L15 敏感元器件及传感器 标准查询与下载

EN 60539-1:2008 直接加热式负温度系数电热调节器.第1部分:一般规范

This part of IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

Directly heated negative temperature coefficient thermistors — Part 1: Generic specification

GJB/J 6205-2008 角振动传感器校准规范

本校准规范规定了角振动传感器（从测量参数上分为角加速度计、角速度计和角位移计）的计量特性、校准条件、校准项目、校准方法、校准结果的处理及复校时间间隔。 本校准规范适用于测量范围在0.5Hz～500Hz、0.1rad/s～800rad/s的角加速度计灵敏度和相位延迟的校准，测量范围在0.5Hz～500Hz、0.01rad/s～10rad/s的角速度计灵敏度和相位延迟的校准，测量范围在0.5Hz～500Hz，10"～360°的角位移计灵敏度和相位延迟的校准。

Calibration specification for angular vibration transducers

GJB 6194-2008 力敏传感器开关通用规范

本规范规定了力敏传感器开关的通用技术要求、质量保证规定、交货准备及说明事项等的一般要求。 本规范适用于军用两轴向（X-Y）操作杆类型的力敏传感器开关（以下简称传感器开关）。其他固态传感器开关也可参照使用。

General specification for switches of force transducer/sensors

ASTM F1349-08 从微波传感器中提取的非挥发紫外线(UV)吸收可萃取物的试验方法

1.1 This test method covers the determination of nonpolar and relatively polar ultraviolet (UV) absorbing components that may migrate from microwave susceptor packaging into food simulants, such as corn oil and Miglyol 812. 1.2 This test method has been collaboratively studied using bilaminate susceptors constructed of paperboard, adhesive, and a layer of polyethylene terephthalate polymer (PETE) susceptor. Adhesive and PETE related compounds were quantitated using this test method. 1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific warning statements are given in 4.3.2.3.

Standard Test Method for Nonvolatile Ultraviolet (UV) Absorbing Extractables from Microwave Susceptors

JEDEC JESD22-A122-2007 动力循环

In typical use, the on and off power cycles of functional devices will produce non-uniform temperature distributions within package components as well as between the package and interconnected hardware such as printed wiring boards (PWB), sockets, or heat sinks. The stresses that result from the temperature gradients found in actual product may or may not be accurately simulated by use of isothermal temperature cycling. This test method is a characterization tool which can augment and supplement results obtained with the isothermal chamber-based temperature cycling described in both JESD22-A104 and JESD22-A105. It should be used as an alternative to JESD22-A104 or JESD22-A105 only if such substitution can be technically justified. The test method uses a powered device, a thermal chip or an external heat source to simulate temperature cycling effects on the component package and its materials, including solder joints in free-standing and assembled configurations. Unlike either JESD22-A104 or JESD22-A105, the power cycles described in this test method are intended to simulate the range of usage conditions found from the vicinity of room ambient up to Tj maximum for the device, and are not specifically intended as a highly accelerated test or to apply to harsh application conditions such as those used to simulate some under-hood or aerospace environments.

Power Cycling

JEDEC JESD22-A114E-2007 静电放电敏感试验.人体模式

This method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic Human Body Model (HBM) discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed.

Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)

ASTM C1130-07(2012) 微型热流量传感器校准的标准实施规程

4. Significance and UseTop Bottom 4.1 The use of heat flux transducers on building envelope components provides the user with a means for performing in-situ heat flux measurements. Accurate translation of the heat flux transducer output requires a complete understanding of the factors affecting its output, and a standardized method for determining the heat flux transducer sensitivity for the application of interest. 4.2 The sensitivity of the heat flux transducer is determined primarily by the sensor construction and temperature of operation and the details of the application, including geometry, material characteristics, and environmental factors.Note 1???Practice C1046 includes an excellent description of heat flux transducer construction. 4.3 The presence of a heat flux transducer is likely to alter the heat flux that is being measured. To determine the heat flow that would occur in the absence of the transducer, it is necessary to either: 4.3.1 Ensure that the installation is adequately guarded (1).3 4.3.2 Adjust the results based on a detailed model or numerical analysis. Such analysis is beyond the scope of this practice, but details can be found in (2-6). 4.3.3 Use the empirically measured heat flux transducer sensitivity measured under conditions that adequately simulate the conditions of use in the final application. 4.4 There are several methods for determining the sensitivity of heat flux transducers, including Test Methods C177, C518, C1114, and C1363. The selection of the appropriate procedure will depend on the required accuracy and the physical limitations of available equipment. 4.5 This practice describes techniques to establish uniform heat flow normal to the heat flux transducer for the determination of the heat flux transducer sensitivity.

Standard Practice for Calibrating Thin Heat Flux Transducers

KS C IEC 61643-331:2006 低压电涌保护装置用元件.第331部分:金属氧化物压敏电阻(MOV)规范

이 규격은 산화 금속 배리스터(MOV)에 대한 시험 요구 조건을 규정하며, 교류 1 000

Components for low－voltage surge protective devices－Part 331：Specification for metal oxide varistors(MOV)

SJ 20960-2006 光纤速度传感器通用规范

本规范规定了光纤速度传感器的要求、质量保证规定、交货准备和说明事项。 本规范适用于测量运动物线速度的光纤速度传感器（以下简称传感器），其他类似传感器也可参照采用。

General specification for fiber optical speed sensor

ISO 16063-15:2006 振动和冲击传感器的校准方法.第15部分:用激光干涉法的初级角振动校准

This part of ISO 16063 specifies the instrumentation and procedures used for primary angular vibration calibration of angular transducers, i.e. angular accelerometers, angular velocity transducers and rotational angle transducers (with or without amplifier) to obtain the magnitude and the phase shift of the complex sensitivity by steady-state sinusoidal vibration and laser interferometry. The methods specified in this part of ISO 16063 are applicable to measuring instruments (rotational laser vibrometers in particular) and to angular transducers as defined in ISO 2041 for the quantities of rotational angle, angular velocity and angular acceleration. It is applicable to a frequency range from 1 Hz to 1,6 kHz and a dynamic range (amplitude) from 0,1 rad/s2 to 1 000 rad/s2 (frequency-dependent). These ranges are covered with the uncertainty of measurement specified in Clause 3. Calibration frequencies lower than 1 Hz (e.g. 0,4 Hz, which is a reference frequency used in other International Standards) and angular acceleration amplitudes smaller than 0,1 rad/s2 can be achieved using method 3A or method 3B specified in this part of ISO 16063, in conjunction with an appropriate low-frequency angular vibration generator. Method 1A (cf. Clause 8: fringe-counting, interferometer type A) and method 1B (cf. Clause 8: fringe-counting, interferometer type B) are applicable to the calibration of the magnitude of complex sensitivity in the frequency range of 1 Hz to 800 Hz and under special conditions, at higher frequencies. Method 2A (cf. Clause 9: minimum-point method, interferometer type A) and method 2B (cf. Clause 9: minimum-point method, interferometer type B) can be used for sensitivity magnitude calibration in the frequency range of 800 Hz to 1,6 kHz. Method 3A (cf. Clause 10: sine-approximation method, interferometer type A) and method 3B (cf. Clause 10: sine-approximation method, interferometer type B) can be used for magnitude of sensitivity and phase calibration in the frequency range of 1 Hz to 1,6 kHz. Methods 1A, 1B and 3A, 3B provide for calibrations at fixed angular acceleration amplitudes at various frequencies. Methods 2A and 2B require calibrations at fixed rotational angle amplitudes (angular velocity amplitude and angular acceleration amplitude vary with frequency).

Methods for the calibration of vibration and shock transducers - Part 15: Primary angular vibration calibration by laser interferometry

BS EN 60738-1:2006 热敏电阻器 直热式正温度系数 总规范

This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

Thermistors - Directly heated positive temperature coefficient - Part 1: Generic specification

BS EN 60738-1:2006+A1:2009 热敏电阻器.直热式正温度系数.总规范

This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

Thermistors - Directly heated positive temperature coefficient - Generic specification

JIS C 62025-1:2006 高频感应部件.非电气特性和测量方法.第1部分:电子和电信设备用固定表面安装的感应器

この規格は，電子機器通信機器用の表面実装固定ィンダクタ(以下,インダクタという。)の非電気特性及びその測定方法について規定する。

High frequency inductive components -- Non-electrical characteristics and measuring methods -- Part 1: Fixed, surface mounted inductors for use in electronic and telecommunication equipment

JIS C 62024-1:2006 高频感应部件.电气特性和测量方法.第1部分:毫微亨(利)瑕庇的感应器

この規格は，通常，高周波(100kHz以上)の範囲で使用するナノへンリー範囲の表面実装ィンダクタ(以下,インダクタという。)の電気的特性及びその測定方法について規定する。

High frequency inductive components -- Electrical characteristics and measuring methods -- Part 1: Nanohenry range chip inductor

NF C93-272-1:2006 直热式负温度系数热敏电阻.第1部分:一般规范

Directly heated negative temperature coefficient thermistors - Part 1 : Generic specification.

IEC 60454-3-8:2006 电工用压敏胶粘带.第3部分:单项材料规范.活页8:涂有基于玻璃纤维、醋酯纤维素或组合有粘胶纤维的压敏胶粘剂的编织纤维带

This sheet of IEC 60454-3 contains the requirements for - glass fabric tapes with pressure-sensitive adhesive, - cellulose acetate woven fabric tapes with rubber thermosetting adhesive, - combined cellulose-viscose woven fabric tapes, one side covered with a thermoplastic material, the other side with thermosetting adhesive. Materials which conform to this specification meet established levels of performance. However, the selection of a material by a user for a specific application should be based on the actual requirements necessary for adequate performance in that application, and not based on this specification alone.

Pressure-sensitive adhesive tapes for electrical purposes - Part 3: Specifications for individual materials - Sheet 8 - Woven fabric tapes with pressure-sensitive adhesive based on glass, cellulose acetate alone or combined with viscose fibre

JIS C 2570-1:2006 直热式负温度系数热敏电阻.第1部分:一般规范

この規格は，半導体特性をもつ遷移金属酸化物によって作られる直熱形NTCサーミスタの形式別通則及び個別規格で使用する用語及び試験方法について規定する。備考 この規格の対応国際規格を，次に示す。なお，対応の程度を表す記号は，ISO/IEC Guide 21に基づき， IDT(一致している)，MOD（修正している），NEQ(同等でない)とする。

Directly heated negative temperature coefficient thermistors -- Part 1: Generic specification

DLA MIL-T-49447 VALID NOTICE 2-2006 电阻温度传感器

The activities above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http://assist.daps.dla.mil.

TEMPERATURE SENSOR, RESISTANCE

DIN 16086:2006 电动压力测量仪器.压力传感器、压力测量仪.数据单的概念、规范

This standard deals with electrical pressure measuring instruments transforming the measured value of pressure into an electrical quantity. The standard shall determin uniform terms and definitions allowing the camparison of technical data.

Electrical pressure measuring instruments - Pressure transmitters, pressure measuring instruments - Concepts, specifications on data sheets

DLA SMD-5962-91631 REV A-2006 硅单块 时间传感器,直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN

MICROCIRCUIT, LINEAR, TIMER, MONOLITHIC SILICON