GB/T 17626.29-2006 (English Version)

Standard No.: GB/T 17626.29-2006
Language: Chinese, Available in English version
Release Date: 2006
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 17626.29-2006

Scope: This part of GB/T 17626 specifies the immunity test methods for voltage sags, short interruptions and voltage changes at the DC power input ports of electrical and electronic equipment. This section applies to low-voltage DC power ports of equipment powered by an external DC network. The purpose of this standard is to establish a general criterion for evaluating the immunity of DC electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage changes. This standard specifies: - the range of test levels; - the test generator; - the test arrangement; - the test procedure. The tests in this part apply to electrical and electronic equipment or systems, and also to modules or subsystems if the rated power of the EUT (equipment under test) is greater than the capacity of the test generator required in Chapter 6. Ripples at DC power input ports are not included in this Part, they are included in GB/T 17626.17-2005. This section does not apply to special devices or systems. Its main purpose is to provide common and basic standards for relevant professional standardization technical committees. It remains the responsibility of these standards committees (or users and equipment manufacturers) to select the appropriate test and severity level for their equipment.

GB/T 17626.29-2006 Referenced Document

GB/T 17626.11 Electromagnetic Compatibility Testing and Measurement Techniques Part 11: Voltage Dips, Short Interruptions and Voltage Variation Immunity Tests for Equipment with Input Current Less than or Equal to 16 A per Phase*， 2023-05-23 Update
GB/T 4365 Electrotechnical terminology Electromagnetic compatibility

2006 GB/T 17626.29-2006 Electromagnetic compatibility Testing and measurement techniques Voltage dips， short interruptions and voltage variations on d.c.input power port immunity tests