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Carrier Concentration Distribution

Carrier Concentration Distribution, Total:81 items.

In the international standard classification, Carrier Concentration Distribution involves: Semiconducting materials, Testing of metals, Inorganic chemicals, Insulating fluids, Particle size analysis. Sieving, Measurement of fluid flow, Astronomy. Geodesy. Geography, Semiconductor devices, Analytical chemistry, Air quality, Aerospace fluid systems and components, Space systems and operations, Electromechanical components for electronic and telecommunications equipment, Electricity. Magnetism. Electrical and magnetic measurements, Conducting materials, Fuels, Metrology and measurement in general.


Professional Standard - Electron, Carrier Concentration Distribution

  • SJ 3244.4-1989 Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials--Electrochemical voltage capacitance method
  • SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
  • SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
  • SJ 3244.1-1989 Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Carrier Concentration Distribution

  • GB/T 8757-1988 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
  • GB/T 8757-2006 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
  • GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
  • GB/T 11068-1989 Gallium arsenide epitaxial layer--Determination of carrier concentration--Voltage-capacitance method
  • GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
  • GB/T 11068-2006 Gallium arsenide epitaxial layer.Determination of carrier concentration voltage-capacitance method
  • GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
  • GB 11068-1989 GaAs Epitaxial Layer Carrier Concentration Capacitance-Voltage Measurement Method
  • GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
  • GB/T 14863-1993 Standard test method for net carrier density in silicon eqitaxial layers by voltage-capacitance of gated and ungated diodes
  • GB/T 42732-2023 Size Distribution and Concentration Measurement of Inorganic Nanoparticles in Aqueous Phases in Nanotechnology by Single Particle Inductively Coupled Plasma Mass Spectrometry

国家市场监督管理总局、中国国家标准化管理委员会, Carrier Concentration Distribution

  • GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method
  • GB/T 39843-2021 Electronic characteristic measurements—Local critical current density and its distribution in large-area superconducting films

Group Standards of the People's Republic of China, Carrier Concentration Distribution

  • T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method
  • T/CASAS 010-2019 Determination of Trace Impurities Concentration and Distribution in GaN Materials by Secondary Ion Mass Spectrometry
  • T/CASAS 009-2019 Determination of Trace Impurities Concentration and Distribution in Semi-insulating SiC Materials by Secondary Ion Mass Spectrometry

British Standards Institution (BSI), Carrier Concentration Distribution

  • PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
  • BS ISO 21501-3:2007 Determination of particle size distribution. Single particle light interaction methods. Light extinction liquid-borne particle counter
  • BS ISO 21501-2:2007 Determination of particle size distribution. Single particle light interaction methods. Light scattering liquid-borne particle counter
  • BS ISO 21501-3:2019 Determination of particle size distribution. Single particle light interaction methods - Light extinction liquid-borne particle counter
  • BS ISO 21501-2:2019 Determination of particle size distribution. Single particle light interaction methods - Light scattering liquid-borne particle counter
  • 19/30385918 DC BS ISO 21501-3. Determination of particle size distribution. Single particle light interaction methods. Part 3. Light extinction liquid-borne particle counter
  • 19/30385915 DC BS ISO 21501-2. Determination of particle size distribution. Single particle light interaction methods. Part 2. Light scattering liquid-borne particle counter
  • BS PD CEN/TR 13205-3:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Analysis of sampling efficiency data
  • BS EN IEC 61788-17:2021 Tracked Changes. Superconductivity. Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films
  • PD CEN ISO/TS 19590:2019 Nanotechnologies. Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry

International Organization for Standardization (ISO), Carrier Concentration Distribution

  • ISO/DIS 19430 Determination of particle size distribution and number concentration by particle tracking analysis (PTA)
  • ISO 21501-3:2019 Determination of particle size distribution — Single particle light interaction methods — Part 3: Light extinction liquid-borne particle counter
  • ISO 21501-2:2019 Determination of particle size distribution — Single particle light interaction methods — Part 2: Light scattering liquid-borne particle counter
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO 14952-3:2003 Space systems - Surface cleanliness of fluid systems - Part 3: Analytical procedures for the determination of nonvolatile residues and particulate contamination
  • ISO/TS 19590:2017 Nanotechnologies — Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry
  • ISO 28439:2011 Workplace atmospheres - Characterization of ultrafine aerosols/nanoaerosols - Determination of the size distribution and number concentration using differential electrical mobility analysing systems

IN-BIS, Carrier Concentration Distribution

Korean Agency for Technology and Standards (KATS), Carrier Concentration Distribution

  • KS B ISO 4365:2022 Liquid flow in open channels — Sediment in streams and canals — Determination of concentration, particle size distribution and relative density
  • KS C IEC 60512-5-2:2003 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
  • KS C IEC 60512-5-2-2003(2008) Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
  • KS C IEC 60512-5-2:2014 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating

KR-KS, Carrier Concentration Distribution

  • KS B ISO 4365-2022 Liquid flow in open channels — Sediment in streams and canals — Determination of concentration, particle size distribution and relative density

International Electrotechnical Commission (IEC), Carrier Concentration Distribution

  • IEC TS 62607-5-3:2020 Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
  • IEC TS 62607-6-16:2022 Nanomanufacturing - Key control characteristics - Part 6-16: Two-dimensional materials - Carrier concentration: Field effect transistor method
  • IEC 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating
  • IEC 61788-17:2021 Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
  • IEC 61788-17:2021 RLV Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

RU-GOST R, Carrier Concentration Distribution

  • GOST 25645.146-1989 Earth's ionosphere. Model of global distribution of concentration, temperature and effective collision frequency of electrons
  • GOST R 25645.158-1994 Earth's uppermost ionosphere. Model of distribution of the concentration of electrons in the flat of geomagnetic equator
  • GOST R 25645.157-1994 Earth's lower ionosphere. Model of global distribution of concentration and effective collision frequency of electrons for VLE-LF radio foreacast
  • GOST R 8.775-2011 State system for ensuring the uniformity of measurements. Disperse composition of gas atmospheres. Determination of nano particle size by differential electrical mobility analysis for aerosol particles

American Society for Testing and Materials (ASTM), Carrier Concentration Distribution

  • ASTM F398-92(1997) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
  • ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
  • ASTM D4438-13(2018)e1 Standard Test Method for Particle Size Distribution of Catalysts and Catalyst Carriers by Electronic Counting
  • ASTM D4438-13 Standard Test Method for Particle Size Distribution of Catalysts and Catalyst Carriers by Electronic Counting
  • ASTM D8049-17 Standard Test Method for Determining Concentration, Count, and Size Distribution of Solid Particles and Water in Light and Middle Distillate Fuels by Direct Imaging Particle Analyzer
  • ASTM D8049-16 Standard Test Method for Determining Concentration, Count, and Size Distribution of Solid Particles and Water in Light and Middle Distillate Fuels by Direct Imaging Particle Analyzer

Association Francaise de Normalisation, Carrier Concentration Distribution

  • NF X43-283-4*NF EN 13205-4:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 4 : laboratory performance test based on comparison of concentrations
  • XP T16-401*XP CEN ISO/TS 19590:2019 Nanotechnologies - Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry
  • NF X43-283-1*NF EN 13205-1:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 1 : general requirements
  • FD X43-711-2*FD CEN/TR 16013-2:2010 Workplace exposure - Guide for the use of direct-reading instruments for aerosol monitoring - Part 2 : evaluating airborne particle concentrations using Optical Particle Counters
  • NF C93-400-5-2*NF EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2 : current-carrying capacity tests - Test 5b : current-temperature derating.
  • NF X43-283-6*NF EN 13205-6:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 6 : transport and handling tests
  • XP CEN ISO/TS 19590:2019 Nanotechnologies - Distribution granulométrique et concentration de nanoparticules inorganiques en milieu aqueux par spectrométrie de masse à plasma induit en mode particule unique

CEN - European Committee for Standardization, Carrier Concentration Distribution

  • CEN ISO/TS 19590:2019 Nanotechnologies - Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry

German Institute for Standardization, Carrier Concentration Distribution

  • DIN EN 13205-4:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 4: Laboratory performance test based on comparison of concentrations; German version EN 13205-4:2014
  • DIN EN 60512-5-2:2003-01 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002 / Note: DIN IEC 60512-3 (1994-05) remains valid along...
  • DIN EN 13205-1:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 1: General requirements; German version EN 13205-1:2014
  • DIN CEN ISO/TS 19590:2019-11*DIN SPEC 19286:2019-11 Nanotechnologies - Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry (ISO/TS 19590:2017); German version CEN ISO/TS 19590:2019

Danish Standards Foundation, Carrier Concentration Distribution

  • DS/CEN/TR 16013-2:2010 Workplace exposure - Guide for the use of direct-reading instruments for aerosol monitoring - Part 2: Evaluation of airborne particle concentrations using Optical Particle Counters
  • DS/EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating
  • DS/ISO 21501-4:2007 Determination of particle size distribution - Single particle light interaction methods - Part 4: Light scattering airborne particle counter for clean spaces
  • DS/EN IEC 61788-17:2021 Superconductivity – Part 17: Electronic characteristic measurements – Local critical current density and its distribution in large-area superconducting films

Japanese Industrial Standards Committee (JISC), Carrier Concentration Distribution

  • JIS C 5402-5-2:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating

AENOR, Carrier Concentration Distribution

  • UNE-EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating.

European Committee for Standardization (CEN), Carrier Concentration Distribution

  • EN ISO 28439:2011 Workplace atmospheres - Characterization of ultrafine aerosols/nanoaerosols - Determination of the size distribution and number concentration using differential electrical mobility analysing systems (ISO 28439:2011)

Lithuanian Standards Office , Carrier Concentration Distribution

  • LST EN 60512-5-2-2003 Connectors for electronic equipment. Tests and measurements. Part 5-2: Current-carrying capacity tests. Test 5b: Current-temperature derating (IEC 60512-5-2:2002)

European Committee for Electrotechnical Standardization(CENELEC), Carrier Concentration Distribution

  • EN 60512-5-2:2002 Connectors for Electronic Equipment - Tests and Measurements Part 5-2: Current-Carrying Capacity Tests - Test 5b: Current-Temperature Derating

ES-UNE, Carrier Concentration Distribution

  • UNE-EN IEC 61788-17:2021 Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films (Endorsed by Asociación Española de Normalización in July of 2021.)
  • UNE-EN 61788-17:2013 Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films (Endorsed by AENOR in May of 2013.)




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