31.140 频率控制和选择用压电器件与介质器件 标准查询与下载

BS EN IEC 62884-4:2019 压电、介电和静电振荡器的测量技术 短期频率稳定性测试方法

What is BS EN IEC 62884-4 - Short-term frequency stability test methods about?    BS EN IEC 62884 ‑ 4 concentrates on the measurement techniques of piezoelectric, dielectric and electrostatic oscillators. BS EN IEC 62884 ‑ 4 purpose is to unify the test and evaluation methods for short-term frequency stability.    BS EN IEC 62884 ‑ 4 describes the methods for...

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Short-term frequency stability test methods

IEC TS 61994-5:2019 频率控制、选择和检测用压电、介电和静电器件及相关材料术语第5部分:压电传感器

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors

IEC 62884-4:2019 压电、介电和静电振荡器的测量技术第4部分:短期频率稳定性试验方法

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

IEC 62047-33:2019 半导体器件微机电器件第33部分:MEMS压阻压敏器件

This part of IEC 62047 defines terms@ definitions@ essential ratings and characteristics@ as well as test methods applicable to MEMS piezoresistive pressure-sensitive device. This document applies to piezoresistive pressure-sensitive devices for automotive@ medical treatment@ electronic products.

Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device

IEC 62047-36:2019 半导体器件微机电器件第36部分:MEMS压电薄膜的环境和介电耐受试验方法

This part of IEC 62047 specifies test methods for evaluating the durability of MEMS piezoelectric thin film materials under the environmental stress of temperature and humidity and under electrical stress@ and test conditions for appropriate quality assessment. Specifically@ this document specifies test methods and test conditions for measuring the durability of a DUT under temperature and humidity conditions and applied voltages. It further applies to evaluations of converse piezoelectric properties in piezoelectric thin films formed primarily on silicon substrates@ i.e.@ piezoelectric thin films used as actuators. This document does not cover reliability assessments@ such as methods of predicting the lifetime of a piezoelectric thin film based on a Weibull distribution.

Semiconductor devices – Micro-electromechanical devices – Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

IEC 62047-34:2019 半导体器件微机电器件第34部分:硅片上MEMS压阻压敏器件的试验方法

This part of IEC 62047 describes test conditions and test methods of electric character@ static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer

BS EN IEC 60122-4:2019 经评估质量的石英晶体元件 带热敏电阻的晶体元件

What is BS EN IEC 60122 ‑ 4 - Quartz crystal units of assessed quality about? BS EN IEC 60122 ‑ 4 is the fourth part of a British standard used for quartz crystal units of assessed quality. BS EN IEC 60122 ‑ 4 can be your best practice guide in conducting test methods which helps in improving the quality of these crystal units with thermistors. BS EN IEC 60122 ‑ 4 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors. Who is BS EN IEC 60122 ‑ 4 - Quartz crystal units of assessed quality for? BS EN IEC 60122 ‑ 4 on quartz crystal units o...

Quartz crystal units of assessed quality - Crystal units with thermistors

IEC 60122-4:2019 经质量评定的石英晶体单元第4部分:带热敏电阻的晶体单元

This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors.

Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

T/CECA 26-2019 压电陶瓷电声元件可靠性试验方法

本标准规定了压电陶瓷电声元件的高温贮存、高温工作、低温贮存、低温工作、温度循环、恒定湿热、振动、碰撞、冲击、自由跌落、高温寿命、可焊性、耐焊接热、耐高温、耐高电压、工作失效率等可靠性试验的一般要求、试验方法和程序、试验记录、合格判据和报告要求。 本标准适用于压电陶瓷电声元件的研制、生产、使用、第三方检测等环节需要的可靠性试验。

Reliability test methods for piezoelectric ceramic electro-acoustic components

T/CEMIA 006-2018 膜厚监控用石英晶振片

本标准规定了膜厚监控用石英晶振片的产品分类、技术要求、试验和测量方法、检验规则、标志、包装、运输、贮存的要求。

Quartz crystal resonator for film thickness control

IEC TS 61994-4-4:2018 频率控制、选择和检测用压电、介电和静电器件及相关材料术语第4-4部分:压电材料表面声波（SAW）器件用单晶片

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for s

IEC TS 61994-4-4:2018 RLV 频率控制、选择和检测用压电、介电和静电器件及相关材料术语第4-4部分:压电材料表面声波（SAW）器件用单晶片

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for s

KS C IEC 61253-2-2018 压电陶瓷谐振器 - IEC电子元器件质量评估体系（IECQ）中的规范 - 第2部分:分规范 - 鉴定认可

Piezoelectric ceramic resonators — A Specification in the IEC quality assessment system for electronic components (IECQ) — Part 2: Sectional specification-Qualification approval

KS C IEC 60122-1:2018 评估质量的石英晶体单位 - 第1部分:通用规范

Quartz crystal units of assessed quality — Part 1: Generic specification

KS C IEC 61338-1:2018 波导型介质谐振器第1部分:总规范

Waveguide type dielectric resonators ─ Part 1: Generic specification

KS C IEC 61261-2-2018(2023) 电子设备用压电陶瓷滤波器.IEC电子元件质量评估系统（IECQ）规范第2部分:分规范资格认证

Piezoelectric ceramic filters for use in electronic equipment ― A specification in the IEC quality assessment system for electronic components (IECQ) ― Part 2: Sectional specification ― Qualification

KS C IEC 61178-2:2018 石英晶体元件IEC电子元器件质量评定体系（IECQ）规范第2部分:分规范能力认可

Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval

KS C IEC 61338-1-4:2018 波导型介质谐振器第1-4部分:一般信息和试验条件毫米波频率下介质谐振器材料复相对介电常数的测量方法

Waveguide type dielectric resonators ─ Part 1-4: General information and test conditions ─ Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave fre

KS C IEC 61080-2018 石英晶体等效电参数测量指南

Guide to the measurement of equivalent electrical parameters of quartz crystal units

KS C IEC 61253-1-2018(2023) 压电陶瓷谐振器.IEC电子元件质量评估系统规范（IECQ）.第1部分:总规范.资格认证

Piezoelectric ceramic resonators — A specification in the IEC quality assessment system for electronic components (IECQ) — Part 1: Generic specification - Qualification approval