L55 微电路综合 标准查询与下载
共找到 926 条与 微电路综合 相关的标准，共 62 页
本规范规定了编制膜集成电路和混合膜集成电路（采用鉴定批准程序）详细规范的基本原则。
Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
- ICS
- 31.200
- CCS
- L55
- 发布
- 1991-07-06
- 实施
- 1992-03-01
本标准规定了膜集成电路和混合膜集成电路的术语。 本标准适用于膜集成电路和混合膜集成电路的生产、使用、科研、教学和贸易。
Terminology for film integrated circuits and hybrid film integrated circuits
- ICS
- 31.200
- CCS
- L55
- 发布
- 1991-04-28
- 实施
- 1991-12-01
General principle of measuring methods of microprocessors and peripheral interface circuits' parameters for semiconductor integrated circuits
- ICS
- 31.200
- CCS
- L55
- 发布
- 1991-04-28
- 实施
- 1991-12-01
本分规范适用于已封装的半导体集成电路，包括多片集成电路，但不包括混合电路。
Sectional specification for semiconductor integrated circuits,excluding hybrid circuits
- ICS
- 31.200
- CCS
- L55
- 发布
- 1991-03-21
- 实施
- 1991-11-01
本分规范适用于按标准产品或定制产品而制造的，其质量是以鉴定批准为基础评定的膜集成电路和混合膜集成电路。
Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
- ICS
- 31.200
- CCS
- L55
- 发布
- 1989-03-31
- 实施
- 1990-04-01
Blank detail specification of packages for semiconductor integrated circuits
- ICS
- CCS
- L55
- 发布
- 1989-03-31
- 实施
本标准规定了半导体集成电路型号的命名方法。 本标准适用于按半导体集成电路系列和品种的国家标准所生产的半导体集成电路（以下简称器件）。
The rule of type designation for semiconductor integrated circuits
- ICS
- 31.200
- CCS
- L55
- 发布
- 1989-03-31
- 实施
- 1990-04-01
本标准规定了集成电路的生产制造、工程应用和贸易等中使用的基本术语。 本标准适用于与集成电路有关的生产、工程、科研、教学和贸易等。
Terminology for integrated circuits
- ICS
- 31.200
- CCS
- L55
- 发布
- 1988-05-19
- 实施
- 1988-10-01
Micro electromechanical system technology—General rules for the assessment of microgeometrical parameters
- ICS
- CCS
- L55
- 发布
- 实施
Semiconductor Integrated Circuit Hardware Trojan Horse Detection Method
- ICS
- CCS
- L55
- 发布
- 2021-11-22
- 实施
- 2022-02-01
MEMS device mechanical shock test method
- ICS
- CCS
- L55
- 发布
- 2021-11-22
- 实施
- 2022-02-01
Ground and power supply impedance test methods for microelectronic device packages
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
Semiconductor integrated circuit voltage comparator test method
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
IP core quality information description method
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
Power Motor Driver Test Methods
- ICS
- 31.02
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
Test method for crosstalk characteristics of digital microelectronic device packaging
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
Test method for digital signal transmission characteristics of microelectronic packages
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
Semiconductor integrated circuit field programmable gate array testing method
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
IP Core Testability Design Guide
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
Microwave circuit model naming method
- ICS
- 31.2
- CCS
- L55
- 发布
- 2018-02-09
- 实施
- 2018-04-01
