L55 微电路综合 标准查询与下载



共找到 926 条与 微电路综合 相关的标准,共 62

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

ICS
CCS
L55
发布
2007-04-11
实施

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
CCS
L55
发布
2007-04-10
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 32K x 8 EEPROM, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-29
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, DUAL, HIGH PRECISION, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-19
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, RADIATION HARDENED, FOUR CHANNEL PROGRAMMABLE, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-16
实施

This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition.

INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR

ICS
31.200
CCS
L55
发布
2007-03-16
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, RADIAITION HARDENED, UNCOMPENSATED, HIGH SLEW RATE, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-15
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, FOUR CHANNEL SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

ICS
CCS
L55
发布
2007-03-14
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, HEX INVERTER BUFFERS/DRIVERS WITH OPEN-COLLECTOR HIGH-VOLTAGE OUTPUTS, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-08
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, LINE DRIVERS, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-05
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, CHOPPER STABILIZED, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-03-01
实施

This standard stipulates the general requirements for drafting design guides of integrated circuit packages (hereafter referred to as design guide).

Manual for preparation of design guides of integrated circuits packages

ICS
CCS
L55
发布
2007-03
实施

This Design guide for semiconductor packages defines the general outline drawings, dimensions and tolerances for Fine-pitch Ball Grid Array (FBGA) packages and Fine-pitch Land Grid Array (FLGA) packages without regard to the package structures or materials. Being reduced-pitch version of Ball Grid Array (BGA) packages and Land Grid Array (LGA) packages, FBGA and FLGA are categorized as Form-D in "Recommended practice on standard for the preparation of outline drawings of semiconductor packages", JEIT A ED-7300, with the terminal pitch of 0.8 mm or less.

Design guideline of integrated circuits for Fine-pitch Ball Grid Array and Fine-pitch Land Grid Array

ICS
CCS
L55
发布
2007-03
实施

This standard stipulates the requirements for drafting individual standards of integrated circuit packages (hereafter referred to as individual standard).

Manual for preparation of individual standards of integrated circuits packages

ICS
CCS
L55
发布
2007-03
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, HIGH SPEED, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-02-27
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS 256K X 1 SRAM, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-02-23
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, PRECISION, SINGLE SUPPLY OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-02-21
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, +2.5 V LOW POWER, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-02-21
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, RAIL-TO-RAIL, DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

ICS
CCS
L55
发布
2007-02-20
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) space application (device class V).

MICROCIRCUIT, DIGITAL, BIPOLAR, BCD-TO-SEVEN-SEGMENT DECODER/DRIVER MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2007-02-12
实施



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