This International Standard gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA); any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative. The correct identification of all elements present in the specimen is a necessary part of quantitative analysis and is therefore considered in this International Standard. This International Standard provides guidance on the various approaches and is applicable to routine quantitative analysis of mass fractions down to 1 %, utilizing either reference materials or “standardless” procedures. It can be used with confidence for elements with atomic number Z > 10. Guidance on the analysis of light elements with Z < 11 is also given. NOTE With care, mass fractions as low as 0,1 % are measurable when there is no peak overlap and the relevant characteristic line is strongly excited. This International Standard applies principally to quantitative analyses on a flat polished specimen surface. The basic procedures are also applicable to the analysis of specimens that do not have a polished surface but additional uncertainty components will be introduced. There is no accepted method for accurate quantitative EDS analysis of light elements. However, several EDS methods do exist. These are the following: Measuring peak areas and comparing intensities in the same way as for heavier elements. For the reasons explained in Annex D, the uncertainty and inaccuracy associated with the results for light elements will be greater than for the heavier elements. b) Where the light element is known to be combined stoichiometrically with heavier elements (Z > 10) in the specimen, its concentration can be determined by summing the appropriate proportions of concentrations of the other elements. This is often used for the analysis of oxygen in silicate mineral specimens. c) Calculation of concentration by difference where the light element percentage is 100 % minus the percentage sum of the analysed elements. This method is only possible with good beam-current stability and a separate measurement of at least one reference specimen and it requires very accurate analysis of the other elements in the specimen. a) Annex D summarizes the problems of light element analysis, additional to those that exist for quantitative analysis of the heavier elements. If both EDS and wavelength spectrometry (WDS) are available, then WDS can be used to overcome the problems of peak overlap that occur with EDS at low energies. However, many of the other issues are common to both techniques.
ISO 22309:2011由国际标准化组织 IX-ISO 发布于 2011-10。
ISO 22309:2011 在中国标准分类中归属于: N55 其他物质成份分析仪器。
* 在 ISO 22309:2011 发布之后有更新,请注意新发布标准的变化。
另一种能量色散EDS的荧光法常与扫描电镜联用EDS是半定量分析,误差一般在5%~10%左右,是自动判断出元素后需要根据样品,人为的添加或去除某些不可能存在的元素,如果元素一点都没有显示也是0,这个还是具有一点的参考值,EDS是利用电子激发原子内层电子产生空位,更高原子能级电子跃迁产生特征X射线,从而进行元素分析。...
另一种能量色散EDS的荧光法常与扫描电镜联用 EDS是半定量分析,误差一般在5%~10%左右,是自动判断出元素后需要根据样品,人为的添加或去除某些不可能存在的元素,如果元素一点都没有显示也是0,这个还是具有一点的参考值,EDS是利用电子激发原子内层电子产生空位,更高原子能级电子跃迁产生特征X射线,从而进行元素分析。...
Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号