共找到 223 条与 半导体二极管 相关的标准,共 15 页
Transistor capacitances are usually measured on two-terminal capacitance or impedance bridges. When the capacitances are in the low picofarad ranges, this two terminal measurement is not very accurate or reproducible. The stray capacitances to ground are of the same order of magnitude as the quantities being measured and vary with mechanical changes in the surrounding ground planes.
Measurement of Small Values of Transistor Capacitance
Measurement of Small-Signal Transistor Scattering Parameters
Measurement of Small-Signal Transistor Scattering Parameters
This specification covers the detail requirements for a Silicon Avalanche Rectifier Diode and is in accordance with K1007. Issue 3. except as otherwise stated.
Detail specification for silicon avalanche rectifier diodes
Specifies the ratings, characteristics and test requirements for a general purpose signal diode in general application category (Q) of semiconductor devices of assessed quality. This diode may be expected to operate in many circuits for which the CV8790 has previously been specified.
Detail specification for general purpose silicon signal diodes - 150 mA, 150 V, hermetically sealed, glass encapsulation - General application category Q
This specification oovers the detail requireaents for Silicon Coaxial Mixer Diodes and is in accordance with Specification K1OO7, Issue 3, except where otherwise stated.
Detail specifications for silicon coaxial mixer diodes
The matched pair consists of one C776 and one C777.
Detail specification for a matched pair of germanium coaxial mixer diodes
This specification covers the detail requirements for germanium coaxial mixer diodes and is in accordance with Specification K1007, Issue 3, except where otherwise stated.
Detail specification for germanium coaxial mixer diodes
This specification covers the detail requirements for a Coaxial Mixer Diode and is in accordance with K1007, Issue 3, except as otherwise stated.
Detail specification for coaxial mixer diodes
This Specification covers the detail requirements for a Silicon Coaxial Resistive Switching Diode and is in accordance with K1007 except where otherwise stated.
Detail specification for silicon coaxial resistive switching diode
This specification covers the detail requirements for microwave Silicon Switching Diodes Rod Mounted. The diodes are unencapsulated and not tested for moisture resistance and are in accordance with K1007, except as otherwise stated.
Detail specification for silicon microwave switching diode, rod mounted
Detail specification for mixer diodes for use at X-band frequencies
Detail specification for silicon voltage regulator diodes
This Specification covers the detail requirements for Silicon Voltage-Regulator Diodes, and is in accordance with K1007, except as otherwise stated.
Detail specifications for silicon voltage-regulator diodes
Electronic parts of assessed quality —Silicon voltage-regulator diodes Figure 1 —Power derating Figure 2 Table Ⅰ —Group A Inspection Table Ⅱ —Group B Inspection Table Ⅲ —Group C Inspection
Detail specification for silicon voltage-regulator diodes
This specification covers the detail requirements for Silicon Voltage Regulator Diodes and is in accordance with K1OO7, Issue 3, except as otherwise stated.
Detail specification for silicon voltage regulator diodes
This specification covers the detail requirements for Silicon Voltage Regulator diodes and is in accordance with K 1007 Issue 3 except as otherwise stated.
Detail specification for silicon voltage regulator diodes
The measuring system must provide a means for applying bias to the transistor under test. The bias system must be such as not to influence the accuracy of the measurements.
Measurement of Small-Signal VHF-UHF Transistor Admittance Parameters
The measuring system must provide a means for applying bias to the transistor under test. The bias system must be such as not to influence the accuracy of the measurements. The signal applied by the measuring system to the transistor must be sufficiently smail to satisfy the “small-signal conditions” defined in 1.2. In addition, any spurious signals which might appear at the transistor terminals, and in particular, the local oscillator feedthrough when a superheterodyne receiver is used, must be kept at least 20 dB * below the specified small-signal conditions.
Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio
The following noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a 1 /f (power inversely proportional to frequency) power distribution.
Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies up to 20 kHz, Measurement of
The following noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution.
Transistor Noise Figure at Frequencies up to 20 kHz by Sinusoidal Signal-Generator Method, Measurement of
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