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When using a scanning electron microscope

When using a scanning electron microscope, Total:89 items.

In the international standard classification, When using a scanning electron microscope involves: Analytical chemistry, Physics. Chemistry, Linear and angular measurements, Mechanical testing, Optics and optical measurements, Paints and varnishes, Construction materials, External sewage systems, Optical equipment, Vocabularies, Iron and steel products, Ceramics, Document imaging applications, Microprocessor systems, Television and radio broadcasting, Air quality, Medical sciences and health care facilities in general, Paint ingredients, Elements of buildings, Medical equipment, Textile fibres.


International Organization for Standardization (ISO), When using a scanning electron microscope

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
  • ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
  • ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
  • ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 2: Method of use
  • ISO 12653-2:2000/cor 1:2002 Electronic imaging - Test target for the black-and-white scanning of office documents - Part 2: Method of use; Technical Corrigendum 1
  • ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • ISO 12653-3:2014 Electronic imaging - Test target for scanning of office documents - Part 3: Test target for use in lower resolution applications

British Standards Institution (BSI), When using a scanning electron microscope

  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
  • BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
  • DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • 12/30265696 DC BS ISO 18115-2 AMD1. Surface chemical analysis. Vocabulary. Part 2. Terms used in scanning-probe microscopy
  • BS ISO 12653-2:2000 Electronic imaging - Test target for the black-and-white scanning of office documents - Method of use
  • BS ISO 12653-2:2001 Electronic imaging. Test target for the black-and-white scanning of office documents. Method of use
  • BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • BS ISO 12653-3:2014 Electronic imaging. Test target for scanning of office documents. Test target for use in lower resolution applications
  • 12/30228339 DC BS ISO 16000-27. Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • 15/30322265 DC BS EN 3475-414. Aerospace series. Cables, electrical, aircraft use. Test methods. Part 414. Differential scanning calorimeter (DSC test)
  • BS ISO 21915-1:2020 Textiles. Qualitative and quantitative analysis of some cellulose fibres (lyocell, cupro) and their blends - Fibre identification using scanning electron microscopy and spectral analysis methods

BE-NBN, When using a scanning electron microscope

  • NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

Association of German Mechanical Engineers, When using a scanning electron microscope

  • VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems

American Society for Testing and Materials (ASTM), When using a scanning electron microscope

  • ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
  • ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM F2550-06 Standard Practice for Locating Leaks in Sewer Pipes Using Electro-Scan--the Variation of Electric Current Flow Through the Pipe Wall
  • ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
  • ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
  • ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
  • ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM F1438-93(2012) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
  • ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM D8231-19 Standard Practice for the Use of a Low Voltage Electronic Scanning System for Detecting and Locating Breaches in Roofing and Waterproofing Membranes
  • ASTM E3284-23 Standard Practice for Training in the Forensic Examination of Primer Gunshot Residue (pGSR) Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
  • ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
  • ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
  • ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
  • ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM D7954/D7954M-14 Standard Practice for Moisture Surveying of Roofing and Waterproofing Systems Using Non-Destructive Electrical Impedance Scanners
  • ASTM D7954/D7954M-15 Standard Practice for Moisture Surveying of Roofing and Waterproofing Systems Using Non-Destructive Electrical Impedance Scanners
  • ASTM E3309-21 Standard Guide for Reporting of Forensic Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)

German Institute for Standardization, When using a scanning electron microscope

  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)

European Committee for Standardization (CEN), When using a scanning electron microscope

  • EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)

KR-KS, When using a scanning electron microscope

  • KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy

Danish Standards Foundation, When using a scanning electron microscope

  • DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Association Francaise de Normalisation, When using a scanning electron microscope

  • FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • NF X43-404-27*NF ISO 16000-27:2014 Indoor air - Part 27 : determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)

Japanese Industrial Standards Committee (JISC), When using a scanning electron microscope

  • JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

International Telecommunication Union (ITU), When using a scanning electron microscope

  • ITU-R BR.1374-2001 Scanned area dimensions from 16 mm and 35 mm cinematographic film used in television

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector, When using a scanning electron microscope

  • ITU-R BR.1374-1998 Scanned Area Dimensions from 16 MM and 35 MM Cinematographic Film Used in Television

American National Standards Institute (ANSI), When using a scanning electron microscope

  • ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

Korean Agency for Technology and Standards (KATS), When using a scanning electron microscope

  • KS X ISO 12653-2-2007(2022) Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use
  • KS X ISO 12653-2-2007(2017) Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use
  • KS X ISO 12653-2:2007 Electronic imaging-Test target for the black-and-white scanning of office documents-Part 2:Method of use

BELST, When using a scanning electron microscope

  • STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements
  • STB 2209-2011 Nano-sized carbon and non-carbon materials and composites based on them. The technique for determining elemental composition using scan electron microscopy measurements

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, When using a scanning electron microscope

  • GB/T 20493.2-2006 Electronic imaging. Test target for the black-and-white scanning of office documents. Part 2: Method of use

ZA-SANS, When using a scanning electron microscope

  • SANS 12653-2:2006 Electronic imaging - Test target for the black-and-white scanning of office documents Part 2: Method of use

NEMA - National Electrical Manufacturers Association, When using a scanning electron microscope

  • NEMA MITA WP 1-2017 Computed Tomography Image Quality (CTIQ): Low-Contrast Detectability (LCD) Assessment When Using Dose Reduction Technology

ES-UNE, When using a scanning electron microscope

  • UNE-EN 3475-414:2005 Aerospace series - Cables, electrical, aircraft use - Test methods - Part 414: Differential scanning calorimeter (DSC test) (Endorsed by AENOR in December of 2005.)

ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization, When using a scanning electron microscope

  • PREN 3475-414-1999 Aerospace Series Cables@ Electrical@ Aircraft Use Test Methods Part 414: Differential Scanning Calorimeter (DSC Test) (Edition P 1)

International Electrotechnical Commission (IEC), When using a scanning electron microscope

  • IEC 87/402/CD:2008 IEC/TS 62558: Ultrasonics-real-time pulse-echo scanners - Phantom and method for automated evaluation and periodic testing of 3-D distributions of signal-to-noise ratio using voids




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