IEC 62416:2010
半导体器件 - Mos晶体管上的热载体测试
Semiconductor devices - Hot carrier test on MOS transistors
- 标准号
- IEC 62416:2010
- 发布
- 2010年
- 发布单位
- 国际电工委员会
- 当前最新
- IEC 62416:2010
- 适用范围
- This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.