L55 微电路综合 标准查询与下载

DIN EN 62496-1:2009 光学电路板.第1部分:概述(IEC 62496-1-2008).德文版本EN 62496-1-2009

Optical circuit boards - Part 1: General (IEC 62496-1:2008); German version EN 62496-1:2009

IEC 47A/808/CD:2009 IEC/TS 62433-1,Ed.1:EMC IC建模.第1部分:通用建模框架

IEC/TS 62433-1, Ed. 1: EMC IC Modelling - Part 1: General modelling framework

ANSI/IEEE 1801:2009 低功耗集成电路的设计和验证标准

The standard provides portability of low power design specifications that can be used with a variety of commercial products throughout an electronic system design, analysis, verification and implementation flow.

Standard for Design and Verification of Low Power Integrated Circuits

IEC 62433-2:2008 EMC IC建模.第2部分:EMI动作模拟用集成电路模型.传导发射建模(ICEM-CE)

This part of IEC 62433 specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: ~ conducted emissions through power supply terminals and ground reference structures; ~ conducted emissions through input/output (1/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted Emissions modelling (ICEM-CE)

DLA SMD-5962-92318 REV A-2007 硅单片,过压通感电路,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, UNDERVOLTAGE SENSING CIRCUIT, MONOLITHIC SILICON

DLA SMD-5962-89981 REV F-2007 硅单片,可调节正稳压器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, POSITIVE REGULATOR, ADJUSTABLE, MONOLITHIC SILICON

DLA SMD-5962-90813 REV C-2007 硅单块 场致发光的行设备,直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V).

MICROCIRCUIT, LINEAR, ELECTROLUMINESCENT ROW DRIVERS, MONOLITHIC SILICON

DLA SMD-5962-89641 REV D-2007 硅单片,宽带快速建立,单位增益稳定型运算放大器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, FAST SETTLING, UNITY-GAIN STABLE, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-89809 REV C-2007 硅单片,宽带双通道倍增器/驱动器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, WIDEBAND, DUAL-CHANNEL MULTIPLIER / DIVIDER MONOLITHIC SILICON

DLA SMD-5962-87739 REV H-2007 硅单片辐射硬化电压比较器四方线性微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON

DLA SMD-5962-89928 REV B-2007 硅单片,装有256 X 24调色板三重8位直流/交流转变器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, TRIPLE 8-BIT, D/A CONVERTER WITH A 256 X 24 COLOR PALETTE, MONOLITHIC SILICON

DLA SMD-5962-98613 REV G-2007 微型电路,线型,辐射加固,四路电压比较器,单块硅

This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer’s Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.

MICROCIRCUIT, LINEAR, RADIATION HARDENED, QUAD VOLTAGE COMPARATOR, MONOLITHIC SILICON

DLA SMD-5962-99551 REV B-2007 微型电路,线型,辐射加固,正极,稳压器,单块硅

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, RADIATION HARDENED, POSITIVE, VOLTAGE REGULATOR, MONOLITHIC SILICON

DLA SMD-5962-89896 REV C-2007 硅单片,低压低功率准确运算放大器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, PRECISION, LOW POWER, LOW VOLTAGE, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-90536 REV B-2007 硅单片,双重高速电流反馈运算放大器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, DUAL HIGH SPEED CURRENT FEEDBACK OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-89824 REV C-2007 硅单片,5伏特电压基准,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, 5.0 VOLTS, VOLTAGE REFERENCE, MONOLITHIC SILICON

DLA SMD-5962-89974 REV D-2007 硅单片,高速输出有钳位运算放大器,线性微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, HIGH SPEED, OUTPUT CLAMPING, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-98639 REV D-2007 微型电路,线型,辐射加固,超低失调运算放大器,单块硅

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, RADIATION HARDENED, ULTRA-LOW OFFSET VOLTAGE OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

DLA SMD-5962-94636 REV A-2007 硅单片,准确电压基准,线性微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON

DLA SMD-5962-92167 REV B-2007 硅单块 逐渐增加稳压器12瓦特固定正极直线式微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, POSITIVE, FIXED, 12 VOLT, STEP-UP VOLTAGE REGULATOR, MONOLITHIC SILICON