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The main purpose of electronic probe electronic probe

The main purpose of electronic probe electronic probe, Total:115 items.

In the international standard classification, The main purpose of electronic probe electronic probe involves: Optics and optical measurements, Optical equipment, Radiation measurements, Electrical accessories, Analytical chemistry, Test conditions and procedures in general, Testing of metals, Thermodynamics and temperature measurements, Semiconducting materials, Ceramics, Electromechanical components for electronic and telecommunications equipment, Electricity. Magnetism. Electrical and magnetic measurements, Electrical and electronic testing, Medical equipment, Electrical engineering in general.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, The main purpose of electronic probe electronic probe

GB/T 15075-1994 Method for testing EPMA instrument
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
GB/T 17506-1998 The method of electron probe micro analysis as corrosive layer on ferrous metals of ship
GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array
GB/T 15247-1994 Electron probe quantitative analysis method of carbon in carbon steel and low alloy steel--Sensitivity curve method (detection limit method)

PL-PKN, The main purpose of electronic probe electronic probe

PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements

German Institute for Standardization, The main purpose of electronic probe electronic probe

DIN 6800-1:2016 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6800-1:2016-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6800-1:1980 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-5:2005 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 5: Thermoluminescence dosimetry
DIN ISO 16592:2015 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)
DIN EN 60512-16-1:2009-03 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008 / Note: DIN IEC 60512-8 (1994-05) remains valid al...
DIN EN 60512-16-1:2009 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008
DIN EN 1071-4:2006-05 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA); German version EN 1071-4:2006
DIN EN ISO 11608-4:2022-09 Needle-based injection systems for medical use - Requirements and test methods - Part 4: Needle-based injection systems containing electronics (ISO 11608-4:2022); German version EN ISO 11608-4:2022
DIN EN ISO 11608-4:2016 Needle-based injection systems for medical use - Requirements and test methods - Part 4: Needle-based injection systems containing electronics (ISO/DIS 11608-4:2016); German and English version prEN ISO 11608-4:2016

Professional Standard - Machinery, The main purpose of electronic probe electronic probe

JB/T 12074-2014 Quantitative analysis of composition metal.Electron probe microanalysis

National Metrological Technical Specifications of the People's Republic of China, The main purpose of electronic probe electronic probe

JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe

Association Francaise de Normalisation, The main purpose of electronic probe electronic probe

NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF C93-400-16-1*NF EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1 : mechanical tests on contacts and terminations - Test 16a : probe damage
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF EN ISO 11608-4:2022 Systèmes d'injection à aiguille pour usage médical - Exigences et méthodes d'essai - Partie 4 : systèmes d'injection à aiguille contenant de l'électronique
NF EN 1071-4:2006 Céramiques techniques avancées - Méthodes d'essai pour revêtements céramiques - Partie 4 : détermination de la composition chimique par microanalyse avec sonde électronique (MASE)
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF C42-725:1994 Safety requirements for electrical equipment for measurement, control and laboratory use. Part 2-031 : particular requirements for hand-held probe assemblies for electrical measurement and test.
NF C42-725:2002 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031 : safety requirements for hand-held probe assemblies for electrical measurement and test.
NF C42-020-031*NF EN 61010-031:2015 Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031 : safety requirements for hand-held probe assemblies for electrical measurement and test
NF EN 60512-16-1:2008 Connecteurs pour équipements électroniques - Essais et mesures - Partie 16-1 : essais mécaniques des contacts et des sorties - Essai 16a : endommagement par sonde d'essai

British Standards Institution (BSI), The main purpose of electronic probe electronic probe

19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations — Test 16a: Probe damage
BS EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of chemical composition by electron probe microanalysis (EPMA)
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS EN ISO 11608-4:2022 Tracked Changes. Needle-based injection systems for medical use. Requirements and test methods. Needle-based injection systems containing electronics
BS EN 61010-031:2015+A1:2021 Safety requirements for electrical equipment for measurement, control and laboratory use - Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
16/30273296 DC BS EN ISO 11608-4. Needle-based injection systems for medical use. Requirements and test methods. Part 4. Needle-based injection systems containing electronics
20/30387730 DC BS EN ISO 11608-4. Needle-based injection systems for medical use. Requirements and test methods. Part 4. Needle-based injection systems containing electronics

国家市场监督管理总局、中国国家标准化管理委员会, The main purpose of electronic probe electronic probe

GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer

International Organization for Standardization (ISO), The main purpose of electronic probe electronic probe

ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 11608-4:2022 Needle-based injection systems for medical use — Requirements and test methods — Part 4: Needle-based injection systems containing electronics

American Society for Testing and Materials (ASTM), The main purpose of electronic probe electronic probe

ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
ASTM F374-00a Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

Korean Agency for Technology and Standards (KATS), The main purpose of electronic probe electronic probe

KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

US-FCR, The main purpose of electronic probe electronic probe

FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)

Japanese Industrial Standards Committee (JISC), The main purpose of electronic probe electronic probe

JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS C 5402-16-1:2014 Connectors for electronic equipment -- Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations -- Test 16a: Probe damage
JIS C 1010-2-31:1998 Safety requirements for electrical equipment for measurement, control, and laboratory use -- Part 2-31: Particular requirements for hand-held probe assemblies for electrical measurement and test

ES-UNE, The main purpose of electronic probe electronic probe

UNE-EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (Endorsed by AENOR in November of 2008.)
UNE-EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) (Endorsed by AENOR in April of 2006.)
UNE-EN ISO 11608-4:2022 Needle-based injection systems for medical use - Requirements and test methods - Part 4: Needle-based injection systems containing electronics (ISO 11608-4:2022) (Endorsed by Asociación Española de Normalización in July of 2022.)

KR-KS, The main purpose of electronic probe electronic probe

KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

European Committee for Electrotechnical Standardization（CENELEC）, The main purpose of electronic probe electronic probe

EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

International Electrotechnical Commission (IEC), The main purpose of electronic probe electronic probe

IEC 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
IEC 61010-2-031:1993 Safety requirements for electrical equipment for measurement, control, and laboratory use; part 2-031: particular requirements for hand-held probe assemblies for electrical measurement and test
IEC 61010-031:2015+AMD1:2018 CSV Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and mea

Lithuanian Standards Office , The main purpose of electronic probe electronic probe

LST EN 60512-16-1-2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008)
LST EN 1071-4-2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

Danish Standards Foundation, The main purpose of electronic probe electronic probe

DS/EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
DS/EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

Standard Association of Australia （SAA）, The main purpose of electronic probe electronic probe

AS 61010.031:2004 Safety requirements for electrical equipment for measurement, control and laboratory use - Safety requirements for hand-held probe assemblies for electrical measurement and test (IEC 61010-031:2002 MOD)

PT-IPQ, The main purpose of electronic probe electronic probe

NP 3136/2-1985

ZA-SANS, The main purpose of electronic probe electronic probe

SANS 61010-2-031:1993 Safety requirements for electrical equipment for measurement, control, and laboratory use Part 2-031: Particular requirements for hand-held probe assemblies for electrical measurement and test

European Committee for Standardization (CEN), The main purpose of electronic probe electronic probe

FprEN ISO 11608-4:2021 Needle-based injection systems for medical use - Requirements and test methods - Part 4: Needle-based injection systems containing electronics (ISO/FDIS 11608-4:2021)

VE-FONDONORMA, The main purpose of electronic probe electronic probe

NORVEN 459-1974