ZH
RU
ES

Electron Microscope vs. Scanning Electron Microscope

Electron Microscope vs. Scanning Electron Microscope, Total:301 items.

In the international standard classification, Electron Microscope vs. Scanning Electron Microscope involves: Optical equipment, Optics and optical measurements, Analytical chemistry, Vocabularies, Education, Air quality, Linear and angular measurements, Protection against crime, Thermodynamics and temperature measurements, Electronic display devices, Surface treatment and coating, Construction materials, Metrology and measurement in general, Welding, brazing and soldering, Iron and steel products, Electronic component assemblies, Ceramics, Semiconductor devices, Integrated circuits. Microelectronics, Optoelectronics. Laser equipment, Electronic components in general, Paints and varnishes, Testing of metals, Medical sciences and health care facilities in general, Technical drawings, Materials for the reinforcement of composites, Paint ingredients, Raw materials for rubber and plastics, Physics. Chemistry, Textile fibres.

International Organization for Standardization (ISO), Electron Microscope vs. Scanning Electron Microscope

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO 17751-2:2014 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
ISO 17751-2:2023 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning electron microscopy method

Japanese Industrial Standards Committee (JISC), Electron Microscope vs. Scanning Electron Microscope

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

National Metrological Technical Specifications of the People's Republic of China, Electron Microscope vs. Scanning Electron Microscope

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery, Electron Microscope vs. Scanning Electron Microscope

JB/T 6842-1993 Test method of scanning electron microscope
JB/T 5384-1991 Scanning electron microscope - Technical specification
JB/T 5480-1991 Diaphragm of electron microscope
JB/T 5481-1991 Lamp filament of electron microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5383-1991 Specification for transmission electron microscope
JB/T 5584-1991 Test method of transmission electron microscope amplification
JB/T 5585-1991 Test method of transmission electron microscope resolution
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China, Electron Microscope vs. Scanning Electron Microscope

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

Korean Agency for Technology and Standards (KATS), Electron Microscope vs. Scanning Electron Microscope

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS M 0044-1999
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS I ISO 10312:2008 Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
KS I ISO 13794:2008 Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
KS K ISO 17751-2:2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method
KS I ISO 13794-2008(2018) Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method

KR-KS, Electron Microscope vs. Scanning Electron Microscope

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS K ISO 17751-2-2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Microscope vs. Scanning Electron Microscope

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope

British Standards Institution (BSI), Electron Microscope vs. Scanning Electron Microscope

18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS EN ISO 17751-2:2016 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends. Scanning Electron Microscopy method
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
12/30228339 DC BS ISO 16000-27. Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy
BS ISO 10312:2019 Ambient air. Determination of asbestos fibres. Direct transfer transmission electron microscopy method
BS ISO 13794:2019 Ambient air. Determination of asbestos fibres. Indirect-transfer transmission electron microscopy method
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy

Professional Standard - Education, Electron Microscope vs. Scanning Electron Microscope

JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy
JY/T 011-1996 General Principles of Transmission Electron Microscopy
JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy

American Society for Testing and Materials (ASTM), Electron Microscope vs. Scanning Electron Microscope

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM D3849-02 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-04 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy

Professional Standard - Petroleum, Electron Microscope vs. Scanning Electron Microscope

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, Electron Microscope vs. Scanning Electron Microscope

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

国家能源局, Electron Microscope vs. Scanning Electron Microscope

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Association Francaise de Normalisation, Electron Microscope vs. Scanning Electron Microscope

NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
NF ISO 16000-27:2014 Air intérieur - Partie 27 : détermination de la poussière fibreuse déposée sur les surfaces par MEB (microscopie électronique à balayage) (méthode directe)
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF X43-404-27*NF ISO 16000-27:2014 Indoor air - Part 27 : determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
NF G07-142-2*NF EN ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other speciality animal fibres and their blends - Part 2 : scanning electron microscopy method
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
NF ISO 10312:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert direct
NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method
NF EN ISO 21363:2022 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à transmission

Professional Standard - Judicatory, Electron Microscope vs. Scanning Electron Microscope

SF/T 0139-2023

Group Standards of the People's Republic of China, Electron Microscope vs. Scanning Electron Microscope

T/QGCML 1940-2023
T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope

Jiangsu Provincial Standard of the People's Republic of China, Electron Microscope vs. Scanning Electron Microscope

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Commodity Inspection, Electron Microscope vs. Scanning Electron Microscope

SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscope vs. Scanning Electron Microscope

GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/Z 26083-2010 Determination for Copper(Ⅱ) octaakoxyl-substituted phthalocyanine on graphite surface(scanning tunneling microscope)
GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
GB/T 43196-2023 Nanotechnology Scanning Electron Microscopy to Measure Nanoparticle Size and Shape Distribution
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens

SE-SIS, Electron Microscope vs. Scanning Electron Microscope

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

European Committee for Standardization (CEN), Electron Microscope vs. Scanning Electron Microscope

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

RU-GOST R, Electron Microscope vs. Scanning Electron Microscope

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)

Danish Standards Foundation, Electron Microscope vs. Scanning Electron Microscope

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

German Institute for Standardization, Electron Microscope vs. Scanning Electron Microscope

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)
DIN EN ISO 17751-2:2016-11 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning Electron Microscopy method (ISO 17751-2:2016); German version EN ISO 17751-2:2016 / Note: To be replaced by DIN EN ISO 17751-2 (2022-09).
DIN EN ISO 17751-2:2022-09 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Part 2: Scanning electron microscopy method (ISO/DIS 17751-2:2022); German and English version prEN ISO 17751-2:2022 / Note: Date of issue 2022-08-19*I...

ES-UNE, Electron Microscope vs. Scanning Electron Microscope

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
UNE-EN ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning Electron Microscopy method (ISO 17751-2:2016)
UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)

Professional Standard - Public Safety Standards, Electron Microscope vs. Scanning Electron Microscope

GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

AENOR, Electron Microscope vs. Scanning Electron Microscope

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.

Lithuanian Standards Office , Electron Microscope vs. Scanning Electron Microscope

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

AT-ON, Electron Microscope vs. Scanning Electron Microscope

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

Association of German Mechanical Engineers, Electron Microscope vs. Scanning Electron Microscope

DVS 2803-1974 Electron-beam welding in microscopy (survey)
VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method

BE-NBN, Electron Microscope vs. Scanning Electron Microscope

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

国家市场监督管理总局、中国国家标准化管理委员会, Electron Microscope vs. Scanning Electron Microscope

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron Microscope vs. Scanning Electron Microscope

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC/JEDEC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components [Superseded: IPC TM-650 2.6.22]

未注明发布机构, Electron Microscope vs. Scanning Electron Microscope

BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electron Microscope vs. Scanning Electron Microscope

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

International Electrotechnical Commission (IEC), Electron Microscope vs. Scanning Electron Microscope

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

American National Standards Institute （ANSI), Electron Microscope vs. Scanning Electron Microscope

ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

工业和信息化部, Electron Microscope vs. Scanning Electron Microscope

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy

GOSTR, Electron Microscope vs. Scanning Electron Microscope

PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

IT-UNI, Electron Microscope vs. Scanning Electron Microscope

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

PH-BPS, Electron Microscope vs. Scanning Electron Microscope

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Electron Microscope vs. Scanning Electron Microscope

GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method

Military Standard of the People's Republic of China-General Armament Department, Electron Microscope vs. Scanning Electron Microscope

GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy

BELST, Electron Microscope vs. Scanning Electron Microscope

STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements

Guangdong Provincial Standard of the People's Republic of China, Electron Microscope vs. Scanning Electron Microscope

DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy