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Rated photodiode

Rated photodiode, Total:448 items.

In the international standard classification, Rated photodiode involves: Optoelectronics. Laser equipment, Semiconductor devices, Electronic display devices, Vocabularies, Lamps and related equipment, Rectifiers. Convertors. Stabilized power supply, Electronic components in general, Fibre optic communications, Printed circuits and boards, Audio, video and audiovisual engineering, Television and radio broadcasting, Nuclear energy engineering, Solar energy engineering, Small craft, Electronic tubes, Dentistry, Natural gas, Electrical accessories, Electrical and electronic testing, Galvanic cells and batteries, Ceramics.


Professional Standard - Military and Civilian Products, Rated photodiode

  • WJ 2100-2004 Test method for silicon photodiodes and silicon avalanche photodiodes
  • WJ 2506-1998 Verification Regulations for Photodiode Dynamic Tester
  • WJ 2265-1995 Specifications for Preamplified Silicon Avalanche Photodiodes

ES-UNE, Rated photodiode

  • UNE-EN 120005:1992 BDS: PHOTODIODES, PHOTODIODE ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS). (Endorsed by AENOR in September of 1996.)
  • UNE-EN 120001:1992 BDS: LIGHT EMITTING DIODES, LIGHT EMITTING DIODE ARRAYS, LIGHT EMITTING DIODE DISPLAYS WITHOUT INTERNAL LOGIC AND RESISTOR. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 120006:1992 BDS: PIN-PHOTODIODES FOR FIBRE OPTIC APPLICATIONS. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 120004:1992 BDS: AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTORS OUTPUT. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 62504:2015/A1:2018 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • UNE-EN IEC 60700-3:2023 Thyristor valves for high voltage direct current (HVDC) power transmission - Part 3: Essential ratings (limiting values) and characteristics (Endorsed by Asociación Española de Normalización in February of 2023.)
  • UNE-EN IEC 62149-12:2023 Fibre optic active components and devices - Performance standards - Part 12: Distributed feedback laser diode device for analogue radio over fibre systems (Endorsed by Asociación Española de Normalización in May of 2023.)

German Institute for Standardization, Rated photodiode

  • DIN EN 120005:1996 Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
  • DIN EN 120005:1996-11 Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
  • DIN EN 120001:1993-06 Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
  • DIN EN 120001:1993 Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
  • DIN IEC 62088:2002-09 Nuclear instrumentation - Photodiodes for scintillation detectors - Test procedures (IEC 62088:2001)
  • DIN EN 62341-6-1:2011-07 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters (IEC 62341-6-1:2009); German version EN 62341-6-1:2011
  • DIN EN 62504:2018-11 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions (IEC 62504:2014 + A1:2018); German version EN 62504:2014 + A1:2018 / Note: DIN EN 62504 (2015-06) remains valid alongside this standard until 2021-04-17.
  • DIN EN 62384:2007 DC or AC supplied electronic control gear for LED modules - Performance requirements (IEC 62384:2006); German version EN 62384:2006
  • DIN 49406-2:1989 Two-pole plugs for class II appliances rated for 10 A 250 V d.c., 16 A 250 V a.c., splash-proof
  • DIN IEC 62088:2002 Nuclear instrumentation - Photodiodes for scintillation detectors - Test procedures (IEC 62088:2001)
  • DIN EN 120004:1997-02 Blank detail specification: Ambient rated photocouplers with phototransistor output; German version EN 120004:1992
  • DIN 40742:1999 Lead acid batteries - Stationary valve regulated batteries with positive tubular plates and immobilized electrolyte - Rated capacities, main dimensions, weights
  • DIN EN 62384:2010 DC or AC supplied electronic control gear for LED modules - Performance requirements (IEC 62384:2006 + A1:2009); German version EN 62384:2006 + A1:2009
  • DIN 40736-1:1992 Lead acid batteries; stationary cells with positive tubular plates; cells in plastic-containers; rated capacities, main dimensions, weights
  • DIN 40736-2:1992 Lead acid batteries; stationary cells with positive tubular plates; cells in hard-rubber containers; rated capacities, main dimensions, weights
  • DIN EN 61347-2-13:2007 Lamp controlgear - Part 2-13: Particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules (IEC 61347-2-13:2006); German version EN 61347-2-13:2006
  • DIN EN 62595-2:2013 LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit (IEC 62595-2:2012); German version EN 62595-2:2013
  • DIN EN 62341-6-1:2011 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters (IEC 62341-6-1:2009); German version EN 62341-6-1:2011
  • DIN EN 62504:2015 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions (IEC 62504:2014); German version EN 62504:2014
  • DIN 40744:1999 Lead acid batteries - Stationary valve regulated batteries with positive tubular plates and immobilized electrolyte in plastic-monobloc containers - Rated capacities, main dimensions, weights

European Standard for Electrical and Electronic Components, Rated photodiode

  • CECC 50 008- 004 Ambient Rated Rectifier Diode (En)
  • CECC 50 008- 005 Ambient Rated Rectifier Diode (En)
  • EN 120005:1992 Blank detail specification: photodiodes, photodiode-arrays (not intended for fibre optic applications)
  • EN 120001:1992 Blank detail specification; light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • CECC 50 008- 014 UTE C 86-818/014; Ambient Rated Rectifier Diodes (Fr)
  • EN 120006:1992 Blank detail specification: PIN-photodiodes for fibre optic applications
  • CECC 50 001- 059 ISSUE 2 BS CECC 50 001-059; Silicon Ambient Rated Switching Diode in Glass Encapsulation (En)
  • CECC 50 001- 065 BS CECC 50 001-065 Issue 1; Silicon Ambient Rated High Speed Switching Diode Pair (Common Cathode) in Plastic Encapsulation (En)
  • CECC 20 004- 001 ED 1-1984 UTE C 86-504; Ambient Rated Photocouplers with Phototransistor Output (Fr)
  • CECC 50 009- 023 ISSUE 1-1980 BS CECC 50 009-023; Controlled Avalanche Case Rated Silicon Rectifier Diode; 48 Amp 600 to 1400 V; Stud Mounted; Hermetically Sealed (En)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Rated photodiode

  • JEDEC JESD211-2009 Zener and Voltage Regulator Diode Rating Verification and Characterization Testing
  • JEDEC JESD51-51-2012 Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-Emitting Diodes with Exposed Cooling
  • JEDEC JESD4-1983 Definition of External Clearance and Creepage Distances of Discrete Semiconductor Packages for Thyristors and Rectifier Diodes

Association Francaise de Normalisation, Rated photodiode

  • NF EN 120005:1992 Spécification particulière cadre : photodiodes, réseaux de photodiodes (Non destinées aux applications pour les fibres optiques}
  • NF C93-120-005*NF EN 120005:1992 Blank detail specification : photodiodes, photodiode arrays (not intended for fibre optic applications)
  • NF EN 120001:1992 Spécification particulière cadre : diodes électroluminescentes, réseaux de diodes électroluminescentes, afficheurs à diodes électroluminescentes sans résistance ni circuits logiques internes
  • NF C93-120-001*NF EN 120001:1992 Blank detail specification : light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • NF C96-551/A2:1981 Optoelectronic Light emitting diodes Optocouplers Relevant Article Sheets
  • NF C96-551/A3:1981 Optoelectronic Light emitting diodes Optocouplers Relevant Article Sheets
  • NF C86-502:1983 Harmonized system of quality assessment for electronic components. Blank detail specification. Infrared emitting diodes, infrared emitting diodes arrays.
  • NF C93-872:1987 Digital receivers with pin photodiode.
  • NF C86-501:1983 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays.
  • NF C86-505:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Photodiodes. Photodiodes-arrays. Blank detail specification CECC 20 005.
  • NF EN 62341-6-1:2011 Afficheurs à diodes électroluminescentes organiques (OLED) - Partie 6-1 : méthodes de mesure des paramètres optiques et électro-optiques
  • NF C96-565-2*NF EN 62595-2:2013 LCD backlight unit - Part 2 : electro-optical measurement methods of LED backlight unit
  • NF C71-504*NF EN 62504:2014 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • NF C71-504/A1*NF EN 62504/A1:2018 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • NF EN 62504:2014 Éclairage général - Produits à diode électroluminescente (LED) et équipements associés - Termes et définitions
  • NF EN 62504/A1:2018 Éclairage général - Produits à diode électroluminescente (LED) et équipements associés - Termes et définitions
  • NF C71-305*NF EN 62384:2006 D.C. or A.C. supplied electronic control gear for LED modules - Performance requirements.
  • NF C93-120-004*NF EN 120004:1992 Blank detail specification : ambient rated photocouplers with phototransistor output
  • NF C96-541-6-1*NF EN 62341-6-1:2011 Organic light emitting diode (OLED) displays - Part 6-1 : measuring methods of optical and electro-optical parameters.
  • NF EN IEC 63286:2022 Panneaux à diodes électroluminescentes organiques (OLED) flexibles destinés à l'éclairage général - Exigences de performance
  • NF C71-251*NF EN 62560:2013 Self-ballasted LED-lamps for general lighting services by voltage > 50 V - Safety specifications
  • NF C86-819/A2:1984 Electronic Components Case-rated rectifier diodes Manual of detail specifications within the scope of the French standards NF C 86-010 and NF C 86-819 (CECC 50 000 - CECC 50 009)
  • NF EN IEC 60700-3:2023 Valves à thyristors pour le transport d'énergie en courant continu à haute tension (CCHT) - Partie 3 : valeurs assignées (valeurs limites) et caractéristiques essentielles
  • NF C71-247-13:2006 Lamp controlgear - Part 2-13 : particular requirements for d.c. for a.c. supplied electronic controlgear for LED modules.
  • NF C71-247-13*NF EN 61347-2-13:2014 Lamp controlgear - Part 2-13 : particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules
  • NF EN IEC 62149-12:2023 Composants et dispositifs actifs fibroniques - Normes de performances - Partie 12 : dispositif à diode laser à rétroaction répartie pour systèmes radio analogiques sur fibre
  • NF C86-506:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components pin-photodiodes for fibre optic applications. Blank detail specification.
  • NF C32-500*NF EN 50143:2009 Cables for signs and luminous-discharge-tube installations operating from a no-load rated output voltage exceeding 1 000 V but not exceeding 10 000 V

Korean Agency for Technology and Standards (KATS), Rated photodiode

  • KS C 7103-2005(2020) Organic Light Emitting Diode(OLED) display-Essential ratings and characteristics
  • KS C 7103-2005 Organic Light Emitting Diode(OLED) display-Essential ratings and characteristics
  • KS C 6990-2001 General rules of photodiodes for fiber optic transmission
  • KS C 6905-2001 General rules of laser diodes for fiber optic transmission
  • KS C 6991-2001 Test methods of photodiodes for fiber optic transmission
  • KS C 6906-2001 Test methods of laser diodes for fiber optic transmission
  • KS C 6990-2013 GENERAL RULES OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
  • KS C 6991-2013 TEST METHODS OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
  • KS C 7121-1990 Measuring Methods for Light Emitting Diodes (for Indication)
  • KS C 6990-2001(2011) GENERAL RULES OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
  • KS C 6991-2001(2011) TEST METHODS OF PHOTODIODES FOR FIBER OPTIC TRANSMISSION
  • KS C IEC 60747-2-2-2006(2021) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for current
  • KS C IEC 60747-2-2-2006(2016) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for current
  • KS C IEC 60747-2-1-2006(2016) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
  • KS C IEC 60747-2-1-2006(2021) Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
  • KS P ISO 10650-2-2009(2014) Dentistry-Powered polymerization activators-Part 2:Light-emitting diode(LED) lamps
  • KS C IEC 62341-6-1:2020 Organic light emitting diode(OLED) displays — Part 6-1: Measuring methods of optical and electro-optical parameters
  • KS C IEC 62504:2020 General lighting — Light emitting diode(LED) products and related equipment — Terms and definitions
  • KS C IEC 62384:2011 DC or AC supplied electronic control gear for LED modules-Performance requirements
  • KS C IEC 60747-7-2-2006(2021) Semiconductor devices-Discrete devices-Part 7:Bipolar transistors-Section Two:Blank detail specification for case-rated bipolar transistors for low-frequency amplification
  • KS C IEC 62341-6:2007 Organic light emitting diode(OLED) displays-Part 6:Measurement methods
  • KS C IEC TS 62972:2018 General lighting — Organic light emitting diode (OLED) products and related equipment — Terms and definitions
  • KS C IEC 60747-2-2:2006 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section Two : Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
  • KS C IEC 60747-2-1:2006 Semiconductor devices-Discrete devices-Part 2:Rectifier diodes-Section one:Blank detail specification for rectifier diodes(including avalanche rectifier diodes),ambient and case-rated, up to 100 A
  • KS C IEC 61347-2-13:2011 Lamp controlgear-Part 2-13:Particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules
  • KS C IEC 60747-6-2-2006(2021) Semiconductor devices-Discrete devices-Part 6:Thyristors-Section two:Blank detail specification for bidirectional triode thyristors(triacs), ambient or case-rated, up to 100 A
  • KS C IEC 60747-6-2-2006(2016) Semiconductor devices-Discrete devices-Part 6:Thyristors-Section two:Blank detail specification for bidirectional triode thyristors(triacs), ambient or case-rated, up to 100 A

SE-SIS, Rated photodiode

Lithuanian Standards Office , Rated photodiode

  • LST EN 120005-2001 Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications)
  • LST EN 120001-2001 Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • LST EN 120004-2001 Blank detail specification. Ambient rated photocouplers with phototransistor output
  • LST EN 62341-6-1-2011 Organic light emitting diode (OLED) displays -- Part 6-1: Measuring methods of optical and electro-optical parameters (IEC 62341-6-1:2009)

British Standards Institution (BSI), Rated photodiode

  • BS IEC 60747-5-8:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
  • BS EN 120005:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications)
  • BS EN 120001:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • BS IEC 60747-5-16:2023 Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
  • BS IEC 60747-5-11:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
  • BS EN 120001:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
  • BS QC 750109:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
  • 18/30367363 DC BS IEC 60747-5-8. Semiconductor devices. Part 5-8. Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
  • BS EN 120005:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications)
  • BS PD IEC/TS 62916:2017 Photovoltaic modules. Bypass diode electrostatic discharge susceptibility testing
  • 18/30388245 DC BS EN IEC 60747-5-11. Semiconductor devices. Part 5-11. Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
  • BS EN ISO 19009:2015 Small craft. Electric navigation lights. Performance of LED lights
  • PD IEC/TS 62916:2017 Photovoltaic modules. Bypass diode electrostatic discharge susceptibility testing
  • BS EN 120002:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays
  • BS CECC 50008:1992 Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
  • PD IEC TS 63109:2022 Photovoltaic (PV) modules and cells. Measurement of diode ideality factor by quantitative analysis of electroluminescence images
  • BS EN 62341-6-1:2011 Organic light emitting diode (OLED) displays. Measuring methods of optical and electro-optical parameters
  • PD IEC TR 60747-5-12:2021 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
  • BS CECC 50009:1992 Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
  • BS E9375:1975 Specification - Harmonized system of quality assessment for electronic components - Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes
  • BS IEC 60747-5-15:2022 Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
  • BS CECC 50008:1982 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
  • BS CECC 50009:1982 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
  • 19/30392174 DC BS EN 60747-5-6. Semiconductor devices. Part 5-6. Optoelectronic devices. Light emitting diodes
  • 13/30286043 DC BS EN 62341-2-1. Organic light emitting diode (OLED) displays. Part 2-1. Essential ratings and characteristics of OLED display modules
  • BS EN 62384:2006 D.C. or A.C. supplied electronic control gear for LED modules - Performance requirements
  • BS EN 62504:2014 General lighting. Light emitting diode (LED) products and related equipment. Terms and definitions
  • BS EN 62504:2014+A1:2018 General lighting. Light emitting diode (LED) products and related equipment. Terms and definitions
  • BS IEC 60747-5-9:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
  • BS EN 61347-2-13:2006 Lamp controlgear - Particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules
  • BS EN 61347-2-13:2014 Lamp controlgear. Particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules
  • BS EN 62384:2006+A1:2009 DC or AC supplied electronic control gear for LED modules - Performance requirements
  • BS PD IEC/TS 62972:2016 General lighting. Organic light emitting diode (OLED) products and related equipment. Terms and definitions
  • PD IEC/TS 62972:2016 General lighting. Organic light emitting diode (OLED) products and related equipment. Terms and definitions
  • 14/30313209 DC BS EN 62341-6-1. Organic light emitting diode (OLED) displays. Part 6-1. Measuring methods of optical and electro-optical parameters
  • 23/30475452 DC BS EN IEC 62341-6-1. Organic light emitting diode (OLED) displays - Part 6-1. Measuring methods of optical and electro-optical parameters
  • 20/30430108 DC BS EN IEC 62341-6-1. Organic light emitting diode (OLED) displays. Part 6-1. Measuring methods of optical and electro-optical parameters
  • 21/30440970 DC BS EN IEC 60747-5-16. Semiconductor devices - Part 5-16. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the photocurrent spectroscopy
  • 20/30422995 DC BS EN IEC 60747-5-15. Semiconductor devices. Part 5-15. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
  • 23/30433255 DC BS EN ISO 2612. Analysis of natural gas. Biomethane. Determination of ammonia content by Tuneable Diode Laser Absorption Spectroscopy
  • BS IEC 60747-5-10:2019 Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the room-temperature reference point
  • BS EN 62560:2012 Self-ballasted LED-lamps for general lighting services by voltage 50 V. Safety specifications
  • BS EN 62341-6-2:2012 Organic light emitting diode (OLED) displays. Measuring methods of visual quality and ambient performance
  • BS EN IEC 62149-12:2023 Fibre optic active components and devices. Performance standards - Distributed feedback laser diode device for analogue radio over fibre systems
  • 18/30367367 DC BS IEC 60747-5-62. Semiconductor devices. Part 5-9. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
  • BS ISO 23946:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test methods for optical properties of ceramic phosphors for white light-emitting diodes using a gonio-spectrofluorometer
  • BS EN 150014:1997 Harmonized system of quality assessment for electronic components - Blank detail specification: Thyristor diodes, transient overvoltage suppressors
  • BS EN 150014:1995 Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors
  • 18/30367371 DC BS IEC 60747-5-63. Semiconductor devices. Part 5-10. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency by the room-temperature reference point

International Electrotechnical Commission (IEC), Rated photodiode

  • IEC TS 62504:2011 General lighting - LEDs and LED modules - Terms and definitions
  • IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
  • IEC 91/926/PAS:2010 Electronic circuit board for high-brightness LEDs
  • IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
  • IEC 60747-5-16:2023 Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
  • IEC 60747-5-11:2019 Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
  • IEC TS 62916:2017 Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
  • IEC 60747-2-2:1993 Semiconductor devices; discrete devices; part 2: rectifier diodes; section 2: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
  • IEC 60747-2-1:1989 Semiconductor devices; discrete devices; part 2: rectifier diodes; section one: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
  • IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
  • IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
  • IEC 91/928/PAS:2010 Test methods for electronic circuit board for high-brightness LEDs
  • IEC 62341-2-1:2015 Organic light emitting diode (OLED) displays - Part 2-1: Essential ratings and characteristics of OLED display modules
  • IEC 60747-5-6:2021 RLV Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
  • IEC TS 63109:2022 Photovoltaic (PV) modules and cells - Measurement of diode ideality factor by quantitative analysis of electroluminescence images
  • IEC 62341-6-3:2017/COR1:2019 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • IEC 62341-6-1:2022 RLV Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • IEC 62341-6-1:2017 RLV Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • IEC 62341-6-1:2022 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • IEC 62595-2:2012 LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit
  • IEC 62504:2014 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • IEC 62504:2014/AMD1:2018 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • IEC 62504:2014+AMD1:2018 CSV General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • IEC 62384:2006 D.C. or A.C. supplied electronic control gear for LED modules - Performance requirements
  • IEC 62384:2011 DC or AC supplied electronic control gear for LED modules - Performance requirements
  • IEC TR 60747-5-12:2021 Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
  • IEC 62341-6-1:2017 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • IEC 62341-6-1:2009 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • IEC TS 62972:2016 General lighting - Organic light emitting diode (OLED) products and related equipment - Terms and definitions
  • IEC 60747-5-15:2022 Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
  • IEC 60747-12-3:1998 Semiconductor devices - Part 12-3: Optoelectronic devices - Blank detail specification for light-emitting diodes - Display application
  • IEC 62560:2011 Self-ballasted LED-lamps for general lighting services by voltage > 50 V - Safety specifications
  • IEC 62560:2015 Self-ballasted LED-lamps for general lighting services by voltage > 50 V - Safety specifications
  • IEC 60700-3:2022 Thyristor valves for high voltage direct current (HVDC) power transmission - Part 3: Essential ratings (limiting values) and characteristics
  • IEC 61347-2-13:2014 Lamp controlgear - Part 2-13: Particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules
  • IEC 61347-2-13:2006 Lamp controlgear - Part 2-13: Particular requirements for d.c. or a.c. supplied electronic controlgears for LED modules
  • IECQ 03-8-2018 IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 8: IECQ Scheme for LED Lighting
  • IEC 60747-5-9:2019 Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
  • IEC 60747-5-14:2022 Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
  • IEC 62149-12:2023 Fibre optic active components and devices - Performance standards - Part 12: Distributed feedback laser diode device for analogue radio over fibre systems
  • IEC 60747-12-6:1997 Semiconductor devices - Part 12-6: Optoelectronic devices - Blank detail specification for avalanche photodiodes with/without pigtail, for fibre optic systems or subsystems
  • IEC 60747-5-10:2019 Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
  • IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems

Professional Standard - Machinery, Rated photodiode

机械电子工业部, Rated photodiode

  • JB 5837-1991 ZP series case rated rectifier diodes above 2000A

Japanese Industrial Standards Committee (JISC), Rated photodiode

  • JIS C 8152-2:2012 Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light engines
  • JIS C 5990:1997 General rules of photodiodes for fiber optic transmission
  • JIS C 8152-2 AMD 1:2014 Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light engines (Amendment 1)
  • JIS C 8152-1:2012 Photometry of white light emitting diode for general lighting -- Part 1: LED packages
  • JIS C 5991:1997 Measuring methods of photodiodes for fiber optic transmission
  • JIS C 7036:1985 Measuring methods for light emitting diodes (for indication)
  • JIS C 62504:2016 General lighting -- Light emitting diode (LED) products and related equipment -- Terms and definitions
  • JIS C 8156:2011 Self-ballasted LED-lamps for general lighting services by voltage > 50 V -- Safety specifications
  • JIS C 8156:2017 Self-ballasted LED-lamps for general lighting services by voltage > 50 V -- Safety specifications

YU-JUS, Rated photodiode

  • JUS N.R1.372-1979 Semiconductor diodes. Essential ratmgs and characteristics: rectifier diodes
  • JUS N.R1.375-1980 Semiconductor diode s. Essential ratings and characteristics. Variable capacitance diodes
  • JUS N.R1.374-1980 Semiconductor diodes. Essentialratings and chdracteristics. Ttmneldiodes
  • JUS N.R1.371-1979 Semiconductor diodes. Essential ratings and characteristics: Voltage reference and voltage regulator diodes

RU-GOST R, Rated photodiode

  • GOST R 54814-2018 Light emitted diodes and light emitting diode modules for general application. Terms and definitions
  • GOST R 54814-2011 Light emitted diodes and light emitting diode modules for general application. Terms and definitions
  • GOST 19656.6-1974 Semiconductor UHF mixer diodes. Measurement methods of standard overall noise figure
  • GOST 18986.4-1973 Semiconductor diodes. Methods for measuring capacitance
  • GOST 18986.6-1973 Semiconductor diodes. Method for measuring recovery charge
  • GOST 18986.0-1974 Semiconductor diodes. Measuring methods for electrical parameters. General requirements
  • GOST 21107.10-1978 Gas discharge devices. Methods of measurement of electrical parameters of operating and measuring conditions for glow-discharge thyratrons and gas-filled rectifiers
  • GOST 18986.1-1973 Semiconductor diodes. Method for measuring direct reverse current
  • GOST 18986.3-1973 Semiconductor diodes. Method of measuring of direct forward voltage and direct forward current
  • GOST R IEC 62384-2011 Electronic control gear supplied from the sources of direet or alternative current for light emitted diode modules. Performance requirements
  • GOST 21316.6-1975 Photocells. Determination method of correspondence of current-illumination characteristic of photocell to given linearity limit in continuous operation conditions
  • GOST 21316.7-1975 Photocells. Determination method of correspondence of current-illumination characteristic of photocell to given linearity limit in pulsed operation conditions
  • GOST 19656.10-1988 Semiconductor microwave switching and limiter diodes. Methods of measuring loss resistances
  • GOST R IEC 62560-2011 Self-ballasted LED-lamps for general lighting services by voltage 50 V. Safety specifications

IECQ - IEC: Quality Assessment System for Electronic Components, Rated photodiode

  • QC 750101/SU 0004-1990 Detail Specification for Electronic Components Semiconductor Diodes@ Ambient-Rated Designated for Circuits in TV Receivers Switching Diodes (Sw)@ Type KD805A
  • QC 750101/GB 0001 ISSUE 1-1990 Silicon Ambient Rated High Speed Switching Diode in Plastic Encapsulation
  • QC 750108/ CN 0010-1992 Detail Specification for Electronic Components Ambient- Rated Silicon Rectifier Diode for Type 2CZ305
  • QC 750108/ CN 0008-1992 Detail Specification for Electronic Components Ambient- Rated Silicon Rectifier Diode for Type 2CZ317
  • QC 750108/ CN 0006-1992 Detail Specification for Electronic Components Ambient-Rated Silicon Rectifier Diode for Type 2CZ312
  • QC 750108/ CN 0007-1992 Detail Specification for Electronic Components Ambient-Rated Silicon Rectifier Diode for Type 2CZ313
  • QC 750108/ CN 0005-1992 Detail Specification for Electronic Components Ambient-Rated Silicon Rectifier Diode for Type 2CZ308
  • QC 750108/ CN 0009-1992 Detail Specification for Electronic Components Ambient- Rated Silicon Rectifier Diode for Type 2CZ318
  • PQC 75-1991 Semiconductor Devices - Discrete Devices - Rectifier Diodes Blank Detail Specification: Rectifier Diodes (Including Avalanche Rectifier Diodes)@ Ambient and Case-Rated@ Greater Than 100 A
  • QC 750108/ CN 0002-1991 Detail Specification for Electronic Components Ambient- Rated Silicon Rectifier Diode for Type 2CZ321 Assessment Level II
  • QC 750108/ CN 0003-1991 Detail Specification for Electronic Components Ambient- Rated Silicon Rectifier Diode for Type 2CZ322 Assessment Level II
  • QC 750101/SU 0001-1990 Detail Specification for Electronic Components Signal Semiconductor Epitaxy- Planar Ambient-Rated Diodes for Pulse and Digital Circuits of Electronic Equipment Type KD5I0A
  • QC 750101/SU 0003-1990 Detail Specification for Electronic Components Signal Semiconductor Epitaxy- Planar Ambient-Rated Diodes for Pulse and Digital Circuits of Electronic Equipment Type KD522B
  • QC 750101/SU 0002-1990 Detail Specification for Electronic Components Signal Semiconductor Epitaxy-Planar Ambient- Rated Diodes for Pulse and Digital Circuits of Electronic Equipment Type KD52IA@ KD52IB
  • QC 750103/ CN 0001-1992 Detail Specification for Electronic Components Case-Rated Bipolar Transistors for Low-Frequency Amplification Type 3DD870
  • QC 750102/ SU 0001-1990 Detail Specification for Electronic Components High- Frequency Epitaxy-Planar Ambient-Rated Bipolar Transistors Type KT3II7A
  • QC 750103-1989 Semiconductor Devices Discrete Devices Part 7: Bipolar Transistors Section Two - Blank Detail Specification for Case-Rated Bipolar Transistors for Low- Frequency Amplification (IEC 747-7-2 ED 1)
  • QC 750102/CN 0001-1988 Detail Specification for Electronic Components Bipolar Transistors for Ambient-Rated High- Frequency Amplification of Type 3DG130 Assessment Level II
  • QC 750102/CN 0003-1990 Detail Specification for Electronic Components Bipolar Transistors for Ambient-Rated High- Frequency Amplification of Type 3DG1815 Assessment Level II

Professional Standard - Electron, Rated photodiode

  • SJ/T 2216-2015 Technical specification for photodiode of silicon
  • SJ/T 10055-1991 Detail specification for electronic components--Case rated silicon rectifier diode,Type 2CZ58
  • SJ/T 10054-1991 Detail specification for electronic components--Case rated silicon rectifier diode for Type 2CZ57
  • SJ/T 10056-1991 Detail specification for electronic components--Case rated silicon rectifier diode,Type 2CZ59
  • SJ/T 10057-1991 Detail specification for electronic components--Case rated silicon rectifier diode,Type 2CZ60
  • SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
  • SJ/T 10058-1991 Detail specification for electronic components.Ambient-rated silicon rectifier diode for type 2CZ103
  • SJ/T 10060-1991 Detail specification for electronic components.Ambient-rated silicon rectifier diode for type 2CZ117
  • SJ/T 10059-1991 Detail specification for electronic components.Ambient-rated silicon rectifier diode for type 2CZ116
  • SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD
  • SJ/T 2354-2015/0352 Measuring methods for photodiodes of PIN、APD
  • SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes
  • SJ 2354.5-1983 Method of measurement for capacitance of PIN and avalanche photodiodes
  • SJ 50033/102-1995 Detail specification for InGaAs/InP PIN photodiode for type GD 218
  • SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors
  • SJ 50033/112-1996 Scmiconductor optoelectronic devices.Detail specification for type GD3251Y photodiodes
  • SJ 50033/113-1996 Semiconductor optoelectronic devices.Detail specification for type GD3252Y photodiodes
  • SJ 2354.3-1983 Method of measurement for dark current of PIN and avalanche photodiodes
  • SJ 20644.1-2001 Semiconductor optoelectronic devices Detail specification for type GD3550Y PIN photodiode
  • SJ 20644.2-2001 Semiconductor optoelectronic devices Detail specification for type GD101 PIN photodiode
  • SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix
  • SJ 2354.6-1983 Method of measurement for responsivity of PIN and avalanche photodiodes
  • SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes
  • SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes
  • SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes
  • SJ/T 10952-1996 Detailed specifications for electronic components - 2CZ323 ambient-rated silicon rectifier diodes (Applicable for certification)
  • SJ/T 10950-1996 Detailed specifications for electronic components - 2CZ322 ambient-rated silicon rectifier diodes (Applicable for certification)
  • SJ/T 10951-1996 Detailed specifications for electronic components - 2CZ33 ambient-rated silicon rectifier diodes (Applicable for certification)
  • SJ/T 10953-1996 Detailed specifications for electronic components - 2CZ324Q ambient-rated silicon rectifier diodes (Applicable for certification)
  • SJ/T 10949-1996 Detailed specifications for electronic components - 2CZ321 ambient-rated silicon rectifier diodes (Applicable for certification)
  • SJ/T 11403-2009 Laser diode modules used for telecommunication.Reliability assessment
  • SJ 2354.4-1983 Method of measurement for forward voltage drop of PIN and avalanche photodiodes
  • SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes
  • SJ 50033/136-1997 Semiconductor optoelectronic devices.Detail specification for red light emitting diode for type GF116
  • SJ 50033/143-1999 Semiconductor optoelectronic devices.Detail specification for type GF1120 red emitting diode
  • SJ 50033/137-1997 Semiconductor optoelectronic devices.Detail specification for orange-red light emitting diode for type GF216
  • SJ 50033/139-1998 Semiconductor optoelectronic devices.Detail specification for green light-emitting diode for type GF4111
  • SJ 50033/138-1998 Semiconductor optoelectronic devices.Detail specification for yellow light-emitting diode for type GF318
  • SJ 50033/58-1995 Semiconductor optoelectronic device Detail specification for green light emitting diode for type GF413
  • SJ/T 11393-2009 Semiconductor optoelectronic devices-Blank detail specification for power light-emitting diodes
  • SJ 50033/142-1999 Semiconductor optoelectronic devices.Detail specification for type GF4112 green emitting diode
  • SJ 50033/57-1995 Semiconductor optoelectronic device Detail specification for red light emitting diode for type GF115
  • SJ/Z 9171-1995 Specifications for determination of φ3mm green LEDs used for VCR
  • SJ 2354.14-1983 Method of measurement for excess noise factor of PIN and avalanche photodiodes
  • SJ 2215.6-1982 Method of measurement for junction capacitance of semiconductor photocouplers (diodes)
  • SJ/T 11866-2022 Semiconductor optoelectronic devices - Detailed specifications for silicon substrate white light power light emitting diodes
  • SJ/T 11400-2009 Semiconductor optoeletronic devices-Blank detail specification for lower-power light-emitting diodes
  • SJ 2138-1982 Methods of measurement for regulated current of silicon current regulator diodes
  • SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix
  • SJ 2215.3-1982 Method of measurement for forward current of semiconductor photocouplers (diodes)
  • SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes
  • SJ 2215.4-1982 Method of measurement for reverse current of semiconductor photocouplers (diodes)
  • SJ 2354.9-1983 Method of measurement for noise equivalent power of PIN and avalanche photodiodes
  • SJ 50033/99-1995 Semiconductor optoelectronic devices.Detail specification for o/G double colour light emitting diode for type GF511
  • SJ 20642.7-2000 Semiconductor opto-electronic devices Detail specification for type GR1325J light emitting diode module
  • SJ/T 11817-2022 Blank detailed specification for light-emitting diodes for semiconductor optoelectronic devices, filament lamps
  • SJ 2354.7-1983 Method of measurement for spectral response curve and spectral response range of PIN and avalanche photodiodes
  • SJ 2354.12-1983 Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes
  • SJ 50033/109-1996 Semiconductor optoelectronic devices.Detail specification for types GJ9031T and GJ9032T and GJ9034T semiconductor laser diodes
  • SJ 2354.8-1983 Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes
  • SJ 50033/110-1996 Semiconductor optoelectronic devices.Detail specification for type GR9413 infrared light emitting diode
  • SJ 2215.5-1982 Method of measurement for reverse breakdown voltage of semiconductor photocouplers (diodes)
  • SJ 53930/1-2002 Semiconductor optoelectronic devices Detail specification for type GR8813 infrared emitting diode
  • SJ 2658.4-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for capacitance
  • SJ 2672.7-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA307
  • SJ/T 10947-1996 Detailed specifications for electronic components - FG341052 and FG343053 semiconductor green light emitting diodes
  • SJ 2658.3-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage
  • SJ 2672.2-1986 Detail specification for electronic components--Case-rated 175Mhz low voltage bipolar power transistors,Type 3DA302
  • SJ 2672.3-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA303
  • SJ 2672.4-1986 Detail specification for electronic components--Case-rated 175MHz low voltag bipolar power transistors,Type 3DA304
  • SJ 2672.5-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA305
  • SJ 2672.6-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA306
  • SJ 2672.8-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA308
  • SJ 2672.9-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA309
  • SJ 2673.1-1986 Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors,Type 3DA311
  • SJ 2673.2-1986 Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors,Type 3DA312
  • SJ 2673.3-1986 Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors,Type 3DA313
  • SJ 2673.4-1986 Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors,Type 3DA314
  • SJ 2673.5-1986 Detail specification for electronic components--Case-rated 470MHz low voltage bipolar power transistors,Type 3DA315
  • SJ 2673.6-1986 Detail specification for electronic components--Case-rated 470MHz low voltage bipolar transistors,Type 3DA316
  • SJ 2672.1-1986 Detail specification for electronic components--Case-rated 175MHz low voltage bipolar power transistors,Type 3DA301
  • SJ/T 2658.16-2016 Measuring method for semiconductor infrared-emitting diode.Part 16: Photo-electric conversion efficiency
  • SJ/T 10948-1996 Detailed specifications for electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes
  • SJ 3124-1988 Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification,Type 3DD1942
  • SJ 3125-1988 Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification,Type 3DD2027
  • SJ 3126-1988 Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification,Type 3DD869
  • SJ 3127-1988 Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification,Type 3DD871
  • SJ 3128-1988 Detail specification for electronic components--Case-rated bipolar transistors for silicon NPN low frequency amplification,Type 3DD820
  • SJ 3123-1988 Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG1779
  • SJ 2658.5-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for forward series resistance
  • SJ/T 10049-1991 Detail specification for electronic components.Case rated bipolar transistor for silicon NPN high-frequency amplification for type 3DA1162
  • SJ/T 10050-1991 Detail specification for electronic components.Case rated bipolar transistor for silicon NPN high-frequency amplification for type 3DA1722
  • SJ/T 10051-1991 Detail specification for electronic components.Case rated bipolar transistor for silicon NPN high-frequency amplification for type 3DA 2688
  • SJ/T 10052-1991 Detail specification for electronic components.Case rated bipolar transistor for silicon PNP low-frequency amplification for type 3CD 507
  • SJ 3120-1988 Detail specification for electronic component--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG1215
  • SJ 3121-1988 Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG2464
  • SJ 3122-1988 Detail specification for electronic components--Ambient-rated bipolar transistors for high frequency amplification,Type 3DG3177
  • SJ/T 10959-1996 Detailed specifications for electronic components - 3CT320 case-rated avalanche triode thyristors (Applicable for certification)
  • SJ/T 10053-1991 Detail specification for electronic components.Case rated bipolar transistor for silicon NPN low-frequency amplification for type 3DD 313
  • SJ/T 10886-1996 Detailed specifications for electronic components - 3DD201 bipolar transistors for low frequency amplification case (Applicable for certification)
  • SJ/T 10885-1996 Detailed specifications for electronic components -3DA150B and 3DA150C bipolar transistors for high frequency amplification case (Applicable for certification)
  • SJ/T 10958-1996 Detailed specifications for electronic components - 3CT320 case-rated reverse blocking triode thyristors (Applicable for certification)
  • SJ/T 10887-1996 Detailed specifications for electronic components -3DD102B bipolar transistors for low frequency amplification case (Applicable for certification)
  • SJ/T 10973-1996 Detailed specifications for electronic components - 3DD200 bipolar transistors for silicon NPN low frequency amplification case (Applicable for certification)
  • SJ/T 10955-1996 Detailed specifications for electronic components - 3DG107 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 11052-1996 Detailed specifications for electronic components - 3DG162 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 11054-1996 Detailed specifications for electronic components - 3DG140 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 11053-1996 Detailed specifications for electronic components - 3DG182 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 11060-1996 Detailed specifications for electronic components - 3DG3130 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 10833-1996 Detailed specifications for electronic components - 3DG80 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 10772-1996 Detailed specifications for electronic components - 3DG201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
  • SJ/T 10837-1996 Detailed specifications for electronic components -3DG131A, 3DG131B and 3DG131C ambient-rated bipolar transistors for high frequency amplification (Applicable for certification)
  • SJ/T 10770-1996 Detailed specifications for electronic components - 3DG130A-3DG130D ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

CZ-CSN, Rated photodiode

  • CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
  • CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
  • CSN IEC 747-2-1:1993 Semiconductor devices. Diskrete devices. Part 2: Rectifier diodes. Section 1 - Blank detail specification for rectifier diodes (including avalanche diodes), ambient and case-rated, up to 100A
  • CSN 35 8585 Cast.3-1987 Color television picture tubes. Measuring methods of white light screen luminance and determination of ratio of anodě currents at white light

Professional Standard - Post and Telecommunication, Rated photodiode

邮电部, Rated photodiode

IN-BIS, Rated photodiode

工业和信息化部, Rated photodiode

  • SJ/T 11461.2-2016 Organic Light Emitting Diode Display Devices Part 2: Basic Ratings and Characteristics

Group Standards of the People's Republic of China, Rated photodiode

  • T/COEMA 004LCD-2022 Polarizer film for the Organic Light-Emitting Diode TV Display
  • T/CVIA 59-2016 Organic Light Emitting Diode (OLED) TV Measurement Methods
  • T/CVIA 11-2016 Organic Light Emitting Diode (OLED) TV Measurement Methods
  • T/CVIA 58-2016 General Technical Requirements for Organic Light Emitting Diode (OLED) TVs
  • T/CVIA 10-2016 General Technical Requirements for Organic Light Emitting Diode (OLED) TVs
  • T/CSA 048-2019 Measurement of Electrical and Photometric Characteristics for General Lighting LEDs under Different Currents / Temperatures

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Rated photodiode

  • GB/T 16894-1997 Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A
  • GB/T 23729-2009 Photodiodes for scintillation detectors.Test procedures
  • GB/T 6351-1998 Semiconductor devices--Discrete devices. Part 2: Rectifier diodes. Section One--Blank detail specification for rectifier diodes(including avalanche rectifier diodes), ambient and case-rated, up to 100A
  • GB/T 15651.6-2023 Semiconductor Devices Part 5-6: Optoelectronic Devices Light Emitting Diodes
  • GB/T 42243-2022 General technical specification for organic light emitting diode(OLED) television
  • GB/T 36359-2018 Semiconductor optoelectronic devices.Blank detail specification for lower power light-emitting diodes
  • GB/T 36360-2018 Semiconductor optoelectronic devices.Blank detail specification for middle power light-emitting diodes
  • GB/T 20871.61-2013 Organic light emitting diode (OLED) displays.Part 6-1:Measuring methods of optical and electro-optical parameters
  • GB/T 18904.3-2002 Semiconductor devices--Part 12-3: Optoelectronic devices--Blank detail specification for light-emitting diodes--Display application
  • GB 9520-1988 Detail specification for electronic components 3DD200 type silicon NPN low frequency amplifying case rated bipolar transistors (available for certification)
  • GB/T 18904.5-2003 Semiconductor devices Part 12-5: Optoelectronic devices Blank detail specification for pin-photodiodeswith/without pigtail for fibre optic systems or subsystems
  • GB/T 6590-1998 Semiconductor devices Discrete devices Part 6: Thyristors Section Two-Blank detail specification for bidirectional triode thyristors(triacs),ambient or case-rated,up to 100A
  • GB/T 13150-2005 Semiconductor devices-Discrete devices-Blank detail specification for bidirectional triode thyristors(triacs),ambient and case-rated,for currents greater than 100A
  • GB/T 18904.2-2002 Semiconductor devices-Part 12-2: Optoelectronic devices-Blank detail specification for laser diodes modules with pigtail for fiber optic systems or sub-systems

PT-IPQ, Rated photodiode

NEMA - National Electrical Manufacturers Association, Rated photodiode

  • NEMA C78.51-2016 Electric Lamps - LED (Light Emitting Diode) Lamps - Method of Designation
  • NEMA C78.52-2017 Electric Lamps - LED (Light Emitting Diode) Direct Replacement Lamps - Method of Designation

RO-ASRO, Rated photodiode

  • STAS 12258/2-1984 Optoelectronic semiconductor devices PIIOTODIODES Terminology and essentia] characteristics
  • STAS 12258/4-1986 Optoelectronic semiconductor devices LIGHT EMITTING DIODES Terminology and main characteristics
  • STAS 12258/6-1987 OPTOELECTRONIC SEMICON- DUCTOR DEVICES INFRARED EMM1TING DIODES Terminology and essential characteristics

PL-PKN, Rated photodiode

TH-TISI, Rated photodiode

  • TIS 1596-1999 Semiconductor devices.discrete devices.part 2: rectifier diodes section 2: blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 a

Defense Logistics Agency, Rated photodiode

国家市场监督管理总局、中国国家标准化管理委员会, Rated photodiode

  • GB/T 36358-2018 Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
  • GB/T 37946-2019 Test method of thermal stability of materials for organic light emitting diode display (OLED)
  • GB/T 37949-2019 Purity test method of small molecule materials applied in organic light emitting diode display (OLED)—High performance liquid chromatography (HPLC)

IEC - International Electrotechnical Commission, Rated photodiode

  • TS 62916-2017 Photovoltaic modules – Bypass diode electrostatic discharge susceptibility testing (Edition 1.0)

American Society for Testing and Materials (ASTM), Rated photodiode

  • ASTM C1307-21 Standard Test Method for Plutonium Assay by Plutonium (III) Diode Array Spectrophotometry
  • ASTM C1307-15 Standard Test Method for Plutonium Assay by Plutonium (III) Diode Array Spectrophotometry
  • ASTM D7904-15 Standard Test Method for Determination of Water Vapor (Moisture Concentration) in Natural Gas by Tunable Diode Laser Spectroscopy (TDLAS)
  • ASTM D7904-21 Standard Test Method for Determination of Water Vapor (Moisture Concentration) in Natural Gas by Tunable Diode Laser Spectroscopy (TDLAS)
  • ASTM F3095-17 Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
  • ASTM D8488-22 Standard Test Method for Determination of Hydrogen Sulfide (H2S) in Natural Gas by Tunable Diode Laser Spectroscopy (TDLAS)
  • ASTM F3095-14 Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
  • ASTM F3095-17a Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
  • ASTM F3095-17a(2022) Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System

未注明发布机构, Rated photodiode

  • BS EN 150008:1993(1999) Specification for Harmonized system of quality assessment for electronic components — Blank detail specification — Ambient - rated rectifier diodes
  • BS EN 150009:1993(2000) Specification for Harmonized system of quality assessment for electronic components — Blank detail specification — Case - rated rectifier diodes
  • BS EN 120008:1995(2000) Specification for Harmonized system of quality assessment for electronic components — Blank detail specification — Light emitting diodes and infrared emitting diodes for fibre optic system or sub - system
  • BS EN 120006:1993(1999) Specification for Harmonized system of quality assessment for electronic components — Blank detail specification — Pin - photodiodes for fibre optic applications

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Rated photodiode

  • GB/T 33762-2017 Method of measurement for display performance of organic light-emitting diode(OLED) television

GB-REG, Rated photodiode

  • REG NASA-LLIS-1840--2006 Lessons Learned - CALIPSO Avalanche Photodiode (APD) Detector Assembly Electrical Failure
  • REG NASA-LLIS-0989-2001 Lessons Learned ?ETU Laser Diode Pump Array Failure - Indium gasket short between contacts caused electrical failure

KR-KS, Rated photodiode

  • KS C IEC 62341-6-1-2020 Organic light emitting diode(OLED) displays — Part 6-1: Measuring methods of optical and electro-optical parameters
  • KS C IEC 62504-2020 General lighting — Light emitting diode(LED) products and related equipment — Terms and definitions
  • KS C IEC TS 62972-2018 General lighting — Organic light emitting diode (OLED) products and related equipment — Terms and definitions

National Electrical Manufacturers Association(NEMA), Rated photodiode

  • NEMA C78.374-2015 Electric Lamps - Light-Emitting Diode Package Specification Sheet for General Illumination Applications

Danish Standards Foundation, Rated photodiode

  • DS/EN 62341-6-1:2011 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • DS/IEC 747-2-1:1990 Semiconductor devices. Discrete devices. Part 2: Rectifier diodes. Section one: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A

European Committee for Electrotechnical Standardization(CENELEC), Rated photodiode

  • EN 62341-6-1:2011 Organic light emitting diode (OLED) displays - Part 6-1: Measuring methods of optical and electro-optical parameters
  • EN 62504:2014 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
  • EN IEC 62149-12:2023 Fibre optic active components and devices - Performance standards - Part 12: Distributed feedback laser diode device for analogue radio over fibre systems

GOSTR, Rated photodiode

  • GOST IEC 62341-6-1-2016 Organic light emitting diode (OLED) displays. Part 6-1. Measuring methods of optical and electro-optical parameters
  • GOST R 58229-2018 Organic light emitting diodes for general lighting and related equipment. Terms and definitions

International Organization for Standardization (ISO), Rated photodiode

  • ISO/FDIS 2612:2023 Analysis of natural gas — Biomethane — Determination of ammonia content by tuneable diode laser absorption spectroscopy
  • ISO/DIS 2612 Analysis of natural gas — Biomethane — Determination of ammonia content by Tuneable Diode Laser Absorption Spectroscopy

AENOR, Rated photodiode

  • UNE-EN 62504:2015 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions

Military Standard of the People's Republic of China-General Armament Department, Rated photodiode

  • GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode

Taiwan Provincial Standard of the People's Republic of China, Rated photodiode

  • CNS 13780-1996 Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test
  • CNS 13090-1992 Method of Endurance Test for Light Emitting Diode Big Lamps (for Outdoor Display)-Continuouus Applying Current Test

International Commission on Illumination (CIE), Rated photodiode

  • CIE S 017-SP1/E-2015 ILV: International Lighting Vocabulary - Supplement 1: Light Emitting Diodes (LEDs) and LED Assemblies - Terms and Definitions

HU-MSZT, Rated photodiode

European Committee for Standardization (CEN), Rated photodiode

  • prEN ISO 2612 Analysis of natural gas - Biomethane - Determination of ammonia content by Tuneable Diode Laser Absorption Spectroscopy (ISO/DIS 2612:2023)

American National Standards Institute (ANSI), Rated photodiode

  • BS EN IEC 60700-3:2022 Thyristor valves for high voltage direct current (HVDC) power transmission Essential ratings (limiting values) and characteristics (British Standard)

Institute of Electrical and Electronics Engineers (IEEE), Rated photodiode

  • IEEE 1789-2015 Recommended Practices for Modulating Current in High-Brightness LEDs for Mitigating Health Risks to Viewers




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