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Polycrystalline vs Single Crystal

Polycrystalline vs Single Crystal, Total:500 items.

In the international standard classification, Polycrystalline vs Single Crystal involves: Iron and steel products, Semiconducting materials, Non-ferrous metals, Construction materials, Optical equipment, Industrial furnaces, Piezoelectric and dielectric devices, Paper and board, Insulating fluids, Vocabularies, Installations in buildings, Testing of metals, Semiconductor devices, Products of non-ferrous metals, Energy and heat transfer engineering in general, Optics and optical measurements, Optoelectronics. Laser equipment, Magnetic materials, Refractories, Solar energy engineering, Chipless working equipment, Galvanic cells and batteries, Inorganic chemicals, Ceramics, Components and accessories for telecommunications equipment, Components for electrical equipment, Non-destructive testing, Cutting tools, Electronic display devices, Medical equipment, Air quality, Electricity. Magnetism. Electrical and magnetic measurements, Insulating materials, Materials for the reinforcement of composites, Company organization and management, Products of the chemical industry, Machine tools, Powder metallurgy, Occupational safety. Industrial hygiene, Test conditions and procedures in general, Terminology (principles and coordination), Fibre optic communications, Analytical chemistry, Rotating machinery, Education, Nuclear energy engineering, Water quality, Farming and forestry, Electric filters, Rectifiers. Convertors. Stabilized power supply, Integrated circuits. Microelectronics, Particle size analysis. Sieving, Electromechanical components for electronic and telecommunications equipment, Environmental protection, Lamps and related equipment, GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION, Wastes.


General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Polycrystalline vs Single Crystal

国家市场监督管理总局、中国国家标准化管理委员会, Polycrystalline vs Single Crystal

  • GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
  • GB/T 36706-2018 Polycrystalline indium phosphide
  • GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
  • GB/T 20230-2022 Indium phosphide single crystal
  • GB/T 20229-2022 Gallium phosphide single crystal
  • GB/T 20228-2021 Gallium arsenide single crystal
  • GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals
  • GB/T 12964-2018 Monocrystalline silicon polished wafers
  • GB/T 26069-2022 Annealed monocrystalline silicon wafers
  • GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
  • GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys—Part 3： AC magnetic properties of Fe-based amorphous strip using a single sheet specimen
  • GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
  • GB/T 38907-2020 Water saving enterprises—Polysilicon industry
  • GB/T 25076-2018 Monocrystalline silicon for solar cell
  • GB/T 36648-2018 Specification for TFT liquid crystal monomers
  • GB/T 41325-2022 Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
  • GB/T 18910.201-2021 Liquid crystal display devices—Part 20-1: Visual inspection—Monochrome liquid crystal display cells
  • GB/T 36647-2018 Specification for liquid crystal monomers
  • GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers
  • GB/T 26071-2018 Monocrystalline silicon wafers for solar cells
  • GB/T 29054-2019 Casting multicrystalline silicon brick for photovoltaic solar cell
  • GB/T 37418-2019 Lutetium oxyorthosilicate, lutetium-yttrium oxyorthosilicate scintillation single crystals
  • GB/T 18910.202-2021 Liquid crystal display devices—Part 20-2: Visual inspection—Monochrome matrix liquid crystal display modules
  • GB/T 4059-2018 Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere
  • GB/T 4060-2018 Test method for boron content in polycrystalline silicon by vacuum zone-melting method
  • GB/T 18916.47-2020 Norm of water intake—Part 47: Polysilicon production
  • GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
  • GB/T 5252-2020 Test method for dislocation density of monocrystal germanium

Group Standards of the People's Republic of China, Polycrystalline vs Single Crystal

Korean Agency for Technology and Standards (KATS), Polycrystalline vs Single Crystal

  • KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS D 2715-2006(2011) Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS C 7110-2007(2017) Liquid crystal display devices－Measurement methods of backlight unit for liquid crystal displays
  • KS B 3620-2012 Polycrystalline diamond dies for wire drawing
  • KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors
  • KS C 7110-2007(2022) Liquid crystal display devices－Measurement methods of backlight unit for liquid crystal displays
  • KS C IEC 61747-3-2002(2017) Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells
  • KS C IEC 60119-2014(2019) Recommendations for polycrystalline semiconductor rectifier stacks and equipments
  • KS C IEC 61747-3-2002(2022) Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells
  • KS C IEC 61747-20-1-2015(2020) LIQUID CRYSTAL DISPLAY DEVICES ― Part 20-3: Visual inspection ― Monochrome LCD display cells (excluding all active matrix liquid crystal cells)
  • KS C IEC 61747-20-1:2015 LIQUID CRYSTAL DISPLAY DEVICES ― Part 20-3: Visual inspection ― Monochrome LCD display cells (excluding all active matrix liquid crystal cells)
  • KS D 0070-2002 Method of test for magnetic properties of amorphous metals using single sheet specimen
  • KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
  • KS C IEC 61747-3-1-2002(2017) Liquid crystal and solid-state display devices - Part 3-1 : Liquid crystal display(LCD) cells - Blank detail specification
  • KS C IEC 61747-3-1-2002(2022) Liquid crystal and solid-state display devices - Part 3-1 : Liquid crystal display(LCD) cells - Blank detail specification

CZ-CSN, Polycrystalline vs Single Crystal

UNKNOWN, Polycrystalline vs Single Crystal

Professional Standard - Machinery, Polycrystalline vs Single Crystal

Hebei Provincial Standard of the People's Republic of China, Polycrystalline vs Single Crystal

Professional Standard - Light Industry, Polycrystalline vs Single Crystal

轻工业部, Polycrystalline vs Single Crystal

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Polycrystalline vs Single Crystal

Professional Standard - Electron, Polycrystalline vs Single Crystal

  • SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
  • SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
  • SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
  • SJ/Z 2655-1986 Collection of single crystal Germaninm defects
  • SJ 20607-1996 Specificatiion for molybdenate crystal
  • SJ 20444-1994 Specification for Lithium Niobate singlecrystal
  • SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
  • SJ 3243-1989 Indium phosphide single-crystal bar and wafers
  • SJ/T 10173-1991 TDA75 single crystalline silicon solar cell
  • SJ 20606-1996 Specification for tellurium dioxide single crystal
  • SJ/T 10333-1993 Methods of measurement for uni-junction transistors
  • SJ/T 11450-2013 Single Crystal Furnace Energy Consumption Specifications
  • SJ/T 11854-2022 Czochralski monocrystalline silicon furnace for photovoltaic
  • SJ 2268-1983 Series of gyromagnetic multi-crystal materials made of magnetic oxides
  • SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
  • SJ/T 11505-2015 Sapphire single crystal polished wafers specification
  • SJ/T 11853-2022 Positive pressure suspended zone melting single crystal silicon furnace
  • SJ 2572-1985 Silicon monocrystalline rods and sheets for solar cells
  • SJ/T 11864-2022 Semi-insulating silicon carbide single crystal substrate
  • SJ 3245-1989 Methods for measuring dislocation of Indium phosphide single-crystal
  • SJ 2592-1985 Quartz crystal monolithic filters for Type LSP10.7MA(～E)
  • SJ 20641-1997 Specification for indium antimonide single crystals for used in infrared detector

Defense Logistics Agency, Polycrystalline vs Single Crystal

工业和信息化部, Polycrystalline vs Single Crystal

  • YS/T 724-2016 Silicon powder for polycrystalline silicon
  • YS/T 1359-2020 Lithium tantalate polycrystalline powder
  • YS/T 1195-2017 Silicon tetrachloride, a by-product of polysilicon
  • JC/T 2417-2017 Lithium tetraborate piezoelectric single crystal material
  • YS/T 1182-2016 Germanium single crystal safety production specifications
  • SJ/T 2268-2018 Gyromagnetic polycrystalline ferrite material series
  • YS/T 1500-2021 Polycrystalline silicon prepares silver plate for furnace lining
  • YS/T 1590-2022 Polycrystalline silicon industry green factory evaluation requirements
  • YB/T 4589-2017 Carbon/carbon composite materials for single crystal furnace insulation
  • XB/T 520-2021 Cerium-doped Gadolinium Gallium Aluminum Garnet Polycrystalline Scintillator
  • YB/T 4587-2017 Carbon/carbon composite heating element for single crystal furnace

Professional Standard - Non-ferrous Metal, Polycrystalline vs Single Crystal

  • YS/T 554-2007 Lithium niobate single crystals
  • YS/T 42-2010 Lithium tantalate single crystals
  • YS/T 554-2006 Lithium niobate single crystal
  • YS/T 1167-2016 Monocrystalline silicon etched wafers
  • YS/T 1061-2015 Silicon core for polysilicon by improved siemens method
  • YS 783-2012 The norm of energy consumption per unit product of infrared germanium single crystal
  • YS/T 978-2014 Carbon/carbon composites guide shield of single crystal furnace
  • YS/T 977-2014 Carbon/carbon composites heat insulation cylinder of single crystal furnace
  • YS/T 792-2012 Carbon-carbon composites crucible used in single crystal furnace

German Institute for Standardization, Polycrystalline vs Single Crystal

  • DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
  • DIN EN IEC 60122-4:2019-10 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019); German version EN IEC 60122-4:2019
  • DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
  • DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
  • DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
  • DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
  • DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
  • DIN EN 60444-9:2007-12 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
  • DIN EN 62276:2017-08 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016 / Note: DIN EN 62276 (2013-08) remains valid alongside this standard until 2019-11-28.
  • DIN EN IEC 62276:2023-05 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English / Note: Date of issue 2023-04-28*Intended as replacement for DIN EN 62276 (2017-08).
  • DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
  • DIN EN 120007:1993-06 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
  • DIN EN 120007:1993 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
  • DIN EN 60444-8:2017-11 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017 / Note: DIN EN 60444-8 (2004-03) remains valid alongside this standard until 2020-01-19.
  • DIN IEC 60122-2:1993-09 Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; identical with IEC 60122-2:1983
  • DIN ISO 16463:2005 Polycrystalline diamond inserts, tipped - Dimensions, types (ISO 16463:2004);English version of DIN ISO 16463:2005
  • DIN EN 60444-7:2004-11 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
  • DIN EN 1330-11:2007-09 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
  • DIN EN 61747-4:2013-07 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics (IEC 61747-4:2012); German version EN 61747-4:2012 / Note: DIN EN 61747-4 (1999-07) remains valid alongside this standard until 20...

RU-GOST R, Polycrystalline vs Single Crystal

  • GOST 19658-1981 Monocrystalline silicon in ingots. Specifications
  • GOST 16153-1980 Monocrystalline germanium. Specifications
  • GOST R IEC 61747-20-1-2017 Liquid crystal display devices. Part 20-1. Visual inspection. Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells)
  • GOST R IEC 61747-3-2017 Liquid crystal display devices. Part 3. Liquid crystal display (LCD) cells. Sectional specification

Japanese Industrial Standards Committee (JISC), Polycrystalline vs Single Crystal

  • JIS B 4133:1983 Polycrystalline diamond dies for wire drawing
  • JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods
  • JIS C 7311:1980 Reliability assured TTL, positive nand gates, integrated circuits

Yunnan Provincial Standard of the People's Republic of China, Polycrystalline vs Single Crystal

Military Standard of the People's Republic of China-General Armament Department, Polycrystalline vs Single Crystal

  • GJB 582-1988 Polycrystalline magnesium fluoride for lenses
  • GJB 3076A-2021 Gallium Phosphide Single Chip Specification
  • GJB 3076-1997 Gallium Phosphide Single Chip Specification
  • GJB 2917A-2018 Indium Phosphide Single Wafer Specification
  • GJB 2917A-2004 Indium Phosphide Single Wafer Specification
  • GJB 2917-1997 Indium Phosphide Single Wafer Specification
  • GJB 582A-2020 Specification for polycrystalline magnesium fluoride for lenses
  • GJB 1926-1994 Gallium Arsenide Single Crystal Material Specification
  • GJB 10342-2021 Specification for polished indium antimonide single crystal wafers
  • GJB 10343-2021 Specification for polished gallium antimonide single crystal wafers
  • GJB 393-1987 Polycrystalline magnesium fluoride hood for air-to-air missiles
  • GJB 1927A-2021 Gallium arsenide single crystal material testing method
  • GJB 1927-1994 Gallium arsenide single crystal material testing method
  • GJB 393B-2015 Specification for polycrystalline magnesium fluoride fairings for missiles
  • GJB 393A-1995 Specification for polycrystalline magnesium fluoride fairings for missiles
  • GJB 9804-2020 Specification for molybdenum-niobium alloy single crystal rods for nuclear use
  • GJB 8715-2015 Specification for hot-pressed polycrystalline magnesium fluoride flat sheets for missile applications
  • GJB 1431-1992 General specifications for monocrystalline silicon solar cells for space use
  • GJB 395-1987 Single crystal magnesium fluoride for air-to-air missile modulation plate
  • GJB 8714-2015 Specification for polycrystalline zinc sulfide fairing materials for missiles

ES-UNE, Polycrystalline vs Single Crystal

  • UNE-EN 168100:1993 SS: QUARTZ CRYSTAL UNITS. (Endorsed by AENOR in November of 1996.)
  • UNE-EN 120007:1992 BDS: LIQUID CRISTAL DISPLAYS. MONOCHROME LCDS WITHOUT ELECTRONIC CIRCUIT. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 168200/A1:1993 SS: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in September of 1996.)
  • UNE-EN 168200:1993 SS: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in September of 1996.)
  • UNE-EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
  • UNE-EN 61747-3:2006 Liquid crystal display devices -- Part 3: Liquid crystal diplay (LCD) cells - Sectional specification (IEC 61747-3:2006). (Endorsed by AENOR in January of 2007.)
  • UNE-EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007). (Endorsed by AENOR in August of 2007.)
  • UNE-EN 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics (Endorsed by AENOR in February of 2013.)

Jiangxi Provincial Standard of the People's Republic of China, Polycrystalline vs Single Crystal

  • DB36/ 652-2012 The norm of energy consumption per unit product of polysilicon
  • DB36/ 771-2013 Energy consumption quota per unit product of Czochralski monocrystalline silicon

HU-MSZT, Polycrystalline vs Single Crystal

British Standards Institution (BSI), Polycrystalline vs Single Crystal

  • BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
  • BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
  • BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
  • BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
  • 13/30276532 DC BS EN 61747-20-1. Liquid crystal display devices. Part 20-1. Visual inspection. Monochrome liquid crystal display cells (Excluding all active matrix liquid crystal display cells)
  • BS EN 61747-2-1:1998 Liquid crystal and solid-state display devices. Passive matrix monochrome LCD modules. Blank detail specification
  • BS EN 61747-2-1:2013 Liquid crystal display devices. Passive matrix monochrome LCD modules. Blank detail specification
  • 14/30277702 DC BS EN 61747-3. Liquid crystal display devices. Part 3. Liquid crystal display (LCD) cells. Sectional specification
  • BS EN 62047-9:2011 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
  • BS EN 62047-9:2013 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
  • BS EN 61747-2-1:2001 Liquid crystal and solid-state display devices - Passive matrix monochrome LCD modules - Blank detail specification
  • 23/30468947 DC BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

IN-BIS, Polycrystalline vs Single Crystal

U.S. Military Regulations and Norms, Polycrystalline vs Single Crystal

Professional Standard - Medicine, Polycrystalline vs Single Crystal

  • YY 0290.9-2010 Ophthalmic implants.Intraocular lenses.Part 9 :Multifocal intraocular lenses

American National Standards Institute （ANSI), Polycrystalline vs Single Crystal

  • ANSI/ASTM D6058:2001 Practice for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment
  • ANSI/ASTM D6057:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Phase Contrast Microscopy

Association Francaise de Normalisation, Polycrystalline vs Single Crystal

  • NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
  • NF C26-400:1971 POLYCRYSTALLINE ALUMINA CERAMICS. METHODS OF TEST.
  • NF ISO 16463:2014 Plaquettes brasées en diamant polycristallin - Dimensions, types
  • NF EN 61747-3:2007 Dispositifs d'affichage à cristaux liquides - Partie 3 : cellules d'affichage à cristaux liquides (LCD) - Spécification intermédiaire
  • NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
  • NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
  • NF EN 1330-11:2007 Essais non destructifs - Terminologie - Partie 11 : diffraction des rayons X de matériaux polycristallins et amorphes
  • NF C93-616*NF EN 62276:2018 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
  • NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
  • NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
  • NF EN 61747-3-1:2006 Dispositifs d'affichage à cristaux liquides - Partie 3-1 : cellules d'affichage à cristaux liquides (LCD) - Spécification particulière cadre
  • NF E66-314:2004 Polycrystalline diamond inserts, tipped - Dimensions, types.
  • NF E66-314*NF ISO 16463:2014 Polycristalline diamond inserts, tipped - Dimensions, types
  • NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
  • NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
  • NF EN 61747-4:2013 Dispositifs d'affichage à cristaux liquides - Partie 4 : modules et cellules d'affichage à cristaux liquides - Valeurs limites et caractéristiques essentielles
  • NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.
  • NF C93-547-2-1*NF EN 61747-2-1:2013 Liquid crystal display devices - Part 2-1 : passive matrix monochrome LCD modules - Blank detail specification

IEC - International Electrotechnical Commission, Polycrystalline vs Single Crystal

  • IEC 61747-20-1:2015 Liquid crystal display devices - Part 20-1: Visual inspection - Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells) (Edition 1.0)
  • PAS 62276-2001 Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method (Edition 1.0)

CEN - European Committee for Standardization, Polycrystalline vs Single Crystal

  • EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

KR-KS, Polycrystalline vs Single Crystal

Danish Standards Foundation, Polycrystalline vs Single Crystal

  • DS/EN 61747-3:2007 Liquid crystal display devices -- Part 3: Liquid crystal display (LCD) cells - Sectional specification
  • DS/EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
  • DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
  • DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
  • DS/EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
  • DS/EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
  • DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
  • DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
  • DS/EN 61747-3-1:2007 Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification
  • DS/EN 61747-4:2013 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics

未注明发布机构, Polycrystalline vs Single Crystal

International Electrotechnical Commission (IEC), Polycrystalline vs Single Crystal

  • IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
  • IEC 61747-3:2015 Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
  • IEC 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification

ANSI - American National Standards Institute, Polycrystalline vs Single Crystal

  • Z80.12-2007 Ophthalmics - Multifocal Intraocular Lenses (VC)

Professional Standard - Building Materials, Polycrystalline vs Single Crystal

  • JC/T 2143-2012 Ceramic materials based on tetragonal zirconia
  • JC/T 1048-2007 Fused quartz crucibles for single crystal silicon growth
  • JC/T 1048-2018 Quartz crucible for single crystal silicon growth
  • JC/T 2025-2010 Lead magnesium niobate titanate (PMNT) piezoelectric single crystals
  • JC/T 2349-2015 Si<下标3>N<下标4> ceramic insulation components for polycrystalline silicon production
  • JC/T 2343-2015 Single crystal alumina tube prepared by edge-defined film-fed crystal growth
  • JC/T 2067-2011 Fused Silica ceramic crucible for solar poly-crystalline silicon crystal growth

Professional Standard - Aviation, Polycrystalline vs Single Crystal

  • HB 6742-1993 Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography
  • HB 7762-2005 Specification for master alloys of directionally solidified and single crystal superalloys for aeroengines

SE-SIS, Polycrystalline vs Single Crystal

National Metrological Verification Regulations of the People's Republic of China, Polycrystalline vs Single Crystal

Professional Standard - Ferrous Metallurgy, Polycrystalline vs Single Crystal

  • YB 1603-1983 Silicon single crystal cutting and grinding discs

机械电子工业部, Polycrystalline vs Single Crystal

  • JB 5203-1991 Single crystal corundum chemical analysis method

European Committee for Standardization (CEN), Polycrystalline vs Single Crystal

  • EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
  • EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
  • EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

International Organization for Standardization (ISO), Polycrystalline vs Single Crystal

  • ISO 11979-9:2006 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
  • ISO 11979-9:2006/Amd 1:2014 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses; Amendment 1
  • ISO 16463:2004 Polycristalline diamond inserts, tipped - Dimensions, types
  • ISO 16463:2014 Polycristalline diamond inserts, tipped - Dimensions, types
  • ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction

Lithuanian Standards Office , Polycrystalline vs Single Crystal

  • LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
  • LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
  • LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
  • LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
  • LST EN 61747-3-2007 Liquid crystal display devices - Part 3: Liquid crystal diplay (LCD) cells - Sectional specification (IEC 61747-3:2006)
  • LST EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006)
  • LST EN 120007-2001 Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit
  • LST EN 60444-9-2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007)
  • LST EN 62276-2006 Single crystal wafers for surface acoustic wave (SAW) device appplications. Specifications and measuring methods (IEC 62276:2005)
  • LST EN 62276-2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012)

AENOR, Polycrystalline vs Single Crystal

  • UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
  • UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
  • UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
  • UNE-EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006)
  • UNE-EN ISO 11979-9:2007/A1:2014 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006/Amd 1:2014)
  • UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycrystalline and amorphous materials

American Society for Testing and Materials (ASTM), Polycrystalline vs Single Crystal

  • ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
  • ASTM F1723-96 Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
  • ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
  • ASTM D6058-96(2011) Standard Practice for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment
  • ASTM D6058-96(2016) Standard Practice for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment
  • ASTM E1181-02(2015) Standard Test Methods for Characterizing Duplex Grain Sizes

Professional Standard - Education, Polycrystalline vs Single Crystal

  • JY/T 0587-2020 General Principles of Polycrystal X-ray Diffraction Methods
  • JY/T 009-1996 General Principles of Rotating Target Polycrystal X-ray Derivation Method

Association of German Mechanical Engineers, Polycrystalline vs Single Crystal

CENELEC - European Committee for Electrotechnical Standardization, Polycrystalline vs Single Crystal

  • EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

European Committee for Electrotechnical Standardization（CENELEC）, Polycrystalline vs Single Crystal

  • EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
  • EN 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics

IECQ - IEC: Quality Assessment System for Electronic Components, Polycrystalline vs Single Crystal

  • QC 720200-1998 Liquid Crystal and Solid State Display Devices - Part 3: Sectional Specification for Liquid Crystal Display (LCD) Cells

Inner Mongolia Provincial Standard of the People's Republic of China, Polycrystalline vs Single Crystal

  • DB15/T 2234-2021 Energy consumption quota per unit product of Czochralski monocrystalline silicon

ESDU - Engineering Sciences Data Unit, Polycrystalline vs Single Crystal

  • ESDU 81027 A-1982 Lattice structures. Part 1: mean fluid forces on single and multiple plane frames.

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Polycrystalline vs Single Crystal

  • GJB 6466-2008 Specification for hot-pressed polycrystalline magnesium fluoride plate for missiles
  • GJB 5907-2006 Specification for polycrystal zinc sulfide dome materials for missiles

National Metrological Technical Specifications of the People's Republic of China, Polycrystalline vs Single Crystal

  • JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

Shaanxi Provincial Standard of the People's Republic of China, Polycrystalline vs Single Crystal

  • DB61/T 512-2011 Inspection rules for monocrystalline silicon wafers for solar cells
  • DB61/T 511-2011 Inspection rules for monocrystalline silicon rods for solar cells

Shanghai Provincial Standard of the People's Republic of China, Polycrystalline vs Single Crystal

  • DB31/ 792-2014 Norm of energy consumption per unit products for monocrystalline silicon and silicon wafers
  • DB31/T 792-2014 Energy consumption quota per unit product of silicon single crystal and its silicon wafer
  • DB31/ 792-2020 Energy consumption quota per unit product of silicon single crystal and its silicon wafer

Professional Standard - Aerospace, Polycrystalline vs Single Crystal

  • QJ 2169-1991 Technical conditions for polycrystalline magnesium fluoride fairing with a diameter of 300mm

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