N78 Ｘ射线、磁粉、荧光及其他探伤仪器 标准查询与下载

JB/T 11234-2011 无损检测仪器.工业软X射线探伤机

本标准规定了软X射线探伤机的主参数系列、型号编制方法、技术要求、试验方法和检验规则等。 本标准适用于采用铍窗外封接的软X射线管，管电压为10kV～100 kV，额定电源电压为220V，频率为50Hz完全防电击软X射线探伤机（以下简称X射线机）。

Non-destructive testing instruments.Industry soft X-ray apparatus

JB/T 9394-2011 无损检测仪器.X射线应力测定仪技术条件

本标准规定了X射线应力测定仪的技术要求、检验方法、检验规则及标志、包装、运输与贮存。 本标准适用于机械扫描式X射线应力测定仪（以下简称应力仪）。其他类型应力仪的相应部分也可参照采用。

Non-destructive testing instruments.Specifications for the X-ray stressometers

JB/T 8290-2011 无损检测仪器.磁粉探伤机

本标准规定了磁粉探伤机（以下简称探伤机）的技术要求、检验方法、检验规则和标志与包装。 本标准适用于交流、直流、半波整流及全波整流的探伤机，不适用于磁轭式磁粉探伤仪。

Non-destructive testing instruments.Magnetic particle flaw detectors

JB/T 6220-2011 无损检测仪器.射线探伤用密度计

本标准规定了射线探伤用密度计（以下简称密度计）的产品型号、要求、试验方法、检验规则和标志、包装、运输、贮存等内容。 本标准适用于光透式射线探伤用密度计。

Non-destructive testing instruments.The densimeter for radiography

JB/T 6215-2011 无损检测仪器.工业X射线管系列型谱

本标准规定了工业用X射线管的分类和系列型谱。 本标准适用于工业用X射线管（包括材料探伤用、结构分析用、荧光光谱分析用、测厚用X射线管系列）。

Non-destructive testing instruments.The series typal table to industrial X-ray tube

JB/T 5482-2011 X射线晶体定向仪

本标准规定了X射线晶体定向仪（以下简称定向仪）的要求，试验方法、检验规则以及标志、包装、运输和贮存的基本要求。 本标准适用于各种单晶、双晶衍射型定向仪。

X-ray orientation apparatus

JB/T 5453-2011 无损检测仪器.工业X射线图像增强器成像系统

本标准规定了工业X射线图像增强器成像系统的要求、试验方法、检验规则和标志、包装、运输、贮存等内容。 本标准适用于工业X射线图像增强器成像系统（以下简称系统）。

Non-destructive testing instruments.Industrial X-ray image intensifer imaging system

ISO 16526-1:2011 无损检测.X射线管电压的测量与评价.第1部分:电压分压器方法

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method

DIN EN 16016-1:2011 非破坏性试验.辐射方法.计算机断层扫描.第1部分:术语.三种语言版本 EN 16016-1-2011

Non destructive testing - Radiation methods - Computed tomography - Part 1: Terminology; Trilingual version EN 16016-1:2011

ISO 16526-2:2011 无损检测.X射线管电压的测量与评价.第2部分:用后过滤器的恒定校验方法

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2: Constancy check by the thick filter method

ISO 16526-3:2011 无损检测.X射线管电压的测量与评价.第3部分:频谱方法

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3: Spectrometric method

ISO 16371-1:2011 无损检测.存储式磷成像板工业计算机射线照相.第1部分:系统分类

Non-destructive testing - Industrial computed radiography with storage phosphor imaging plates - Part 1: Classification of systems

JJF 1306-2011 X射线荧光镀层测厚仪校准规范

本规范适用于X射线荧光镀层测厚仪的校准。

Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments

JJG 40-2011 X射线探伤机检定规程

本规程适用于额定管电压≤450kV的X射线探伤机的首次检定、后续检定和使用中检验。

Verification Regulation of X-ray Flaw Detectors

JJG 1067-2011 医用诊断数字减影血管造影（DSA）系统X射线辐射源检定规程

本规程适用于医用诊断数字减影血管造影（Medical Digital Subtraction Angiography）(简称DSA)系统X射线辐射源的首次检定、后续检定和使用中检查。

Verification Regulation of Medical Diagnostic X-ray Radiation Source for Medical Digital Subtraction Angiography

JJF 1273-2011 磁粉探伤机校准规范

本规范适用于交流、直流（半波整流或全波整流）磁粉探伤机（以下简称探伤机）的校准。本规范不适用于电磁轭探伤机（仪）、旋转磁场探伤机（仪）等磁轭式磁粉探伤机（仪）的校准。

Calibration Specification for Magnetic Particle Flaw Detectors

JJF 1275-2011 X射线安全检查仪校准规范

本规范适用于X射线安全检查仪（以下简称安检仪）的校准,不适用于便携式X射线安检仪和大型集装箱X射线检查系统的校准。

Calibration Specification for X-ray Security Inspection Equipment

ASTM F1467-11 半导体装置及集成电路电离辐射效应X射线测试仪(≈10 keV光子量)的标准使用指南

Electronic circuits used in many space, military and nuclear power systems may be exposed to various levels of ionizing radiation dose. It is essential for the design and fabrication of such circuits that test methods be available that can determine the vulnerability or hardness (measure of nonvulnerability) of components to be used in such systems. Manufacturers are currently selling semiconductor parts with guaranteed hardness ratings, and the military specification system is being expanded to cover hardness specification for parts. Therefore test methods and guides are required to standardize qualification testing. Use of low energy (≈10 keV) X-ray sources has been examined as an alternative to cobalt-60 for the ionizing radiation effects testing of microelectronic devices (3, 4, 5, 6). The goal of this guide is to provide background information and guidance for such use where appropriate. Note 38212;Cobalt-60The most commonly used source of ionizing radiation for ionizing radiation (“total dose”) testing is cobalt-60. Gamma rays with energies of 1.17 and 1.33 MeV are the primary ionizing radiation emitted by cobalt-60. In exposures using cobalt-60 sources, test specimens must be enclosed in a lead-aluminum container to minimize dose-enhancement effects caused by low-energy scattered radiation (unless it has been demonstrated that these effects are negligible). For this lead-aluminum container, a minimum of 1.5 mm of lead surrounding an inner shield of 0.7 to 1.0 mm of aluminum is required. (See 8.2.2.2 and Practice E1249.) The X-ray tester has proven to be a useful ionizing radiation effects testing tool because: It offers a relatively high dose rate, in comparison to most cobalt-60 sources, thus offering reduced testing time. The radiation is of sufficiently low energy that it can be readily collimated. As a result, it is possible to irradiate a single device on a wafer. Radiation safety issues are more easily managed with an X-ray irradiator than with a cobalt-60 source. This is due both to the relatively low energy of the photons and due to the fact that the X-ray source can easily be turned off. X-ray facilities are frequently less costly than comparable cobalt-60 facilities. The principal radiation-induced effects discussed in this guide (energy deposition, absorbed-dose enhancement, electron-hole recombination) (see Appendix X1) will remain approximately the same when process changes are made to improve the performance of ionizing radiation hardness of a part that is being produced. This is the case as long as the thicknesses and compositions of the device layers are substantially unchanged. As a result of this insensitivity to process variables, a 10-keV X-ray tester is expected to be an excellent apparatus for process improvement and control. Several published reports have indicated success in intercomparing X-ray and cobalt-60 gamma irradiations using corrections for dose enhancement and for electron-hole recombination. Other reports have indicated that the present understanding of the physical effects is not adequate to explain experimental results. As a result, it is not fully certain that the differences between the effects of X-ray and cobalt-60 gamma irradiation are adequately understood at this time. (See 8.2.1 and Appendix X2.) Because of this possible failure of understanding of the photon energy dependence of radiation effects, if a 10-keV X-ray tester is to be used for qualification testing or lot acceptance testing, it is recommended that such tests should ..........

Standard Guide for Use of an X-Ray Tester (x2248;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

JB/T 7808-2010 无损检测仪器工业X射线探伤机主参数系列

本标准规定了500kV以下携带式工业X射线探伤机和固定式(移动式)工业X射线探伤机主参数和主参数系列。 本标准适用于设计、制造X射线机时选定主参数数值。

Non-destructive testing instruments Main parameter series for the industrial X-ray equipment

JB/T 8387-2010 无损检测仪器 工业用X射线管主参数

本标准规定了500kV以下工业用X射线管主参数和主参数数值。 本标准适用于设计、制造工业用定向、周向X射线管时选定的主要技术参数数值。

Non-destructive testing instruments.Main parameter for the industrial detection X-ray tube