L56 半导体集成电路 标准查询与下载
共找到 2092 条与 半导体集成电路 相关的标准，共 140 页
Gigabit Ethernet Control Plane on VPX
- ICS
- 31.200;35.160
- CCS
- L56
- 发布
- 2013-01-01
- 实施
IEC/TS 62132-9, Ed. 1: Integrated circuits, measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-01
- 实施
Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. IC stripline method
- ICS
- 31.200;33.100.20
- CCS
- L56
- 发布
- 2012-10-31
- 实施
- 2012-10-31
Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan methodIntegrated circuits (IEC 47A/880/CD:2012)
- ICS
- 31.200
- CCS
- L56
- 发布
- 2012-05
- 实施
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011); German version EN 61967-8:2011
- ICS
- 31.200
- CCS
- L56
- 发布
- 2012-04
- 实施
- 2012-04-01
Standardizes the implementation of the PCI Express Fabric in the VITA46 environment and define the mapping of the PCI Express Links on the VPX Connector.
PCIExpress on the VPX Fabric Connector
- ICS
- 35.160;35.200
- CCS
- L56
- 发布
- 2012-01-01
- 实施
The objectives of this standard are to assign Serial RapidIO ports to the VPX P1/J1 connector and to provide rules and recommendations for the use of the assigned Serial RapidIO ports.
Serial RapidIO on VPX Fabric Connector
- ICS
- 35.160;35.200
- CCS
- L56
- 发布
- 2012-01-01
- 实施
本规范规定了半导体集成电路（在不产生混淆时，以下简称器件）的通用要求，包括器件应满足的质量和可靠性保证要求，承制方列入合格制造厂目录（QML）应满足的要求。本规范规定了V级、Q级、T级、N级（塑封器件）四个产品质量保证等级。 本规范是以过程基线的认证为依据，从设计、晶圆制备、封装等各个工艺过程提出具体要求，强调工艺在线监控、统计过程控制（SPC）等，以保证器件的质量和可靠性。 本规范适用于半导体集成电路，包括单片集成电路和多片集成电路。
General specification for semiconductor integrated circuits of qualitied manufacturer certification
- ICS
- CCS
- L56
- 发布
- 2011-12-25
- 实施
- 2012-04-01
이 표준은 제품 데이터의 표현과 교환을 규정하는 표준 KS B ISO 10303의 개요를
Industrial automation systems and integration－Product data representation and exchange－Part 1：Overview and fundamental principles
- ICS
- 25.040.40
- CCS
- L56
- 发布
- 2011-12-22
- 实施
- 2011-12-22
Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. IC stripline method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-11-30
- 实施
- 2011-11-30
Integrated circuits - Measurement of electromagnetic immunity - Part 2 : measurement of radiated immunity - TEM cell and wideband TEM cell method.
- ICS
- 31.200;33.100.20
- CCS
- L56
- 发布
- 2011-11-01
- 实施
- 2011-11-12
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009); German version EN 60747-16-4:2004 + A1:2011
- ICS
- 31.080.99
- CCS
- L56
- 发布
- 2011-08
- 实施
- 2011-08-01
本标准规定了民用卫星导航接收机(以下简称导航接收机)基带处理集成电路的技术要求及测试方法。 本标准适用于民用卫星导航接收机基带处理集成电路（以下简称基带处理集成电路）的研制、生产、采购、性能测试和评价。
Performance requirements and test methods for baseband processing chip of GNSS receiver
- ICS
- CCS
- L56
- 发布
- 2011-07-19
- 实施
- 2011-10-01
本标准规定了民用卫星导航接收机射频集成电路（以下简称集成电路）的总体架构、技术要求和测试方法等。 本标准适用于民用卫星导航接收机及兼容接收系统使用的射频集成电路的研制、生产、采购、性能测试与评估。
Performance requirements and test methods for REIC of GNSS receiver
- ICS
- CCS
- L56
- 发布
- 2011-07-19
- 实施
- 2011-10-01
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-07
- 实施
- 2011-07-01
EMC IC modelling. General modelling framework
- ICS
- 31.200;33.100.20
- CCS
- L56
- 发布
- 2011-06-30
- 实施
- 2011-06-30
This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. TEM cell and wideband TEM cell method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-04-30
- 实施
- 2011-04-30
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
- ICS
- 31.080.99
- CCS
- L56
- 发布
- 2011-04
- 实施
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:200
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-02
- 实施
