31.140 频率控制和选择用压电器件与介质器件 标准查询与下载
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IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology. This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability. It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
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- 2020-06-19
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- 2020-08-29 (7)
Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
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- 31.140
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- 2020-05-27
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Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
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- 31.140
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- 2020-04-28
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Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
- ICS
- 31.140
- CCS
- 发布
- 2020-04-24
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method
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- 31.140
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- 发布
- 2019-11-15
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Piezoelectric sensors — Part 1: Generic specifications
- ICS
- 31.140
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- 发布
- 2019-11-15
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement
- ICS
- 31.140
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- 2019-11-15
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Piezoelectric sensors — Part 2: Chemical and biochemical sensors
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- 31.140
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- 发布
- 2019-11-15
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Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality ― Part 1: Generic specification
- ICS
- 31.140
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- 2019-11-15
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Waveguide type dielectric resonators — Part 1-5: General information and test conditions — Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave
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- 31.140
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- 发布
- 2019-11-15
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Single crystal wafers for surface acoustic wave(SAW) device applications — Specifications and measuring methods
- ICS
- 31.140
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- 发布
- 2019-11-15
- 实施
Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality — Part 2: Guidelines for the use
- ICS
- 31.140
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- 发布
- 2019-11-15
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Radio frequency(RF) bulk acoustic wave(BAW) filters of assessed quality — Part 1: Generic specification
- ICS
- 31.140
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- 发布
- 2019-11-15
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Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality ― Part 1: Generic specification
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
Waveguide type dielectric resonators — Part 1-5: General information and test conditions — Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality — Part 2: Guidelines for the use
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
Piezoelectric sensors — Part 2: Chemical and biochemical sensors
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
Single crystal wafers for surface acoustic wave(SAW) device applications — Specifications and measuring methods
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
Piezoelectric sensors — Part 1: Generic specifications
- ICS
- 31.140
- CCS
- 发布
- 2019-11-15
- 实施
