31.020 电子元器件综合 标准查询与下载

IEC 60286-1:2021 自动装配用元件的包装. 第1部分: 具有轴向引线的元件在连续编带上的带式包装

This part of IEC 60286 applies to the tape packaging of components with axial leads for use in electronic equipment. In general, the tape is applied to the component leads. It covers requirements for taping techniques used with equipment for the preforming of leads, automatic han

Packaging of components for automatic handling - Part 1: Tape packaging of components with axial leads on continuous tapes

LST EN IEC 62435-7:2021 电子元器件-电子半导体器件的长期储存-第7部分：微型机电器件（IEC 62435-7:2020）

Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices (IEC 62435-7:2020)

T/GDC 87-2021 电子听诊器通用技术规范

外观和结构、传音特性、音量调节、录音功能、安全要求、电磁兼容性、生物相容性、环境适应性。

General technical specification for electronic stethoscope

DS/EN IEC 62435-7:2021 电子元器件《电子半导体器件长期贮存》第7部分：微机电器件

Electronic components – Long-term storage of electronic semiconductor devices – Part 7: Micro-electromechanical devices

OVE EN IEC 62435-9:2021 电子元件 电子半导体器件的长期储存 第9部分：特殊情况（IEC 47/2667/CDV）（英文版）

Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special Cases (IEC 47/2667/CDV) (english version)

PNS IEC 62435-1:2021 电子元件.电子半导体器件的长期贮存.第1部分：总则

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General

PNS IEC 62435-7:2021 电子元件.电子半导体器件的长期贮存.第7部分：微机电器件

Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices

PNS IEC 62435-5:2021 电子元件.电子半导体器件的长期存储.第5部分：芯片和晶圆器件

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

PNS IEC 62435-3:2021 电子元件.电子半导体器件的长期存储.第3部分：数据

Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data

IEC 62435-7:2020 电子元件.电子半导体器件的长期储存.第7部分:微机电装置

Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices

LST EN IEC 62435-8:2020 电子元器件-电子半导体器件的长期储存-第8部分：无源电子器件（IEC 62435-8:2020）

Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices (IEC 62435-8:2020)

OVE EN IEC 61760-2:2020 表面贴装技术 第2部分：表面贴装器件（SMD）的运输和储存条件 应用指南（IEC 91/1666/CDV）（英文版）

Surface mounting technology - Part 2: Transportation and storage conditions of surface mounting devices (SMD) - Application guide (IEC 91/1666/CDV) (english version)

BS EN IEC 62435-8:2020 电子元器件 电子半导体器件的长期存储-无源电子器件

What is BS EN IEC 62435 ‑ 8 about? BS EN IEC 62435 ‑ 8 is the eighth part of the multi-series European standard on electronic components.  BS EN IEC 62435 ‑ 8 series on long-term storage is applied to passive electronic devices in long-term storage that can be used as part of obsolescence mitigation strategy. Long-term storage refers to a duration that can be more than 12 months for a product scheduled for storage. BS EN IEC 624358 , together with the packaging and labelling of components, allows for the verification of the thermal and environmental criteria for evaluating the reliability of passive electronic devices. Who is BS EN IEC 62435 ‑ 8 for ? BS EN IEC 62435 ‑ 8 on electronic components is useful for: Manufacturer of electronic components Electrical Engineers Researchers and scientists Semiconductor foundries

Electronic components. Long-term storage of electronic semiconductor devices - Passive electronic devices

T/ZEIIA 02-2020 电子元器件用材料 电子浆料试验方法

一般试验条件、试验报告、固体含量的测定、试验步骤、计算、固化型浆料、贵金属浆料或非金属浆料、贱金属浆料、粘度的测定、细度的测定、附着力的测定、收缩率的测定、有毒有害物质限量的测定。

Test method of electronic paste for electronic components

EN IEC 62435-8:2020 电子元件 电子半导体器件的长期储存 第8部分：无源电子器件

IEC 62435-8:2020 on long-term storage is applied to passive electronic devices in long-term storage that can be used as part of obsolescence mitigation strategy. Long-term storage refers to a duration that can be more than 12 months for product scheduled for storage. Storage typically begins when components are packed at the originating supplier where the pack date or date code are assigned to the product. It is the responsibility of the distributor and the customer to control and manage the aging inventory upon receipt of the dated product. Alternatively, a supplier-customer agreement can be established to manage the aging inventory. Philosophy, good working practice, and general means to facilitate the successful long-term storage of electronic components are also addressed.

Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices

T/CESA 1110-2020 绿色设计产品评价技术规范 液晶显示器件

本标准规定了液晶显示器件绿色设计产品的评价要求和评价方法，以及产品生命周期评价报告的编制方法。 本标准适用于平板（或曲面）显示终端用薄膜晶体管液晶显示器件（TFT-LCD）产品，属于电子元器件范畴，其他类型的液晶显示器件绿色设计产品评价可参照执行。当“液晶显示器件”作为“产品”的一个组成部分，可参考执行本规范。

Technical specification for green-design product assessment - Liqudid crystal display device

IEC 62435-8:2020 电子元器件电子半导体器件的长期储存第8部分:无源电子器件

Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices

ASTM E1250-15(2020) 电子元件应用评估硅电子器件辐射硬度测试中使用的钴-60型辐射器的低能伽马元件的标准测试方法

1.1 Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices. These low energy components may lead to errors in determining the absorbed dose in a specific device under test. This method covers procedures for the use of a specialized ionization chamber to determine a figure of merit for the relative importance of such effects. It also gives the design and instructions for assembling this chamber. 1.2 This method is applicable to measurements in Co-60 radiation fields where the range of exposure rates is 7 × 10 −6 to 3 × 10−2 C kg−1 s−1 (approximately 100 R/h to 100 R/s). For guidance in applying this method to radiation fields where the exposure rate is >100 R/s, see Appendix X1. NOTE 1—See Terminology E170 for definition of exposure and its units. 1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

ASTM E668-20 用于确定电子设备辐射硬度测试中吸收剂量的热释光剂量法（TLD）系统的标准实践

1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10−2 to 104 Gy (1 to 106 rad), and the range of absorbed dose rates is approximately from 10−2 to 1010 Gy/s (1 to 1012 rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. (See Practice E2450 for guidance in mixed fields.) Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice. NOTE 1—The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and (c) bremsstrahlung radiation generated by the primary electrons is largely lost. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

T/CIE 071-2020 工业级高可靠集成电路评价 第6部分：蓝牙芯片

本文件规定了蓝牙5.0 BLE芯片（以下简称芯片）的检测要求、检测方法和检验规则等。 本文件适用于蓝牙BLE芯片的鉴定验收和评价检测活动。

Evaluation of Industrial High Reliability Integrated Circuits Part 6: Bluetooth Chips