This part of GB/T 17626 deals with the immunity requirements and test methods of electrical and electronic equipment to repetitive electrical fast transients. In addition, the range of test levels and test procedures are specified. The purpose of this standard is to determine a common reproducible basis for evaluating the performance of power supply ports, signal, control and ground ports of electrical and electronic equipment when subjected to electrical fast transient bursts. The test methods specified in this standard describe a consistent method of evaluating the immunity of equipment or systems to defined phenomena. Note: As stated in IEC Guide 107, this part is the basic standard for electromagnetic compatibility and is used by various product committees. IEC Guide 107 also stipulates that the product committee is responsible for determining whether to apply this immunity test standard and, if used, for determining the appropriate test level and performance criteria. The National Electromagnetic Compatibility Standardization Technical Committee and its sub-committees are willing to cooperate with product committees to evaluate the special immunity requirements of their products. This part specifies: --- test voltage waveform; --- range of test levels; --- test equipment; --- test equipment calibration and verification procedures; --- test arrangement; --- test procedures. This section gives technical specifications for laboratory and field tests. 0.10 0.10 0.15 40 30 probability density unit ui (y) unit -1.02 0.041 ns 1.02 0.152 ns 0.010 ns factor u (xi )2. range 0.0073 probability density unit degree distribution factor u (xi )ci unit ui (y) unit 2. Range 0.8 30 probability density unit degree distribution factor u (xi )ci unit ui (y) unit 1.73 0.462 0.328 V/MHz 0.152 V0.162 kV3.75 kV function MHz rectangle MHz rectangle 1.73 17.32 -0.0058 uc (y)=V/ MHz ∑ui (y)2 range 0.10 0.10 probability density unit degree distribution factor u (xi )2. range probability density unit 0 ns 1.5 ns B7.0 MHz 0.8 MHz 400 MHz 30 u (xi )ci unit ui (y) unit 1.00 1.50 1.00 ns 1.50 ns 1.73 0.462 0.0021 ns Function δRβ factor degree distribution MHz normal (k=1) rectangular 1.73 rectangular/MHz -0.0045 ns 17.32 8.0×10 -5 uc (y)=/MHz ns 2
IEC 60050 Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 904: Environmental standardization for electrical and electronic products and systems*, 2019-10-17 Update
GB/T 17626.4-2018 history
2018GB/T 17626.4-2018 Electromagnetic compatibility-Testing and measurement techniques-Electrical fast transient/burst immunity test
2012GB/T 17626.34-2012 Electromagnetic compatibility.Testing and measurement techniques.Voltage dips,short interruptions and voltage variations immunity tests for equipment with mains current more than 16A per phase
2008GB/T 17626.4-2008 Electromagnetic compatibility.Testing and measurement techniques.Electrical fast transient/burst immunity test
2005GB/T 17626.14-2005 Electromagnetic compatibility Testing and measurement techniques Voltage fluctuation immunity test
1998GB/T 17626.4-1998 Electromagnetic compatibility--Testing and measurement techniques--Electrical fast transient/burst immunity test