31.200 集成电路、微电子学 标准查询与下载
共找到 3188 条与 集成电路、微电子学 相关的标准，共 213 页
Technical requirements for the quality of integrated circuit metal packaging casings
- ICS
- 31.200
- CCS
- L55
- 发布
- 2023-12-28
- 实施
- 2024-07-01
Guideline for analog/mix-signal intellectual property(IP) core document structure
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Analog/Mixed-Signal Intellectual Property (IP) Core Deliverable Requirements
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Guide to Reliability Test Methods for Integrated Circuit TSV Three-Dimensional Packages
- ICS
- 31.200
- CCS
- L55
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Analog/Mixed-Signal Intellectual Property (IP) Core Quality Assessment
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Three-dimensional Integrated Circuits Part 1: Terms and Definitions
- ICS
- 31.200
- CCS
- L55
- 发布
- 2023-12-28
- 实施
- 2024-04-01
3D Integrated Circuits Part 2: Calibration Requirements for Fine Pitch Stacked Chips
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Integrated circuit intellectual property (IP) core design requirements
- ICS
- 31.200
- CCS
- L 56
- 发布
- 2023-12-28
- 实施
- 2023-12-28
Semiconductor integrated circuit video encoding and decoding circuit testing methods
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Measurements of electromagnetic immunity of integrated circuits Part 1: General conditions and definitions
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Microwave circuit detector test method
- ICS
- 31.200
- CCS
- L55
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Measurement of electromagnetic immunity of integrated circuits Part 8: Measurement of radiated immunity IC stripline method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit PWM controller testing method
- ICS
- 31.200
- CCS
- L55
- 发布
- 2023-09-07
- 实施
- 2024-04-01
Semiconductor Device Integrated Circuits Part 20: General Specifications for Film Integrated Circuits and Hybrid Film Integrated Circuits Part 1: Internal Visual Inspection Requirements
- ICS
- 31.200
- CCS
- L57
- 发布
- 2023-09-07
- 实施
- 2023-09-07
Component displacement damage test method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Integrated circuit CMOS image sensor testing method
- ICS
- 31.200
- CCS
- L54
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Hybrid integrated circuit direct current/direct current (DC/DC) converter
- ICS
- 31.200
- CCS
- L57
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit flash memory (FLASH)
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit driver test methods
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit digital-to-analog (DA) converters
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
