment. Characteristics of photoelectric X-ray image intensifiers. Part 5: Determination of detection quantum efficiency

国家市场监督管理总局、中国国家标准化管理委员会, Quantitative Analysis Electronics x

GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 27896-2018 Test method for water vapor content of natural gas—Electronic moisture analyzers
GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis

Professional Standard - Petroleum, Quantitative Analysis Electronics x

SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis
SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
SY/T 6210-1996 X-ray Diffraction Quantitative Analysis Method of Total Clay Minerals and Common Non-clay Minerals in Sedimentary Rocks

国家能源局, Quantitative Analysis Electronics x

SY/T 6027-2019 Electron probe quantitative analysis method of rock minerals

German Institute for Standardization, Quantitative Analysis Electronics x

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 29571-3:1990-10 Aerospace; electrical equipment; analysis of load and power source capacity
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 25703:1993 Determination of the uranium and plutonium content in nitric acid solutions by wavelength dispersive X-ray fluorescence analysis
DIN 51440-1:2003 Testing of gasolines - Determination of phosphorus content - Part 1: Analysis by wavelength dispersive X-ray spectrometry (XRS)
DIN EN 61262-5:1995 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 5: Determination of the detective quantum efficiency (IEC 61262-5:1994); German version EN 61262-5:1994
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 16592:2015 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)
DIN 6855-4:2004 Quality control of nuclear medicine instruments - Part 4: Constancy testing of positron emission tomographs (PET)
DIN EN ISO 14597:1999 Petroleum products - Determination of vanadium and nickel content - Wavelength-dispersive X-ray fluorescence spectrometry (ISO 14597:1997); German version EN ISO 14597:1999
DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation

Professional Standard - Aviation, Quantitative Analysis Electronics x

HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys
HB/Z 5091.5-1999 Analysis method for chrome plating solution Determination of ferrous content through atomic absorption spectrometry
HB/Z 5091.6-1999 Analysis method for chrome plating solution Determination of copper content through atomic absorption spectrometry
HB/Z 5088.6-1999 Analytical method of electroplating nickel solution Determination of copper content by atomic absorption spectrometry
HB/Z 5088.5-1999 Analysis method for nickel plating solution Determination of ferrous content through atomic absorption spectrometry
HB 5219.11-1998 Chemical Analysis Methods of Magnesium Alloys - Determination of Nickel Content by Atomic Absorption Spectrometry
HB 5219.13-1998 Magnesium Alloy Chemical Analysis Methods Atomic Absorption Spectroscopic Analysis Determination of Zinc Content
HB 5219.20-1998 Methods of chemical analysis of magnesium alloys - Determination of silver content by atomic absorption spectrometry
HB 5219.3-1998 Methods of chemical analysis of magnesium alloys - Determination of copper content by atomic absorption spectrometry
HB 5219.8-1998 Methods of chemical analysis of magnesium alloys - Determination of manganese content by atomic absorption spectrometry
HB 5219.5-1998 Methods of chemical analysis of magnesium alloys - Determination of iron content by atomic absorption spectrometry
HB/Z 5218.25-2004 Methods for chemical analysis of aluminium alloys-Part 25:Determination of boron content by ion selective electrode method
HB/Z 5086.7-2000 Analytical method of copper cyanide electroplating solution Determination of lead content by atomic absorption spectrometry
HB/Z 5086.8-2000 Analytical method of copper cyanide electroplating solution Determination of silver content by atomic absorption spectrometry
HB/Z 5093.6-2000 Analytical method of alkaline electroplating tin solution Determination of lead content by atomic absorption spectrometry
HB/Z 5093.7-2000 Analytical method of alkaline electroplating tin solution Determination of copper content by atomic absorption spectrometry
HB/Z 5084.5-2000 Analytical method of cyanide electroplating zinc solution - Determination of iron content by atomic absorption spectrometry
HB/Z 5084.6-2000 Analytical method of cyanide electroplating zinc solution - Determination of copper content by atomic absorption spectrometry
HB/Z 5085.7-1999 Analytical method of cadmium electroplating solution in cyanide electroplating Atomic absorption spectrometry Determination of iron content
HB/Z 5085.8-1999 Analytical method of cadmium electroplating solution in cyanide plating Determination of copper content by atomic absorption spectrometry
HB/Z 5089.1-2004 Methods for analysis of plating black nickel solutions Part 1:Determination of ammonium nickel sulfate content by ion selective electrode method
HB 7716.14-2002 Spectrometric analysis of titanium alloys Part 14:Determination of yttrium content-Inductively coupled plasma atomic emission spectrometric method
HB 6731.1-1993 Determination of Copper Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.9-1993 Determination of Chromium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.4-1993 Determination of Lead Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.5-1993 Determination of Cadmium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.6-1993 Determination of Iron Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.7-1993 Determination of Manganese Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.8-1993 Determination of Nickel Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.10-1993 Determination of Vanadium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB 6731.3-1993 Determination of Zinc Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB/Z 339.2-1999 Analytical method of aluminum alloy chromic acid anodizing solution for determination of chloride ion content by potentiometric titration
HB/Z 5104.3-1999 Analysis method for aluminum alloy sulphide acid anodizing solution Determination of chloride Ion content through potentiometric titration
HB/Z 5086.9-2000 Analytical method of copper cyanide electroplating solution Determination of zinc and cadmium content by atomic absorption spectrometry

National Metrological Technical Specifications of the People's Republic of China, Quantitative Analysis Electronics x

JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe

RU-GOST R, Quantitative Analysis Electronics x

GOST 19647-1974 Methods and means of radioisotope X-ray analysis. Terms and definitions
GOST R 50706.4-1994 Nitric acid for industrial use. Determination of chloride ions content. Potentiometric method
GOST IEC 61262-5-2011 Medical electrical equipment. Characteristics of electro-optical X-ray image intensifiers. Part 5. Determination of the detective quantum efficiency
GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
GOST R IEC 61262-5-1999 Medical electrical equipment. Characteristics of electro-optical X-ray image intensifiers. Part 5. Determination of the detective quantum efficiency
GOST R IEC 62220-1-2006 Medical electrical equipment. Characteristics of digital X-ray imaging devices. Part 1. Determination of the detective quantum efficiency

海关总署, Quantitative Analysis Electronics x

HS/T 52-2016 X-ray fluorescence quantitative analysis method for magnesium oxide series mineral products

Fujian Provincial Standard of the People's Republic of China, Quantitative Analysis Electronics x

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

National Metrological Verification Regulations of the People's Republic of China, Quantitative Analysis Electronics x

JJG 901-1995 Verification Regulation of Electron Probe Microanalyzer

Professional Standard - Education, Quantitative Analysis Electronics x

JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

Professional Standard - Electron, Quantitative Analysis Electronics x

SJ/T 10904-1996 Determination of fluorine in electronic glass - Ion-selective electrode method
SJ/T 11029-2015 Analytical methods for gold nickel brazing for electron device Determination of nickel by EDTA volumetry
SJ/T 11028-2015 Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry
SJ/T 11020-1996 Methods of analysis for silver-copper brazing for electronic components - Determination of copper (iodimetric method)
SJ/T 11018-2016 Analytical methods for pure silver brazing for electron device Determination of sulphur by combustion-iodimetry
SJ/T 11028-1996 Methods of analysis for gold-copper brazing for electronic components - Determination of copper (Volumetric-EDTA method)
SJ/T 11029-1996 Methods of analysis for gold-copper brazing for electronic components - Determination of nickel (Volumetric-EDTA method)
SJ/T 11018-1996 Methods of analysis for pure silver brazing for electronic components - Determination of sulfur (iodimetric combustion method)
SJ/T 10906-1996 Determination of BaO in electronic glass - Barium sulfate weight method

International Electrotechnical Commission (IEC), Quantitative Analysis Electronics x

IEC TR 62725:2013 Analysis of quantification methodologies for greenhouse gas emissions for electrical and electronic products and systems
IEC 62220-1-2:2007 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1-2: Determination of the detective quantum efficiency - Detectors used in mammography
IEC 62220-1:2003 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1: Determination of the detective quantum efficiency

Professional Standard - Non-ferrous Metal, Quantitative Analysis Electronics x

YS/T 536.6-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Lead
YS/T 536.12-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Nickel Content
YS/T 536.2-2009 Methods for chemical analysis of bismuth.Determination of iron content.Electrothermal atomic absorption spectrometric method
YS/T 536.6-2009 Methods for chemical analysis of bismuth.Determination of lead content.Electrothermal atomic absorption spectrometric method
YS/T 536.12-2009 Methods for chemical analysis of bismuth.Determination of nickel content.Electrothermal atomic absorption spectrometric method
YS/T 536.13-2009 Methods for chemical analysis of bismuth.Determination of cadmium content.Electrothermal atomic absorption spectrometric method
YS/T 536.13-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Silver and Cadmium
YS/T 990.5-2014 Methods for chemical analysis of copper matte.Part 5:Determination of fluorine content.Ion-selective electrode method
YS/T 273.14-2008 Chemical analysis methods and determination of physical performance of synthetic cryolite.Part 14: X-ray fluorescence spectrometric method for the determination of elements content
YS/T 581.10-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 10:Determination of sulphur content by X-ray fluorescence spectrometric method
YS/T 273.11-2006 Chemical analysis methods and physical properties of cryolite. Part 11:Determination of sulphur content by X-ray fluorescence spectrometric method
YS/T 1593.3-2023 Methods for chemical analysis of crude lithium carbonate—Part 3：Determination of fluoride ion content—Ion selective electrode method
YS/T 581.16-2008 Chemical analysis methods and determination of physical performance of industrial aluminium fluoride.Part 16: X-ray fluorescence spectrometric method for the determination of elements content
YS/T 74.3-2010 Methods for chemical analysis of cadmium- Part 3: Determination of nickel content- Electrothermal atomic absorption spectrometric method
YS/T 254.5-1994 Methods for chemical analysis of beryllium concentrates-beryl The ion selective electrode method for the determination of fluorine content
YS/T 1072-2015 Chemical analysis methods of palladium-carbon.Determination of palladium contents.Inductively coupled plasma-atomic emission spectrometry
YS/T 703-2014 Method for chemical analysis of Limstone.Determination of element contents.X-ray fluorescence spectrometric method
YS/T 227.7-2010 Methods for chemical analysis of tellurium-Part 7: Determination of sulphur content-Inductively coupled plasma-atomic emission spectrometry
YS/T 281.12-1994 Cobalt - Determination of arsenic antimony bismuth tin and lead contents - Flame atomic absorption spectrophotometric method
YS/T 581.18-2012 Chemical analysis methods and physical properties of Aluminum Fluoride.Part 18:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
YS/T 273.15-2012 Chemical analysis methods and physical properties of cryolite.Part 15:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
YS/T 739-2010 Determination of cryolite rate and main components of electrolyte-X-ray fluorescence spectrometric analysis method
YS/T 1073-2015 Chemical analysis methods of palladium-carbon.Determination of plumbum,cuprum and iron contents.Inductively coupled plasma-atomic emission spectrometry
YS/T 575.23-2009 Method for chemical analysis of aluminum ores.Part 23:Determination of element contents X-ray fluorescence spectrometric method
YS/T 520.10-2006 Gallium Chemical Analysis Methods Atomic Absorption Spectrophotometry Determination of Zinc Content
YS/T 519.4-2009 Methods for chemical analysis of arsenic.Part 4:Determination of bismuth,antimony and sulfur content.Inductively coupled plasma atomic cmission spectrometry

Professional Standard - Commodity Inspection, Quantitative Analysis Electronics x

SN/T 2003.5-2006 Determination of lead,mercury,chromium,cadmium and bromine in electrical and electronic equipment-Part 5:Quantitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2003.3-2006 Determination of Lead, Mercury, Chromium, Cadmium and Bromine in electrical and electronic equipments - Part 3: Qualitative screening by X-ray fluorescence spectrometric method
SN/T 2003.4-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electronic equipment. Part 4: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method

(U.S.) Ford Automotive Standards, Quantitative Analysis Electronics x

FORD FLTM BI 017-03-2001 DETERMINATION OF COATING WEIGHT - CHROMATE/ZINC DUST COMPLEX PORTASPEC X-RAY ANALYSIS METHOD
FORD FLTM BI 017-3-2001 DETERMINATION OF COATING WEIGHT - CHROMATE/ZINC DUST COMPLEX PORTASPEC X-RAY ANALYSIS METHOD

SE-SIS, Quantitative Analysis Electronics x

SIS SS IEC 746:1984 Electronic measuring equipment - Expression of performance of electrochemical analyzers
SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers
SIS SS IEC 776:1986 Electronic measuring equipment- Expression ofthe properties oflogic analyzers
SIS SS IEC 528:1984 Electronic measuring equipment - Expression ofperformance of air quality infra-red analyzers
SIS SS-ISO 8963:1990 Dosimetry of X and γ reference radiations for radiation protection over the energy range from 8 keV to 1,3 MeV

RO-ASRO, Quantitative Analysis Electronics x

STAS 6908/3-1990 Gaseous hydroc arbcrs. Hydrogen sulph. Buffers. Shapes and dimensions

Professional Standard - Customs, Quantitative Analysis Electronics x

HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer

Shandong Provincial Standard of the People's Republic of China, Quantitative Analysis Electronics x

DB37/T 266-1999 X-ray fluorescence analysis method for the determination of the amount of waste slag added in building material products

Group Standards of the People's Republic of China, Quantitative Analysis Electronics x

T/NAIA 0128-2022 Rapid Determination of Aluminum Hydroxide Determination of Element Content by X-ray Fluorescence Spectroscopic Analysis (Tablet)

Danish Standards Foundation, Quantitative Analysis Electronics x

DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/IEC/TR 62725:2013 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
DS/EN 61262-5:2013 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 5: Determination of the detective quantum efficiency

Professional Standard - Medicine, Quantitative Analysis Electronics x

YY/T 0457.5-2003 Medical electrical equipment-Characteristics of electro-optical X-ray image intensifiers-Part 5:Determination of the detective quantum efficiency
YY/T 0590.1-2005 Medical electrical equipment - Characteristics of digital X-ray imaging devices - Part 1: Determination of the detective quantum efficiency

Yunnan Provincial Standard of the People's Republic of China, Quantitative Analysis Electronics x

DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

AENOR, Quantitative Analysis Electronics x

UNE-EN 61262-5:1996 MEDICAL ELECTRICAL EQUIPMENT. CHARACTERISTICS OF ELECTRO-OPTICAL X-RAY IMAGE INTENSIFIERS. PART 5: DETERMINATION OF THE DETECTIVE QUANTUM EFFICIENCY.

Professional Standard - Machinery, Quantitative Analysis Electronics x

JB/T 10392-2002 Modal test analysis and vibration measurement methods on the stator core & frame for turbo-generators
JB/T 6237.5-1992 Chemical analysis method of silver powder for electrical contacts Determination of nickel content by flame atomic absorption spectrometry
JB/T 6237.6-1992 Silver powder chemical analysis method for electrical contacts - Determination of sodium content by flame atomic absorption spectrometry
JB/T 6237.8-1992 Determination of magnesium content by flame atomic absorption spectrometry for chemical analysis of silver powder for electrical contacts

Professional Standard - Electricity, Quantitative Analysis Electronics x

DL/T 1028-2006 Verification code for power quality analyzer

Professional Standard - Geology, Quantitative Analysis Electronics x

DZ/T 0279.21-2016 Methods of Analysis of Regional Geochemical Samples - Part 21: Determination of Fluorine by Ion Selective Electrode Method

Professional Standard-Ships, Quantitative Analysis Electronics x

CB 20042-2012 Methods for Iron alloy of copper.Determination of micro zirconium content.Inductively coupled plasma-atomic emission spectromertric method

CZ-CSN, Quantitative Analysis Electronics x

CSN 44 1693-1988 Chemical analysis of tetrahedrite. Determination of lead