共找到 911 条与 频率控制和选择用压电器件与介质器件 相关的标准,共 61 页
Quartz crystal controlled oscillators of assessed quality-Part 4-1 : Blank detail specification-Capability approval
Quartz crystal units-A specification in the IEC quality assessment system for electronic components(IECQ)-Part 3:Sectional specification-Qualification approval-Section 1:Blank detail specification
Piezoelectric ceramic resonators-A specification in the IEC quality assessment system for electronic components(IECQ)-Part 2:Sectional specification-Qualification approval-Section 1:Blank detail specification-Assessment level E
Measurement of quartz crystal unit parameters by zero phase technique in a p-network-Part 2:Phase offset method for measurement of motional capacitance of quartz crystal units
Quartz crystal units-A specification in the IEC quality assessment system for electronic components(IECQ)-Part 2:Sectional specification-Capability approval-Section 1:Blank detail specification
Surface acoustic wave(SAW) filters of assessed quality-Part 2:Guidance on use
Quartz crystal controlled oscillators of assessed quality-Part 5-1:Blank detail specification-Qualification approval
本文件规定了球形压电陶瓷换能器的定义、分类、技术要求和试验方法、检验规则、包装、 标志、储存和运输。 本文件适用于空心压电陶瓷球形压电陶瓷换能器。
Spherical piezoelectric ceramic transducers
本文件规定了声表面波器件用单晶薄膜基片的术语和定义、技术要求、试验方法、检验规则、包装、标签/标识、储存和运输。 本文件适用于声表面波器件用单晶薄膜基片。
Single-crystal thin film substrates for SAW devices
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 4: Short-term frequency stability test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 4: Short-term frequency stability test methods
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
本文件规定了基于低信噪比条件下载波及符号定时同步规范的术语和定义、基带解调制方式、基带信号鉴相、提取载波相位、载波同步及符号定时同步等规范。
Specification for downloading ripple and symbol timing synchronization under low signal-to-noise ratio conditions
本文件规定了延迟型声表面波传感器阵列规范的术语和定义、延迟线型声表面波传感器阵列的组成、叉指换能器设置、反射栅组设置、反射栅组合、叉指换能器间距等规范。
Delayed Surface Acoustic Wave Sensor Array Specifications
Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections
Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections
What is BS EN IEC 63041 ‑ 1 about? BS EN IEC 63041 ‑ 1 is the first part of the BS EN IEC 63041 multi-series that focuses on piezoelectric sensors. BS EN IEC 63041 ‑ 1 applies to piezoelectric sensors of the resonator, delay-line, and non-acoustic types, which are used in physics and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose o...
Piezoelectric sensors - Generic specifications
Measurement of quartz crystal unit parameters. Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
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