31.140 频率控制和选择用压电器件与介质器件 标准查询与下载

IEC 62047-37:2020 半导体器件微机电器件第37部分:传感器用MEMS压电薄膜的环境试验方法

Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application

IEC 63155:2020 射频（RF）应用中表面声波（SAW）和体声波（BAW）器件功率耐久性测量方法指南

Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications

KS C IEC 62884-2:2019 压电、电介质和静电振荡器的测量技术第2部分:相位抖动测量方法

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method

KS C IEC 63041-1:2019 压电传感器 - 第1部分:通用规范

Piezoelectric sensors — Part 1: Generic specifications

KS C IEC 62884-1-2019 压电、介电和静电振荡器的测量技术.第1部分:测量的基本方法

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement

KS C IEC 63041-2-2019 压电传感器 - 第2部分:化学和生化传感器

Piezoelectric sensors — Part 2: Chemical and biochemical sensors

KS C IEC 62604-1:2019 经质量评定的声表面波和体声波双工器第1部分:总规范

Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality ― Part 1: Generic specification

KS C IEC 61338-1-5-2019 波导型介质谐振器 - 第1-5部分:一般信息和测试条件 - 微波频率下导体层和介质基板之间的界面处的电导率测量方法

Waveguide type dielectric resonators — Part 1-5: General information and test conditions — Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave

KS C IEC 62276-2019 用于表面声波（锯）的单晶硅片器件应用 - 规格和测量方法

Single crystal wafers for surface acoustic wave(SAW) device applications — Specifications and measuring methods

KS C IEC 62604-2-2019 表面声波（锯）和批量声波（Baw）评估质量的双工器 - 第2部分:使用指南

Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality — Part 2: Guidelines for the use

KS C IEC 62575-1-2019 评估质量的射频（RF）体声波（BAW）滤波器 - 第1部分:通用规范

Radio frequency(RF) bulk acoustic wave(BAW) filters of assessed quality — Part 1: Generic specification

KS C IEC 62604-1-2019 经质量评定的声表面波和体声波双工器第1部分:总规范

Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality ― Part 1: Generic specification

KS C IEC 61338-1-5:2019 波导型介质谐振器 - 第1-5部分:一般信息和测试条件 - 微波频率下导体层和介质基板之间的界面处的电导率测量方法

Waveguide type dielectric resonators — Part 1-5: General information and test conditions — Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave

KS C IEC 62604-2:2019 表面声波（锯）和批量声波（Baw）评估质量的双工器 - 第2部分:使用指南

Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality — Part 2: Guidelines for the use

KS C IEC 63041-2:2019 压电传感器 - 第2部分:化学和生化传感器

Piezoelectric sensors — Part 2: Chemical and biochemical sensors

KS C IEC 62884-2-2019 压电、电介质和静电振荡器的测量技术第2部分:相位抖动测量方法

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method

KS C IEC 62276:2019 用于表面声波（锯）的单晶硅片器件应用 - 规格和测量方法

Single crystal wafers for surface acoustic wave(SAW) device applications — Specifications and measuring methods

KS C IEC 63041-1-2019 压电传感器 - 第1部分:通用规范

Piezoelectric sensors — Part 1: Generic specifications

KS C IEC 62884-1:2019 压电、介电和静电振荡器的测量技术.第1部分:测量的基本方法

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement

KS C IEC 62575-1:2019 评估质量的射频（RF）体声波（BAW）滤波器 - 第1部分:通用规范

Radio frequency(RF) bulk acoustic wave(BAW) filters of assessed quality — Part 1: Generic specification