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Electron Probe Microanalysis

Electron Probe Microanalysis, Total:45 items.

In the international standard classification, Electron Probe Microanalysis involves: Vocabularies, Analytical chemistry, Ceramics.


Korean Agency for Technology and Standards (KATS), Electron Probe Microanalysis

  • KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
  • KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
  • KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 16592-2011(2021) Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
  • KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 22489:2012 Microbeam analysis-Electron probe microanalysis-Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

KR-KS, Electron Probe Microanalysis

  • KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
  • KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
  • KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
  • KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

International Organization for Standardization (ISO), Electron Probe Microanalysis

  • ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
  • ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
  • ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
  • ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
  • ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

Association Francaise de Normalisation, Electron Probe Microanalysis

  • NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
  • NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
  • NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
  • NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
  • NF EN 1071-4:2006 Céramiques techniques avancées - Méthodes d'essai pour revêtements céramiques - Partie 4 : détermination de la composition chimique par microanalyse avec sonde électronique (MASE)

British Standards Institution (BSI), Electron Probe Microanalysis

  • BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
  • BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
  • BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
  • 22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
  • BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
  • 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • 20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
  • BS EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of chemical composition by electron probe microanalysis (EPMA)

Danish Standards Foundation, Electron Probe Microanalysis

  • DS/EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

Lithuanian Standards Office , Electron Probe Microanalysis

  • LST EN 1071-4-2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

ES-UNE, Electron Probe Microanalysis

  • UNE-EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) (Endorsed by AENOR in April of 2006.)

German Institute for Standardization, Electron Probe Microanalysis

  • DIN EN 1071-4:2006-05 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA); German version EN 1071-4:2006




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